Patent classifications
G01B11/162
COMMON LENS TRANSMITTER FOR MOTION COMPENSATED ILLUMINATION
A laser transmission apparatus utilizing multiple laser beams and beam paths with a diverger lens to provide an illumination pattern that can compensate for lateral movement of the platform during shearography is provided. Further, this optical setup requires no moving parts and does not reduce power of the laser beams as they move through the individual components thereof. From the perspective of the surface being scanned or inspected, the present disclosure may provide two laser images of a single surface that appear to be identical despite the fact that they were taken from two different spatial positions of the moving platform.
Component heating sub-systems and methods for laser shearography testing systems
A laser shearography testing system for non-destructively testing a component includes a component heating sub-system coupled to the component. The component heating sub-system excites the component into a loaded state by passing an electric current through the component. A resistivity of the component causes the component to internally and uniformly heat as the electric current passes through the component.
METHOD, DEVICE AND ELECTRONIC APPARATUS FOR ESTIMATING PHYSICAL PARAMETER BY DISCRETE CHIRP FOURIER TRANSFORM
A method, device and electronic apparatus for estimating physical parameters are disclosed. The method includes: reading a Newton's rings fringe pattern obtained by performing an interferometric measurement on a unit to be measured; obtaining the number and length of first-direction signals of the Newton's rings fringe pattern; performing, for each of the first-direction signals, a discrete chirp Fourier transform (DCFT) on the first-direction signal based on each first chirp rate parameter within a range of the length of first-direction signals, to obtain a first magnitude spectrum of an intensity distribution signal in a DCFT domain; determining a first chirp rate parameter and a first frequency parameter corresponding to a first magnitude peak value based on the first magnitude spectrum; and estimating the physical parameters involved in the interferometric measurement at least according to the first chirp rate parameter and first frequency parameter corresponding to the first magnitude peak value. In this way, the physical parameters involved in the interferometric measurement can be estimated with high accuracy and stably.
COMPONENT HEATING SUB-SYSTEMS AND METHODS FOR LASER SHEAROGRAPHY TESTING SYSTEMS
A laser shearography testing system for non-destructively testing a component includes a component heating sub-system coupled to the component. The component heating sub-system excites the component into a loaded state by passing an electric current through the component. A resistivity of the component causes the component to internally and uniformly heat as the electric current passes through the component.
METHOD FOR TESTING A TIRE BY INTERFEROMETRY
A method for testing a tire by interferometry in a pressure chamber of a tire testing device includes capturing phase images at different pressures in the pressure chamber, generating partial phase difference images between successive phase images, and summing the partial phase difference images to form an overall phase difference image. The pressure in the pressure chamber is changed in a first direction during a first measurement phase and the pressure is changed in the opposite direction during a second measurement phase, wherein at least one partial phase difference image from the first measurement phase and at least one partial phase difference image from the second measurement phase are included in the summation.
System and method for use in depth characterization of objects
A system is described, for use in optical measurement of a sample. The system comprising: an illumination unit configured for providing coherent illumination of one or more selected wavelength ranges and directing it onto one or more selected inspection regions of the sample, a collection unit configured for collecting light returning from the inspection region and generating output data comprising a sequence of image data pieces indicative of secondary speckle patterns formed at an intermediate plane in optical path of light collection, a depth resolving module configured for affecting at least one of the illumination unit and the collection unit for determining an association between collected secondary speckle patterns and depth layers of the sample; and a control unit being connectable to said depth resolving module and configured for operating said depth resolving module and for receiving said sequence of image data pieces from the collection unit and processing said sequence of image data pieces by determining correlation functions between at least portions of said secondary speckle patterns associated with corresponding depth layers of the sample, thereby determining one or more parameter variations along depth of the sample.
Method and Device for Additive Manufacturing
Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.
Method and system for object reconstruction
A system for object reconstruction includes an illuminating unit, comprising a light source and a generator of a non-periodic pattern. A diffractive optical element (DOE) is disposed in an optical path of illuminating light propagating from the illuminating unit toward an object, thereby projecting the non-periodic pattern onto an object. An imaging unit detects a light response of an illuminated region and generating image data indicative of the object within the projected pattern. A processor reconstructs a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.
SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT
A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
Digital speckle based online water wall stress monitoring method and device
A digital speckle based online water wall stress monitoring method and device, and the method includes the following steps: arrange an online stress monitoring device on the side of the water wall to be monitored; determine a plurality of monitoring points according to the area of the water wall, and set the motion track of the online stress monitoring device for speckle image acquisition according to the determined monitoring points; acquire the real-time speckle image of each monitoring point in real time after acquiring the initial speckle image of each monitoring point; compare the real-time speckle images with the initial speckle images, and determine whether the stress of the water wall changes according to the comparison results. The invention adopts non-contact digital image technology, and determines the difference between the real-time and initial speckle images of the water wall to realize the stress monitoring.