Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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11/00
Measuring arrangements characterised by the use of optical techniques
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G01B11/16
for measuring the deformation in a solid, e.g. optical strain gauge
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G01B11/161
by interferometric means
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G01B11/162
by speckle- or shearing interferometry
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