An image capture device assembly includes: a light source 110 that emits a reference light pattern; an image capture device 120; and a control device 130 that controls the light source and the image capture device. The light source 110 emits the reference light pattern to a subject 140 with high brightness and low brightness, respectively, under the control of the control device 130, the image capture device 120 captures an image of the reference light pattern and the subject 140 in a high brightness irradiation state and outputs a first image signal to the control device 130, or captures an image of at least the subject 140 in a low brightness irradiation state and outputs a second image signal to the control device 130, and the control device 130 generates a reference light pattern image signal from a difference between the first image signal and the second image signal.

Systems and methods for 3D image scanner for real-time, dynamic 3D surface imaging are disclosed. Embodiments of the present system and methods describe a system and method including a first and/or second, camera, and projector projecting structured light with fringe patterns onto a 3D object, and a processor configured to extract a phase map and a texture image from the image, and to calculate depth information from the phase map by the processor. Embodiments further describe methods and systems for determining an wrapped phase from the images using the Hilbert transformation, generating an absolute phase from the wrapped phase using the combination of a quality-guidance path following algorithm, a double wavelength phase unwrap algorithm, or a Markov Random field method, and generating a phase map from the absolute phase to determine depth information of the 3D object. The captured 3D geometric surfaces are registered, tracked using algorithms of conformal map, optimal transportation map and a Teichmuller map.

The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectomerty. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.

A calibration device includes a part for controlling a projection device to project a pattern onto a three-dimensional object having characteristic points, a part for controlling an imaging device to acquire images wherein the three-dimensional object with the pattern projected thereon is imaged from imaging directions, a part for estimating a relative position and attitude of the imaging device with respect to the three-dimensional object based on positions of the characteristic points of the three-dimensional object on the images, a part for estimating reflection positions of projection light rays corresponding to characteristic points of the pattern on the three-dimensional object based on positions of the characteristic points of the pattern and the relative position and attitude of the imaging device, for each image, and a part for identifying positions and directions of the projection light rays corresponding to the characteristic points of the pattern based on the reflection positions.

A high-accuracy three-dimensional reconstruction method and system, a computer device, and a storage medium are provided. The method includes: performing calibration on an imaging apparatus; calculating each unidirectional absolute phase distribution diagram of a planar target; establishing an imaging apparatus coordinate system, and fitting corresponding epipolar lines in a normalization plane; calculating intersections between the corresponding planar target and rays formed by points on an epipolar line and an optical center of the imaging apparatus, fitting a projection beam, and establishing a projection mapping coefficient table; and projecting a pattern to an object under test, acquiring an object image of the object under test by using the imaging apparatus, calculating and searching for projection mapping coefficients corresponding to absolute phases in the object image, and calculating corresponding spatial three-dimensional point coordinates by using the projection mapping coefficients.

A system includes a calibration plate with fiducial markers, a device under test interface, an alignment stage with a rotary sub-stage and a linear sub-stage, and a camera on the alignment stage.

A method calibrates a laser processing machine by commanding a scan head to direct a laser beam to a desired position, then senses an actual position of the laser beam directly using a position sensitive detector (PSD) after the scan head is positioned. A relative position between the scan head and PSD is altered using one or more linear actuators. A position feedback loop is closed around the linear actuators so that the relative position of the laser beam on the PSD is reduced to zero. The actual position of the laser spot is then measured indirectly by encoders attached to linear axes of the laser processing machine. The actual position is stored in a memory. An error is determined as a difference between the desired position and the actual position. Compensation coefficients are determined from the error and stored for later use during operation of the laser processing machine.

A method of calibrating a three-dimensional measurement system having a plurality of cameras and at least one projector is provided. The method includes performing a full calibration for each camera/projector pair where the full calibration generates at least two sets of correction matrices. Subsequently, an updated calibration is performed for each camera/projector pair. The updated calibration changes less than all of the sets of correction matrices.

A method for calibrating an augmented reality visual rendering system comprising at least one display device partially transparent with respect to the user thereof, comprises carrying out the steps of: displaying a two-dimensional calibration curve on a partially transparent display device of the partially transparent display device; recording a three-dimensional curve described by the user by a three-dimensional pointing device so that the trajectory described by the three-dimensional pointing device is aligned, according to the viewpoint of the user, with the two-dimensional calibration curve displayed on the display device; and matching the three-dimensional curve and the two-dimensional calibration curve displayed on the display device; and comprising a step of calibrating the augmented reality visual rendering system by determining the parameters of a model to represent the set comprising the eye of the user 1 and the partially transparent display device of the partially transparent display device at which the eye is looking, on the basis of matching.

A pattern extracting device, an image projecting device, a pattern extracting method, and a program capable of extracting all the feature points by interpolating defective feature points even when there are defective feature points of an image pattern. The pattern extracting device extracts feature points to be interpolated based on a captured image of a projected image pattern, and interpolates the feature point to be interpolated by using near-by feature points that are located near the feature point, divides the near-by feature points into groups, calculates extrapolation coordinates of the groups, and calculates coordinates of the feature point to be interpolated in view of significance of the extrapolation.