Systems and/or methods for, for a given pixel (or sub-pixel location) in an image acquired by the camera, finding which projector pixel (or more particularly, which projector column) primarily projected the light that was reflected from the object being scanned back to this camera position (e.g. what projector coordinates or projector column coordinate correspond(s) to these camera coordinates).

A printed circuit board inspection apparatus can inspect the mounting state of a component by generating depth information on the component mounted on a printed circuit board by using a pattern of light reflected from the component and received by an image sensor, inputting the generated depth information into a machine-learning-based model, obtaining depth information with reduced noise from the machine-learning-based model, and using depth information with reduced noise.

The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.

The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.

The present application discloses a projection apparatus, a collection apparatus, and a three-dimensional scanning system with the same. The projection apparatus includes: a light emission portion, configured to emit multiple rays of preset light, wherein the multiple rays of preset light correspond to multiple preset wavebands, and the multiple preset wavebands are different from each other; and a light transmission portion, disposed on a transmission path of the rays of preset light, wherein the rays of preset light is transmitted via a preset pattern on the light transmission portion to generate target light projected to a target object in the form of color-coded fringes, and the light transmission portion transmits the rays of preset light corresponding to at least two different preset wavebands.

Disclosed are a scanner system and a method for recording surface geometry and surface color of an object where both surface geometry information and surface color information for a block of the image sensor pixels at least partly from one 2D image recorded by the color image sensor. A particular application is within dentistry, particularly for intraoral scanning.

Modulation-encoded light, using different spectral bin coded light components, can illuminate a stationary or moving (relative) target object or scene. Response signal processing can use information about the respective different time-varying modulation functions, to decode to recover information about a respective response parameter affected by the target object or scene. Electrical or optical modulation encoding can be used. LED-based spectroscopic analysis of a composition of a target (e.g., SpO2, glucose, etc.) can be performed; such can optionally include decoding of encoded optical modulation functions. Baffles or apertures or optics can be used, such as to constrain light provided by particular LEDs. Coded light illumination can be used with a focal plane array light imager receiving response light for inspecting a moving semiconductor or other target. Encoding can use orthogonal functions, such as an RGB illumination sequence, or a sequence of combinations of spectrally contiguous or non-contiguous colors.

Disclosed are a scanner system and a method for recording surface geometry and surface color of an object where both surface geometry information and surface color information for a block of the image sensor pixels at least partly from one 2D image recorded by the color image sensor. A particular application is within dentistry, particularly for intraoral scanning.

A measurement apparatus includes an inclined dichroic mirror configured to separate light from a sample by transmitting or reflecting the light according to wavelengths, a total reflection mirror configured to reflect one part of light either transmitted or reflected by the inclined dichroic mirror, an imaging element configured to photograph the other part of the light transmitted or reflected by the inclined dichroic mirror in a first imaging region and photograph light reflected by the total reflection mirror in a second imaging region different from the first imaging region, and a control apparatus configured to correct images photographed in the first imaging region and the second imaging region based on optical characteristics related to a change in transmittance and reflectance with respect to a wavelength in the inclined dichroic mirror.

The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.