An optical dimensioning system includes one or more light emitting assemblies configured to project one or more predetermined patterns on an object; an imaging assembly configured to sense light scattered and/or reflected off the object, and to capture an image of the object while the patterns are projected; and a processing assembly configured to analyze the image of the object to determine one or more dimension parameters of the object. The light emitting assembly may include a single piece optical component configured for producing a first pattern and second pattern. The patterns may be distinguishable based on directional filtering, feature detection, feature shift detection, or the like. A method for optical dimensioning includes illuminating an object with at least two detectable patterns; and calculating dimensions of the object by analyzing pattern separate of the elements comprising the projected patterns. One or more pattern generators may produce the patterns.

A lighting system is described that includes a first lighting device, a second lighting device and a pattern element. The first lighting device includes at least one individual light-emitting element configured to emit light with a first beam profile. The second lighting device includes at least one individual light-emitting element configured to emit light with a second beam profile such that a third beam profile, different from the first beam profile and the second beam profile, is provided as a combination of the first beam profile and the second beam profile. The pattern element is configured to generate a pattern on at least one of the first beam profile and the second beam profile and a pattern on the third beam profile.

A detection system that includes: an image capture apparatus configured to capture images of a scene located in the passenger compartment and a projection system configured to project structured light on the scene. The projection system has at least one projection device, each projection device being separate from the image capture apparatus so as to be mounted in the passenger compartment while being offset relative to the image capture apparatus. Each projection device is configured to project at least one structured light pattern. The detection system further includes an electronic control unit configured to analyze images captured using the image capture apparatus during the projection of one or several structured light pattern(s).

A light-deflection three-dimensional imaging device, a projection device, and the application thereof are disclosed. The light-deflection three-dimensional imaging device includes a projection device, a receiving device and a processor. The projection device includes a light source, a grating, a condensing lens group, a light deflection element and an emission lens, wherein after the modulation by the grating, the aggregation by the condensing lens group and the deflection by the light deflection element, the projection light transmitted by the light source penetrates the emission lens and is emitted from a side surface of the projection device. The light deflection element is provided to change a projection path of light emitted from the light source, thereby changing an installation manner of the projection device, so that the thickness thereof is significantly reduced, thereby facilitating the installation in lighter and thinner electronic mobile devices, such as a mobile phone, a laptop, a tablet computer, etc.

An optical dimensioning system includes one or more light emitting assemblies configured to project one or more predetermined patterns on an object; an imaging assembly configured to sense light scattered and/or reflected off the object, and to capture an image of the object while the patterns are projected; and a processing assembly configured to analyze the image of the object to determine one or more dimension parameters of the object. The light emitting assembly may include a single piece optical component configured for producing a first pattern and second pattern. The patterns may be distinguishable based on directional filtering, feature detection, feature shift detection, or the like. A method for optical dimensioning includes illuminating an object with at least two detectable patterns; and calculating dimensions of the object by analyzing pattern separate of the elements comprising the projected patterns. One or more pattern generators may produce the patterns.

A three-dimensional shape measuring apparatus includes a fixer that fixes an illuminator and a photoreceptor to produce a measurement area to be illuminated with measuring light above a stage and to incline their optical axes with respect to a placement surface of the stage in an orientation in which the illuminator and the photoreceptor face the measurement area obliquely downward; a point cloud data generator that generates point cloud data as a set of points including three-dimensional position information representing a three-dimensional shape of a measurement object placed on the stage based on light-reception signals provided by the photoreceptor; a top view map image generator that generates a top view map image representing a plan view of the measurement object as viewed downward from a position right above the measurement object based on the point cloud data; and a display that displays the top view map image.

An apparatus for capturing at least partially reflective surfaces includes a detection surface assembly, an illumination device configured to emit an illumination pattern toward the at least partially reflective surface so as so project, by reflection via the at least partially reflective surface, a first reflection pattern and a second reflection pattern onto the detection surface assembly. The apparatus includes a capturing unit configured to capture the first reflection pattern and the second reflection pattern from the detection surface assembly.

Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.

A system for determining the surface structure of an object, the system comprising a first assembly including an illumination source, and a binary mask to generate a binary pattern, the binary mask disposed between the illumination source and a defocusing element to modify the binary pattern to provide a continuously modulated fringe pattern to illuminate the surface of the object.

Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (8), a light beam shaping apparatus (8), a pattern modulation apparatus (6), and a projection lens (2). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (3), a first beam-splitting system (12, 13), and an image sensor group including N image sensors (9, 10, 11). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.