A system for the automated validation of a semi-anechoic chamber (SAC) is disclosed. The system includes a receive assembly and a transmit assembly, each configured to autonomously relocate within the SAC. The system also includes a local client communicatively coupled to the transmit assembly. The local client is configured to send a validation arrangement to the transmit assembly describing a validation location and a distance. The transmit assembly is configured to receive the validation arrangement, move the transmit assembly to the validation location and send an instruction to the receive assembly, the instruction describing the distance. The receive assembly is communicatively coupled to the transmit assembly and configured to receive the instruction and move the receive assembly such that a separation between the transmit and receive assemblies is restored to the distance. Each validation arrangement corresponds to a validation point. A plurality of validation points defines a test volume.

A method for calibrating an active FOV of a single camera, wherein from the calibration of the cameras active FOV, a coordinate matrix is obtained which remotely produces a virtual interpolation measurement network at any point within an image (a frame) extracted from a video stream (recorded by the single camera), while eliminating the need to be physically located at the actual location where the video stream has been recorded. According to an embodiment of the invention, the basis of the active FOV of a camera is the ability to obtain (measure) coordinates of the measurement points marked on a calibration board.

A method for monitoring and/or calibrating a device designed for three-dimensional X-ray optical inspection of seedlings in different growth phases may optically or X-ray optically measure natural seedlings in three dimensions at predetermined times during their growth phase. The method may create a control program for a device which is designed for the three-dimensional printing of artificial seedlings as reference samples which are replicas of the natural seedlings in each case using the recorded measured values. The method may also produce artificial seedlings with a plastic using the device in accordance with the created control program. The artificial seedlings thus produced may be measured three-dimensionally by X-ray optics and the measured values thus acquired may be recorded in a control chart or an already created control chart is adapted, with which control chart monitoring and/or calibration of the device designed for the three-dimensional X-ray optical inspection of seedlings is performed.

The inspection gauge is an inspection gauge for a coordinate measuring apparatus having a triangular pyramid shape, and includes a plurality of support members in which first ends are provided at positions corresponding to vertexes of the triangular pyramid and second ends are connected to each other in a region inside the triangular pyramid, and a plurality of spheres provided at positions corresponding to the vertexes of the triangular pyramid on the plurality of support members, and at least three support members of the plurality of support members have mutually different shapes.

A position calibration system and method are disclosed, in which a control unit is provided to control a positioner sensing module to scan a circular positioner provided on a positioning substrate in a first direction and a second direction so as to acquire midpoints of two scanned line segments and acquire an intersection of lines extending from the two center points in a direction perpendicular to the first and the second directions as a calibration reference point, which correspond to a centroid (a center) of the circular positioner. The calibration reference point functions as a reference point for positioning the positioning substrate with respect to the positioner sensing module and is stored in a memory unit. The calibration reference point can be used as a positioning point during installation of a machine and can also be used for calibration of a position of the machine.

A method comprising scanning a test artefact at plurality of locations relative to the scanner to create test data. Determining a measured dimension of the test artefact in each of the plurality of locations based on the test data. Determining an error between the measured dimension and an actual dimension of the test artefact in each of the plurality of locations to create error data. Determining from the error data a preferred region relative to the scanner for scanning and adjusting a position of the scanner relative to an object to be scanned so the object is within the preferred region.

A calibration fixture that enables more accurate calibration of a touch probe on, for example, a CMM, with respect to the camera. The camera is mounted so that its optical axis is approximately or substantially parallel with the z-axis of the probe. The probe and workpiece are in relative motion, along a plane defined by orthogonal x and y axes, and optionally the z-axis and/or and rotation R about the z-axis. The calibration fixture is arranged to image from beneath the touch surface of the probe and, via a 180-degree prism structure, to transmit light from the probe touch point along the optical axis to the camera. Alternatively, two cameras respectively view the fiducial location relative to the CMM arm and the probe location when aligned on the fiducial. The fixture can define an integrated assembly with an optics block and a camera assembly.

Disclosed example video extensometers include: a load string configured to secure a test specimen; an imaging device configured to capture images of a surface of the test specimen when secured in the load string; a storage device configured to store a plurality of first calibration parameters corresponding to intrinsic properties of the imaging device; and control circuitry configured to: perform a verification process using the first calibration parameters to verify that a plurality of second calibration parameters correspond to an arrangement of the test specimen with respect to the imaging device; and perform an optical strain measurement process to measure displacement of the test specimen based on the first calibration parameters and the second calibration parameters.

The present disclosure provides a method for measuring a blade cross-section profile based on a line structured-light sensor at a high precision, including: (10) pose calibration on a line structured-light sensor; (20) calibration on a rotation axis: calibrating the rotation axis with a lateral datum plane of a blade; and (30) cross-section profile measurement on a target measured blade: establishing a global coordinate system, and converting blade cross-section curve feature data acquired by a data coordinate system to the coordinate system for splicing, thereby measuring a blade cross-section profile. The present disclosure reduces the error arising from transfer of calibration objects, reduces the rotation error because it does not involve the rotation angle of the turntable when calibrating the rotation axis and the rotation center, and reduces the translational error of the line structured-light sensor as positions for rotating the line structured-light sensor in two times are unchanged.

The present disclosure relates to a method for calibrating a stationary THz measuring device which measures geometric properties of a profile by means of one or more THz sensors during an extrusion of the profile, comprising at least one or more steps.