A system and a method for sensing an object using two-stage photo-acoustic excitation are provided herein. The method may include: scanning the object at a first resolution by alternately and repeatedly photo-acoustically exciting and sensing each of multiple first regions on the object to yield multiple first outputs; determining, based on the multiple first outputs, at least one first region of the multiple first regions that includes at least one zone and a specific depth of the at least one zone below a surface of the object; scanning the first region that includes the at least one zone at a second resolution by alternately and repeatedly photo-acoustically exciting and sensing each of multiple second regions in the at least one first region thereof to yield multiple second outputs; and determining, based on at least one of the multiple second outputs, specified parameters of the at least one zone.

A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function.

A thermographic examination device for non-destructive examination of a near-surface structure at a test object includes a heating device for applying heat energy to a surface region to be heated of the test object; a thermal sensor device for detecting a time profile, following the application of heat energy, of a spatial temperature distribution on a surface region to be measured of the test object, the surface region to be measured including the surface region to be heated as well as an outer surface region to be measured which is adjacent to the surface region to be heated; and an evaluator for evaluating the time profile of the spatial temperature distribution so as to detect at least one parameter of the near-surface structure at the surface region to be measured.

An oxide layer thickness measurement device according to the present invention stores, for each of layer thickness measurement sub-ranges constituting a layer thickness measurement range, layer thickness conversion information representing a correlation between a layer thickness and an emissivity where a ratio of a change in the emissivity to a change in the layer thickness in the layer thickness measurement sub-range falls within a set extent. Emitting light luminances of a surface of a steel sheet are measured at respective measurement wavelengths different from each other, and a temperature of the surface of the steel sheet is measured to thereby calculate the emissivity at each of the measurement wavelengths. Calculated in connection with the emissivity calculated at each of the measurement wavelength are the layer thickness corresponding to the emissivity at the measurement wavelength, and a ratio at the layer thickness by using the layer thickness conversion information corresponding to the measurement wavelength. The calculated thickness is extracted as a candidate value for an actual layer thickness when the calculated ratio is within the preset extent assigned for the layer thickness conversion information.

Examples of a method include maintaining a large area thin film at a predetermined angle with respect to a spatially non-scanning infrared (IR) radiation source. The large area thin film reflects infrared radiation and at least a portion of the large area thin film is electrically conductive. The predetermined angle is selected from an angle ranging from about 0° to about 45°. Examples of the method include, while maintaining the large area thin film at the predetermined angle, directly illuminating the large area thin film with infrared radiation from the spatially non-scanning infrared radiation source, and thermal imaging reflected infrared radiation from the large area thin film by an infrared imaging system having an optical axis positioned at a fixed angle with respect to the large area thin film. The fixed angle is selected from an angle ranging from about 0° to about 45°.

Upon determining a mobile object is approaching an ice layer above a body of water, a thermal image of the ice layer is obtained. The thermal image and ambient temperature data are input to a neural network that outputs a plurality of regions of the ice layer and respective estimated thicknesses for the regions. A classification for each region is determined based on its estimated thickness and the mobile object. The classification is one of preferred or nonpreferred. The classifications for the regions are output.

A system for monitoring brick in a rotary kiln includes an infrared sensor and a computing system configured to: obtain a digital model of a brick layer of a rotary kiln having a plurality of bricks, wherein the digital model of the brick layer is based on a measured brick thickness correlated with a measured infrared temperature for each brick; obtain infrared data of the rotary kiln with the at least one infrared imaging sensor; determine the measured infrared temperature for each brick; determine a brick thickness of a first brick in the brick layer of the rotary kiln based on the measured infrared temperature assigned to the first brick with the digital model of the brick layer; and provide the brick thickness of the first brick in a brick thickness report.

The present application discloses a calculation method for thickness of inner oxide layer of a martensitic heat-resistant steel in steam environment. The calculation method takes into account the steam temperature, the steam pressure and the operation time, which are the three factors that have significant effects on the thickness of the oxide layer, and with the help of a metal oxidation kinetic model, the formula is mathematically modified by combining a large number of actual operation and laboratory simulation experimental data of the power plant. A calculation method for thickness of inner oxide layer of 9% Cr martensitic heat-resistant steel in steam environment is obtained by using linear fitting and curve fitting, etc.

A method for measuring the thickness of glass containers includes the following steps:

choosing to measure the radiation emitted by the container from a first side and a second side of the container diametrically opposite to each other;

choosing to measure the radiation emitted by the container in a first spectral band in a range between 2,800 nm and 4,000 nm and in a second spectral band;

simultaneously measuring, from each side of the container, the intensity of the radiation coming from the walls in the first spectral band and in the second spectral band; and

determining at least the thickness of the first wall and of the second wall (2.sub.2), from the measurements of the intensity of the radiation coming from the first wall in the first and second spectral bands and from the second wall in the first and second spectral bands.

A method for determining a layer thickness of a layer applied to a substrate, in particular a coating layer, in which at least one surface area of the coated substrate is heated by irradiation with at least one radiation source and/or inductively, and thermal radiation emitted from the at least one surface area is detected by a detection device. Expediently, the layer thickness is determined based on the emitted thermal radiation. The at least one surface area is irradiated by the at least one radiation source and heats up and/or is inductively heated. Heat radiation emitted from the surface area is characteristic for a certain layer thickness and is detected by the detection device and transmitted to the evaluation device. Furthermore, the invention relates to an apparatus for determining a layer thickness of a layer applied to a substrate.