The instant disclosure provides a gas detection device including a chamber module, a light emitting module and an optical sensing module. The chamber module includes a condensing chamber, a receiving chamber and a sampling chamber. The condensing chamber has a first reflecting structure, a second reflecting structure and a third reflecting structure. The first reflecting structure is disposed between the second reflecting structure and the third reflecting structure. The light emitting module is disposed on the condensing chamber and includes a light emitting unit corresponding to the condensing chamber. The optical sensing module includes an optical sensing unit disposed in the receiving chamber.

A photonic infrared detector having at least one metal layer having a broad-band IR absorption and the detector is configured to enable light to make a plurality of passes within a c-Si substrate.

A system, method, and device for simulating an emission signature, which contains representative intensity, temporal, and spectral emission profiles of a weapon system or weapon platform for the purpose of testing an optical detection device. A projection system optically projects the emission signature. A projection screen is provided that has a concave curvature. The concave curvature possesses a first focal point and a second focal point. Any light emanating from the second focal toward the projection screen is reflected by the projection screen toward the first focal point. The projection system is positioned at the second focal point and the optical detection system is positioned at the first focal point. In this manner, the emission signature projected by the projector system is redirected to the optical detection system.

Disclosed is a device for inspecting optical power measurement of a light emitter, the device including: a reference light emitter; a measurer configured to measure optical power by receiving light emitted from one of the reference light emitter and a plurality of inspection target light emitters, the measurer including an integrating sphere, a photodiode detector, and a photocurrent or photovoltage measurement device; and a controller configured to calculate a first average of optical power of the plurality of inspection target light emitters by measuring first optical power of a first inspection target light emitter among the plurality of inspection target light emitters, and generate an alarm to stop using the measurer when a difference between the first average and a second optical power of the reference light emitter exceeds a first threshold. Thus, the inspection is more accurately and reliably carried out.

A novel multi-junction detector device and method of manufacture is disclosed, which includes providing a housing, at least one system mount body positioned within the housing, forming at least one beam dump region in the system mount body in optical communication with at least one first detector having a first wavelength responsivity range positioned on the system mount body and at least one second detector having a second wavelength responsivity range positioned on the system mount body in optical communication with the first detector. An arcuate shape, an arcuate shape of varying radius, a polygonal shape or a polyhedral shape may be formed on at least one mount body wall in the beam dump region. The method may also comprise depositing at least one reflectivity enhancing material onto the mount body wall. The method may further comprise depositing an energy dissipating material on the mount body wall.

A laser absorptivity measurement device uses a linearly polarized incident beam, an optical configuration comprising an internal polarizing beamsplitter that transmits the linearly polarized incident beam and a quarter-wave plate that converts linearly polarized incident beam into a circularly polarized incident beam that is reflected off a processing substrate. The quarter-wave plate and polarizing beamsplitter can then direct the reflected light back into an integrating volume, where the power of the reflected light can be measured by a photodetector. The laser absorptivity measurement device is capable of making real-time absorption efficiency measurements of a variety of laser-based processes, including laser welding and brazing, additive manufacturing, and laser marking.

A measurement device for a light-emitting device includes a light attenuator, a photometric sphere, and a light detector. The light attenuator includes a first surface and a heat dissipator. A first light that is emitted from the first light-emitting device is incident on the first surface. The first surface is configured to absorb a portion of the first light. The heat dissipator is configured to dissipate heat of the first surface. The photometric sphere has an inner surface to reflect the first light reflected by the first surface. The light detector is configured to receive at least a portion of the first light reflected by the inner surface.

The present application describes embodiments of a non-tracking solar energy collector comprising: (a) at least one solar radiation concentrator for collimating and directing the incident solar radiation rays to at least one focal point along the surface of a reactive reflector; (b) the reactive reflector mounted on top of an external cavity and having at least one transparency zone instantly formed at said at least one focal point of the solar radiation rays, for letting the solar radiation rays enter said external cavity, wherein said transparency zone is constantly moving along the surface of said reactive reflector following the position of said at least one focal point of the solar radiation rays; and (c) the external cavity containing a solar cell and capable of trapping the entered solar radiation rays by inner scattering of said solar radiation rays on the walls of said external cavity, wherein said inner scattering of said solar radiation rays inside said external cavity is preventing solar radiation to escape from said solar cell, thereby minimising solar radiation losses.

An optical system comprising a randomizer that has a plurality of randomly positioned scatterers for scattering and thereby randomizing light to generate a speckle pattern and a detector for detecting the speckle pattern to determine at least one property of the light and/or change in at least one property of the light.

A void-arranged structure that includes a pair of principal surfaces opposing each other and a plurality of void sections that penetrate through the pair of principal surfaces. The void-arranged structure is configured of a plurality of unit structures each of which includes a first void section and a second void section having a different shape from a shape of the first void section, and the overall shape of the unit structure, when the principal surface is viewed from above, is not mirror-symmetric with respect to a predetermined imaginary plane orthogonal to the principal surface of the void-arranged structure.