A visible LED light scattering apparatus comprising a substantially hollow spherical cavity including a light entry port arranged to receive visible light from an LED mounted outside the cavity, a light exit port located opposite the entry port and through which the LED light exits the cavity for analysis, and a baffle located in a central region of the cavity in a direct optical path between the entry port and the exit port to interrupt the passage of visible LED light between the entry and exit ports.

Disclosed is a device for inspecting optical power measurement of a light emitter, the device including: a reference light emitter; a measurer configured to measure optical power by receiving light emitted from one of the reference light emitter and a plurality of inspection target light emitters, the measurer including an integrating sphere, a photodiode detector, and a photocurrent or photovoltage measurement device; and a controller configured to calculate a first average of optical power of the plurality of inspection target light emitters by measuring first optical power of a first inspection target light emitter among the plurality of inspection target light emitters, and generate an alarm to stop using the measurer when a difference between the first average and a second optical power of the reference light emitter exceeds a first threshold. Thus, the inspection is more accurately and reliably carried out.

Methods and devices for the sequential measurement of a plurality of semiconductor-based light sources that operate faster, more accurately and more sensitively than known methods and devices. In accordance with one implementation, a current pulse is applied by a pulsed current source to the low-luminosity light sources consecutively or simultaneously. The emitted light pulse of LED is converted into electric charge carriers by a photodiode, the electric charge carries are added up by means an integrator circuit, the added-together charge carriers are converted by an A/D converter into a digital signal and the digital signal is forwarded to a measurement and control unit.

A calibration tool for a beam profiler is disclosed. The calibration tool includes an integrating sphere configured to receive laser light emitted from a laser and generate diffuse laser light. A sensor system is configured to output an expected intensity value of the diffuse laser light. An interface is configured to align a beam profiler with the integrating sphere to direct the diffuse laser light to be incident on an array of pixels of a beam sensor of the beam profiler. The array of pixels of the beam sensor is configured to output a plurality of native intensity values of the diffuse laser light. A computing system is configured to calibrate the beam profiler based at least on differences between the plurality of native intensity values of the diffuse laser light and the expected intensity value of the diffuse laser light.

A laser intensity measuring device includes a diffraction optical element configured to split a laser beam into a plurality of branch beams; an integrating sphere including an entrance port through which one of the laser beam or the plurality of branch beams enters the integrating sphere, an exit port through which at least one of the plurality of branch beams exits the integrating sphere, and an inner wall on which the other of the plurality of branch beams impinge; and a sensor configured to measure an intensity of the other of the plurality of branch beams reflected by the inner wall.

An integrating sphere photometer spectral response measurement system has an integrating sphere photometer and three or more reference light sources having different peak wavelengths. The integrating sphere photometer has an integrating sphere and a broadband photodetector, wherein the broadband photodetector is mounted on a sphere wall of the integrating sphere. Emergent light of the reference light sources is incident to the integrating sphere. The total spectral radiation flux Pi()(i=1, 2, . . . n) received by an integrating sphere photometer system is acquired; the response Mi(i=1, 2, . . . n) of a photometer of mixed light in the integrating sphere is read by the broadband photodetector; an equation set is established; and the spectral responsivity Srel() of the integrating sphere photometer is obtained by means of numerical solution.

A device for measuring the performance of an optical detector includes a cryostat, a holder capable of receiving the detector, secured to the inside of the cryostat, and means for measuring the performance of the detector. It also includes a screen arranged around the holder capable of limiting the radiation likely to reach the holder in a wavelength range of the detector, and a single-mode optical fiber in the wavelength range of the detector, inserted in an opening of the cryostat. The device further comprises at least one luminous flux generation module that incorporates a fibered source capable of generating the luminous flux in the optical fiber.