A system, apparatus and method of improved measurement of the SPF factor of sunscreen compositions. In one embodiment, a method of measuring the protection of a sunscreen composition includes exposing skin to a known intensity of light, measuring the amount of remitted light from the skin, applying sunscreen to the skin, exposing the skin to which the sunscreen has been applied the known intensity of emitted light of the spectrum of light from which the sunscreen is intended to protect the skin, measuring the amount of light remitted from the skin, and calculating a UltraViolet-A Protection Factor (UVA-PF) of the sunscreen by comparing the amount of light remitted from the skin with the sunscreen to the amount of light remitted from the skin without the sunscreen.

A system, apparatus and method of improved measurement of the SPF factor of sunscreen compositions. In one embodiment, a method of measuring the protection of a sunscreen composition includes exposing skin to a known intensity of light, measuring the amount of remitted light from the skin, applying sunscreen to the skin, exposing the skin to which the sunscreen has been applied the known intensity of emitted light of the spectrum of light from which the sunscreen is intended to protect the skin, measuring the amount of light remitted from the skin, and calculating a UltraViolet-A Protection Factor (UVA-PF) of the sunscreen by comparing the amount of light remitted from the skin with the sunscreen to the amount of light remitted from the skin without the sunscreen.

A data output device is provided. The data output device includes a converter circuit configured to generate a conversion signal based on an output signal; a boosting circuit configured to generate a boosting signal based on the output signal; and an output circuit configured to generate the output signal based on an input signal and a feedback signal, the feedback signal being based on the conversion signal and the boosting signal.

Measuring device (1) suited to measure the distance (d) of a reference object (O), configured so that it performs a plurality of measuring operations (A.sub.i) in succession and comprising emission means (2) suited to emit a light radiation (R), receiving means (3) comprising a sensitive area (31) which is sensitive to the light radiation (R) and which is provided with a number M of sensitive units (4), each one of the sensitive units (4) being configured to generate an electrical signal (S), a first processing unit (5) comprising N.sub.e processing elements (6), each one of said N.sub.e processing elements (6) being configured to receive the electrical signal (S) for determining the time of impact (t) of a photon (F) on the sensitive units (4) and for calculating the value of said distance (d). The measuring device (1) comprises a second processing unit (7) configured to receive the electrical signals (S), processing the electrical signals (S) in such a way as to select a number N.sub.u of sensitive units (4) impacted by the photons (F), associating each one of the N.sub.u sensitive units (4) to one of the N.sub.e processing elements (6), in such a way that, at the moment of the successive measuring operation (A.sub.i+1), the distance (d) is determined by each one of the N.sub.u sensitive units (4) selected.

Measuring device (1) suited to measure the distance (d) of a reference object (O), configured so that it performs a plurality of measuring operations (A.sub.i) in succession and comprising emission means (2) suited to emit a light radiation (R), receiving means (3) comprising a sensitive area (31) which is sensitive to the light radiation (R) and which is provided with a number M of sensitive units (4), each one of the sensitive units (4) being configured to generate an electrical signal (S), a first processing unit (5) comprising N.sub.e processing elements (6), each one of said N.sub.e processing elements (6) being configured to receive the electrical signal (S) for determining the time of impact (t) of a photon (F) on the sensitive units (4) and for calculating the value of said distance (d). The measuring device (1) comprises a second processing unit (7) configured to receive the electrical signals (S), processing the electrical signals (S) in such a way as to select a number N.sub.u of sensitive units (4) impacted by the photons (F), associating each one of the N.sub.u sensitive units (4) to one of the N.sub.e processing elements (6), in such a way that, at the moment of the successive measuring operation (A.sub.i+1), the distance (d) is determined by each one of the N.sub.u sensitive units (4) selected.

Light obstruction can be detected using a light obstruction sensor. In one example implementation according to aspects of the present disclosure, a computer-implemented method includes receiving, by a light obstruction sensor, light being emitted by a light source, a light level being associated with the light, and the light source and the light obstruction sensor being disposed in a light assembly. The method further includes determining, by a processing device, whether the light level exceeds a first threshold. The method further includes, responsive to determining that the light level exceeds the first threshold, determining that the light being emitted by the light source is at least partially impaired by an object. The method further includes validating, by the processing device, the determination that the light source is at least partially impaired by the object to confirm whether the light source is at least partially impaired by the object.

Light obstruction can be detected using a light obstruction sensor. In one example implementation according to aspects of the present disclosure, a computer-implemented method includes receiving, by a light obstruction sensor, light being emitted by a light source, a light level being associated with the light, and the light source and the light obstruction sensor being disposed in a light assembly. The method further includes determining, by a processing device, whether the light level exceeds a first threshold. The method further includes, responsive to determining that the light level exceeds the first threshold, determining that the light being emitted by the light source is at least partially impaired by an object. The method further includes validating, by the processing device, the determination that the light source is at least partially impaired by the object to confirm whether the light source is at least partially impaired by the object.

According to certain aspects, a method includes receiving an input test signal at a test input, receiving an event signal, and passing the input test signal to a test output or blocking the input test signal from the test output based on the event signal. In certain aspects, the event signal indicates an occurrence of an event in a circuit block (e.g., a memory, a processor, or another type of circuit block). The event may include a precharge operation, opening of input latches, reset of a self-time loop, arrival of a data value at a flop in a signal path, an interrupt signal indicating an error or failure in the circuit block, or another type of event.

According to certain aspects, a method includes receiving an input test signal at a test input, receiving an event signal, and passing the input test signal to a test output or blocking the input test signal from the test output based on the event signal. In certain aspects, the event signal indicates an occurrence of an event in a circuit block (e.g., a memory, a processor, or another type of circuit block). The event may include a precharge operation, opening of input latches, reset of a self-time loop, arrival of a data value at a flop in a signal path, an interrupt signal indicating an error or failure in the circuit block, or another type of event.

According to certain aspects, a method includes receiving an input test signal at a test input, receiving an event signal, and passing the input test signal to a test output or blocking the input test signal from the test output based on the event signal. In certain aspects, the event signal indicates an occurrence of an event in a circuit block (e.g., a memory, a processor, or another type of circuit block). The event may include a precharge operation, opening of input latches, reset of a self-time loop, arrival of a data value at a flop in a signal path, an interrupt signal indicating an error or failure in the circuit block, or another type of event.