Example embodiments described herein involve a system for testing a light-emitting module. The light-emitting module may include a mounting platform configured to hold a light-emitting module for a camera. The mounting platform may also be configured to rotate. The system may further include a housing holding a plurality of photodiodes arranged in an array over at least a 90 degree arc of a hemisphere. The system may also include a controller configured to control the photodiodes and the rotation of the mounting platform.

An organic light emitting diode analyzer is provided to test electrical and spectroscopic characteristics organic light emitting diodes (OLED). The analyzer includes a spectrometer, a luminance and color meter, a header of the luminance and color meter, an OLED a source meter, an OLED holder and a computer. The OLED analyzer is a characterization system to measure the electrical and spectral characteristics and feature of the OLED. The luminance and color meter includes a color sensor, and the luminance and color meter measures a luminance of the OLED, a color temperature of the OLED, and color coordinates of the OLED. The spectrometer measures a wavelength of the OLED, an irradiance, a color index, the color temperature, color coordinates and the irradiance (W/m.sup.2.Math.nm). The source meter applies positive voltages to the OLED, and the source meter measures a current through the OLED.

A method and apparatus for determining a presence, color and/or brightness of a plurality of components in a printed circuit board, where the components are biased either with constant current or with a current pulse.

A lens and an optical system device are provided which can measure optical characteristics of a light source or an optical element with a simple structure. A lens 1 has an optical axis, and includes an incident surface F and an emit surface B. The incident surface F and the emit surface B are formed so as to emit incident light to the incident surface F from a first position O at an irradiation angle θ relative to the optical axis from the emit surface B at an emit angle θ/m (where m>1) relative to the optical axis by refraction at the incident surface F and at the emit surface B, and formed in such a way that apparent positions of lights emitted from the emit surface B all begin from a second position P. Moreover, an optical system device includes the lens 1 and a diffuser panel that diffuses emitted light from the lens 1.

An LED light unit comprises an LED assembly and a light sensor to measure light emitted by the LED assembly and having a measurement range; a current source to drive the LED assembly at an LED current A control device is configured to: pre-heat the LED assembly by driving the current source to operate the LED assembly at an operating current; the LED assembly thereby illuminating the light sensor at a light level above the measurement range; interrupt operating the LED assembly during a stray light measurement time; and read an output signal of the light sensor; operate the LED assembly at a measurement current, to emit light at a measurement level; subtract the output signal of the light sensor during the stray light measurement time from the output signal of the light sensor during the light measurement time to obtain a stray light corrected light measurement signal; scale the stray light corrected light measurement signal by a scaling factor based on a ratio of the operating LED current and the measurement LED current to obtain a scaled operating current LED light output signal and derive an illumination of the light sensor therefrom.

A computing device and a method detect a lightness of a lighting device. The computing device captures an image of the lighting device and parses the image to obtain a pixel gray value of each lighting dot of the lighting device. The computing device obtains detection information of the lighting device according to the pixel gray value of each lighting dot of the lighting device. The computing device generates a detection report of the lighting device according to the detection information of the lighting device.

The invention relates to an arrangement for a spatially resolved and wavelength-resolved detection of light radiation emitted from at least one OLED or LED. A multilayer system is arranged between an electrode, an OLED or an LED, and a substrate and is formed using layers formed alternately above one another from a material having higher and lower optical refractive indices n. In this respect, light radiation from the at least one OLED or LED and having a plurality of different wavelengths λ1, λ2, λ3, . . . λn thus exits the multilayer system. Light radiation that exits at different wavelengths λ1, λ2, λ3, . . . λn at different angles is incident onto at least one detector array after at least a simple refraction at an optical element or after reflection at a layer or at a layer system of a sensor such that light radiation at a wavelength λ1, λ2, λ3, . . . or λn is incident onto a respective detector element of the detector array. The detector elements of the detector array are arranged discretely from one another.

An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

A method comprising optically detecting optical output states of a plurality of light sources of an optical device over a test interval; for each light source, optically detecting that the output state of the light source has changed from a first optical condition to a second optical condition; for each light source, optically detecting that the output state of the light source has changed from the second optical condition to a third optical condition; for each light source, determining a first time interval representative of the first optical condition; for each light source, determining a second time interval representative of the second optical condition; for each light source, determining a third time interval representative of the third optical condition; determining a test result for the device based on a comparison of the first, second and third time intervals with pre-stored time intervals.

A testing apparatus includes a plate unit including at least one chip mounting unit on which a light emitting diode (LED) to be tested is mounted. The chip mounting unit has a first region in which the LED is overlaid and a second region surrounding the first region. The first and second electrode pads are disposed in the first region and include respective extension portions extended toward the second region. A probe portion is configured to connect to the extension portions of the first and second electrode pads. A power control unit is configured to selectively apply test power to the LED through the probe portion. A light measuring unit is configured to measure light properties of light emitted by the LED.