The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously. The emitted light pulse of the LED (2) is converted into electric charge carriers by means of a photodiode (3), the electric charge carriers are added up by means of an integrator circuit (5), the added-together charge carriers are converted by means of an A/D converter (6) into a digital signal and the digital signal is forwarded to a measurement and control unit (7). The invention also relates to a method and a corresponding device for the sequential measurement of a plurality of optical pulses, wherein the pulsed light radiation enters an Ulbricht sphere (10) through an inlet opening (11), a first portion of the light radiation, which exits the Ulbricht sphere (10) following interaction with the same through a first outlet opening, is measured by means of a first detector (14, 18) and a second portion of the light radiation, which exits the Ulbricht sphere (10) without interaction with the same through a second outlet opening (19), is measured by means of a second detector (14′).

The disclosure provides a light-emitting element inspection device optically connected to at least one light-emitting element of a test object and including a dark box, a slide rail, an image-capturing device, a light-entrance plate, and a processor. The slide rail and the image-capturing device are disposed in the dark box. The image-capturing device slides on the slide rail. The light-entrance plate is disposed on one side of the dark box and has at least one hole optically connected to the light-emitting element. The image-capturing device is aligned with the light-entrance plate to capture an image of the light-entrance plate. The processor is coupled to the image-capturing device and is adapted to obtain a set of RGB values of the image, convert the RGB values into a set of HSV values, and determine whether the light-emitting element of the test object conforms to a standard based on the HSV values.

A chip chuck includes front and back slopes obliquely extending toward a bottom surface from front and back edges of a top surface having a chip placement area for supporting a chip under test, and is defined with an imaginary vertical reference line perpendicular to the chip placement area and an imaginary horizontal reference line. The front and back slopes are connected with the chip placement area and each provided with an included acute angle with respect to the imaginary horizontal reference line, thereby avoiding interference with light emitted from the chip. A chip supporting device includes a chip chuck, and an optical sensing module fixed relative thereto and including an optical sensor whose light receiving surface faces toward a back light emitting surface of the chip, thereby enabling optical characteristic inspection of front and back light emitting surfaces of the chip at the same time.

An illumination device and method are provided herein for calibrating individual LEDs in the illumination device to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.

Disclosed are an apparatus, a system, and a control method for measuring an LED panel. The method for measuring an LED panel comprises the steps of: capturing an image of an LED panel displayed in a preset color; classifying each pixel of the LED panel from the captured image of the LED panel into pixel regions having different sizes according to a predetermined threshold brightness value; obtaining a tristimulus value of each pixel by using the data of the classified pixel regions and a trained artificial intelligence model; and obtaining the luminance and chrominance of each pixel on the basis of the obtained tristimulus value.

An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

An LED-based light includes one or more LEDs, a sensor arranged to detect a brightness level in an area resulting from the combination of light emitted by the LEDs with light from at least one ambient light source other than the LEDs, and operable to output a signal corresponding to the detected brightness level, a controller operable to regulate an amount of power provided to the LEDs in response to the signal, a light transmitting housing for the LEDs, the sensor and the controller and a connector shaped for connection with a light socket disposed at an end of the housing.

Example embodiments described herein involve a system for testing a light-emitting module. The light-emitting module may include a mounting platform configured to hold a light-emitting module for a camera. The mounting platform may also be configured to rotate. The system may further include a housing holding a plurality of photodiodes arranged in an array over at least a 90 degree arc of a hemisphere. The system may also include a controller configured to control the photodiodes and the rotation of the mounting platform.

An illumination device and method are provided herein for calibrating individual LEDs in the illumination device to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.