Provided is an image sensor including a sensor substrate including a first pixel row and a second pixel row, a spacer layer arranged on the sensor substrate, and a color separating lens array arranged on the spacer layer, in which the color separating lens array includes a first color separating lens array separating, out of incident light, light of a plurality of wavelengths within a first spectral range and condensing the light of the plurality of wavelengths onto a plurality of pixels of the first pixel row and a second color separating lens array separating, out of incident light, light of a plurality of wavelengths within a second spectral range different from the first spectral range and condensing the light of the plurality of wavelengths onto a plurality of pixels of the second pixel row.

An image sensor assembly includes at least one upconverter configured to detect light in a NIR waveband that is received from an object to be imaged and generate, based on the detected light, upconverted light that is outside of the NIR waveband; and at least one image sensor configured to detect the upconverted light.

A sampling module for providing an illumination beam onto an object and collecting a measurement beam reflected thereby to at least one measurement device is provided. The sampling module includes at least one illumination module, a light collecting element, and at least one light receiving module. The illumination module provides the illumination beam. The light collecting element has a first opening and an internal space. The illumination module is disposed in the first opening. The illumination beam is transmitted to the object in the internal space. The light receiving module is connected to the light collecting element and includes a case and a lens set. A distance between the sampling module and the object is greater than 0 mm. The measurement beam is transmitted by the object through the lens set to be incident onto the measurement device.

A method of operating a hyperspectral imaging device includes connecting electrodes on a liquid crystal variable retarder to a voltage source, rotating liquid crystal material in the liquid crystal variable retarder between a first orientation with a certain optical phase delay and a second orientation with a different optical phase delay, receiving a beam of light at an image sensor that has passed through the liquid crystal variable retarder, and producing an output signal from the image sensor.

Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.

A system for providing optical measurements and detection in optical spectrum analyzers (OSAs) with high dynamic range and high speed is disclosed. The system may include a slit to allow inward passage of an optical beam. The system may also include an optical portion to receive the optical beam. In some examples, the optical portion may include at least one optical splitter to split the optical beam into at least two optical paths. The system may also include an electrical portion to receive the optical beams split into the at least two optical paths. In some examples, the electrical portion may include at least one photodetector to receive each of the split optical beam. The electrical portion may also include at least one amplifier communicatively coupled to each of the at least one photodetector to amplify the split optical beam. The electrical portion may further include at least one analog-to-digital converter (ADC) communicatively coupled to each of the at least one amplifier to convert the split optical beams into digital signals.

A first optical system (10) according to the present disclosure includes a first lens (111) that guides light (LO) to a diffraction grating (3), a second lens (112) that collimates first diffracted light (L1) that was focused at a first focal point (f1), a pair of first mirrors (12, 13), a third lens (113) that focuses the first diffracted light (L1) at a second focal point (f2), and a fourth lens (114) that guides the first diffracted light (L1) that was focused by the third lens (113) to the diffraction grating (3). The first lens (111) and the fourth lens (114) have a substantially identical first focal length. The second lens (112) and the third lens (113) have a substantially identical second focal length. A first distance along an optical path from the first focal point (f1) to the second focal point (f2) is determined by a first predetermined condition.

A camera includes a first lens configured to focus incoming light onto a reflective slit assembly. The reflective slit assembly comprises an elongated strip of reflective material configured to reflect some but not all of the incoming light as return light. The first lens is configured to at least partially collimate the return light from the elongated strip of reflective material. A first mirror is configured to reflect the return light from the first lens. A second mirror is configured to reflect the return light from the first mirror. An optical element is configured to separate the return light from the first mirror as a function of wavelength. A second lens is configured to focus the return light from the optical element onto a first detector. The first detector is configured to measure intensities of the return light as a function of two dimensional position on the first detector.

A device that is configured to detect spectrally resolved emission from a material is disclosed. The device includes an optical cavity comprising a pair of substrates separated by a distance defined to restrict a photonic density of states (DOS) of the material to be detected, a detector oriented with respect to the optical cavity to receive emission from the optical cavity and a controller configured to control the distance. The pair of substrates includes facing reflective surfaces.

Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.