G01J3/021

OPTICAL UNIT, SPECTROSCOPIC ANALYZER, OPTICAL DEVICE, AND METHOD FOR MANUFACTURING OPTICAL UNIT
20230305279 · 2023-09-28 ·

An optical unit includes a reflective optical element and an antireflection structure having an average height and an average pitch larger than a maximum wavelength of light contained in an effective light flux. The antireflection structure is disposed outside an optical path of the effective light flux, and the antireflection structure has a plurality of convex portions extending in a predetermined direction. An angle formed between the predetermined direction and the optical path of the effective light flux is from 45 degrees to 60 degrees.

Optical filter and spectrometer including the optical filter

The disclosure provides an optical filter element including a plurality of nano-columns separated from each other in a horizontal direction and extended in a vertical direction, and each of the plurality of nano-columns includes a first material layer having an first extinction coefficient and second material layers having second extinction coefficients different from the first extinction coefficient of the first material layer and a spectrometer including the same.

Optical device

In an optical device, an elastic support unit includes a pair of levers which face in a second direction perpendicular to a first direction, a pair of first torsion support portions which are connected between the levers and the base, a pair of second torsion support portions which are connected between the pair of levers and the movable unit, and a first link member that bridges the levers. The levers and the first link member define a light passage opening. Each of connection positions between the levers and the first torsion support portions is located on a side opposite to the movable unit with respect to the center of the light passage opening in a third direction perpendicular to the first direction and the second direction. A maximum width of the light passage opening in the second direction is defined by a gap between the levers in the second direction.

Infrared sensor and infrared gas detector

The present disclosure discloses an infrared sensor, an infrared gas detector and an air quality detection device. The infrared sensor includes electrodes, a substrate, an isolation layer and a graphene film. The graphene film has a periodical nanostructure. The infrared sensor enhances the absorption of infrared light, and is capable of only absorbing specific infrared wavelengths, thus improving the selective performance of the infrared gas detector.

Heterogeneous spectroscopic transceiving photonic integrated circuit sensor

Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.

Time-resolved hyper-spectral single-pixel imaging

A time-resolved hyper-spectral imaging system for imaging a sample, includes a radiation source suitable for illuminating the sample repeatably, a first optical system configured to form an image I of the sample on a spatial light modulator forming a transmission or reflection mask P, a processor connected to the spatial light modulator and configured to make the transmission or reflection mask P vary for each repetition of the illumination, a second optical system suitable for focusing the radiation transmitted or reflected by the spatial light modulator so as to form, in its image focal plane, a partial image S=P.Math.I; the imaging system being wherein it comprises: a dispersive device comprising a slit placed in the image focal plane of the second optical system, the dispersive device being suitable for spatially splitting the various wavelengths of the radiation transmitted or reflected by the spatial light modulator; a streak camera arranged so as to be illuminated by the radiation issuing from the dispersive device and configured to acquire a plurality of time-resolved partial images of the sample, the images being associated with respective and different transmission or reflection masks P, the streak camera being connected to the processor and the processor also being configured to combine the partial images of the sample so as to construct a 4D image cube I.sub.tot forming an image resolved in time and in wavelength of the sample; and corresponding time-resolved hyper-spectral imaging method for imaging a sample.

Spectrophotometer calibration methods and systems

A method of calibrating a spectrophotometer comprising a flash lamp. The method comprises receiving light from the flash lamp at a monochromator of the spectrometer, wherein the flash lamp is a short arc noble gas flash lamp with transverse or axially aligned electrodes; configuring the monochromator to progressively transmit the received light at each of a plurality wavelengths of a selected range of wavelengths, wherein the range of wavelengths is associated with a wavelength feature according to a known spectral profile of the flash lamp, and wherein the wavelength feature is a self-absorption feature; and determining a spectrum of the flash lamp, wherein the spectrum comprises a corresponding power or intensity value for each of the plurality of wavelengths. The method further comprises determining a wavelength calibration error value for the wavelength feature by comparing the spectrum with a segment of a predetermined reference spectrum associated with the flash lamp, wherein the segment of the predetermined reference spectrum includes one or more wavelengths associated with the self-absorption feature; and calibrating the spectrophotometer based on the wavelength calibration error value.

Multichromatic calibration method and device

A Multichromatic Calibration (MC) method of at least a spectral sensor which is one of a list comprising at least a spectrometer, a multispectral sensor, a hyperspectral sensor, a spectral camera, a color camera. The method comprises a. generating a plurality of different multichromatic spectra, wherein i. a spectrum from the plurality of different multichromatic spectra contains light intensity measurable by the at least one spectral sensor and by a reference spectral device, and ii. a spectrum from the plurality of different multichromatic spectra contains light centered around at least two different wavelengths and is configured to be integrated during an exposure time of a single measurement from any of the at least one spectral sensor or the reference spectral device; b. measuring each multichromatic spectrum of the plurality of different multichromatic spectra with the reference spectral device and the at least one spectral sensor; and from all data of the measured multichromatic spectra, compute a transfer function which relates a response of the at least one spectral sensor to a corresponding response of the reference spectral device, without measuring the spectral response of the at least one spectral sensor.

Spectrometer and micro-total analysis system

A spectrometer and a micro-total analysis system are provided. The spectrometer includes a waveguide structure, a light source, a collimating mirror, a reflection grating, and a light extraction structure. The collimating mirror is configured to convert light, which is emitted from the light source, passes through the waveguide structure, and is incident on the collimating mirror, into collimating light. The reflection grating is configured to allow emergency angles of light of different wavelength ranges among the collimating light incident on the reflection grating to be different, so that the light of different wavelength ranges has an offset in the total reflection propagation process. The light extraction structure is located on the reflection surface of the waveguide structure through which the light of different wavelength ranges passes in the total reflection propagation process, so that the light of different wavelength ranges emits from the light extraction structure.

Spectrum shaping devices and techniques for optical characterization applications

Implementations disclosed describe a system comprising a first optical device to receive an input beam of light, the input beam having a plurality of spectral components of light, and cause the input beam to disperse into a plurality of spectral beams, wherein each of the plurality of spectral beams corresponds to one of the plurality of spectral components and propagates along a spatial path that is different from spatial paths of other spectral beams, and a second optical device to collect a portion of each of the spectral beams, wherein the collected portion depends on the spatial path of the respective spectral beam, and form an output beam of light from the collected portion of each of the spectral beams, wherein a spectral profile of the output beam is different from a spectral profile of the input beam of light.