Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

An optical system and design can image objects under inspection in the ultraviolet (UV) and visible spectrums. This imaging can be used to detect both large defects in the visible spectrum and small defects in the UV spectrum in a single pass while reducing the time and cost of the inspection process. The optical system may include an off-axis reflective focusing system for aberration correction with a beamsplitter to separate the visible spectrum from the UV wavelengths. Cameras may then image visible and UV wavelengths.

Devices, systems and methods for use in confocal imaging systems are described that enable lateral and axial scans at high speeds and without a moving scanner while producing high quality images. One chromatic confocal optical head includes an illumination source, such as an addressable point source array, to provide a wide spectrum illumination including multiple wavelengths. The optical head also includes a beamsplitter to allow the light to be directed toward an object, to receive the reflected light from the object and to direct the reflected light toward a detector. The optical head further includes a pinhole mask that is positioned to receive the light that is reflected from the object after passing through the beamsplitter, and a dispersion element that is positioned to receive the light after passing through the pinhole mask, and to separate the light into multiple spectral components for reception by the detector.

High-throughput hyperspectral imaging systems are provided. According to an aspect of the invention, a system includes an excitation light source; an objective that is configured to image excitation light onto the sample, such that the excitation light causes the sample to emit fluorescence light; a channel separator that is configured to separate the fluorescence light into a plurality of spatially dispersed spectral channels; and a sensor. The excitation light source includes a light source and a plurality of lenslet arrays. Each of the lenslet arrays is configured to receive light from the light source and to generate a pattern of light, and the patterns of light generated by the lenslet arrays are combined to form the excitation light. The objective is configured to simultaneously image each of the patterns of light to form a plurality of parallel lines or an array of circular spots at different depths of the sample.

An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.

A particle monitoring device includes a camera sensor for imaging particles, a set of light sources, and an optical component. A first light source provides light of a first color component. A second light source provides light of a second color component. The optical component receives light of the first color component in a first direction from the first light source, and redirects the light of the first color component in an output direction towards the particles to illuminate the particles using light of the first color component. The optical component receives light of a second color component in a second direction, different from the first direction, from the second light source, and redirects the light of the second color component in the output direction towards the particles to illuminate the particles using light of the second color component.

A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.

The present disclosure discloses a grating spectrometer having a V-shaped projection light path and capable of eliminating coma aberration. The grating spectrometer includes an entrance slit S1, a grating G, an entrance spherical reflector M1, a focusing spherical reflector M2, and an exit slit S2 which are arranged on a light path in sequence in a light transmission direction. The entrance slit S1 and the exit slit S2 are respectively arranged on two sides of the grating G, and a coaxial entrance light path formed by the entrance slit S1 and the entrance spherical reflector M1 and a coaxial diffraction light path formed by the grating G and the focusing spherical reflector M2 form a V-shaped structure by projection in a diffraction plane. The grating spectrometer has actual population and application value.

An apparatus and a method for shaping a light spectrum are presented. The apparatus includes a spatial light modulator (140) provided for shaping the spectrum of a primary beam. The spatial light modulator (140) includes an array of cells in which each cell is operable in a first state and a second state. The apparatus also includes a controller (160) configured to change the state of a subset of cells iteratively, based on a stochastic process, to shape the spectrum.

A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.