Reflectometer, Spectrophotometer, Ellipsometer and Polarimeter Systems that utilize 1) electromagnetic radiation energy absorbing or reflecting material of spatially distributed different optical densities and 2) wavelength dependent electromagnetic radiation energy aperturing, or both, placed near the entry to said multi-element detector, to improve detector capability to monitor intensity vs. wavelength spectra entered thereinto and provide more uniform detector output, while preferably maintaining beam information content.

The invention provides methods and apparatus comprising a multi-wavelength laser source that uses a single unfocused pulse of a low intensity but high power laser over a large sample area to collect Raman scattered collimated light, which is then Rayleigh filtered and focused using a singlet lens into a stacked fiber bundle connected to a customized spectrograph, which separates the individual spectra from the scattered wavelengths using a hybrid diffraction grating for collection onto spectra-specific sections of an array photodetector to measure spectral intensity and thereby identify one or more compounds in the sample.

An infrared (IR) imaging system for determining a concentration of a target species in an object is disclosed. The imaging system can include an optical system including a focal plane array (FPA) unit behind an optical window. The optical system can have components defining at least two optical channels thereof, said at least two optical channels being spatially and spectrally different from one another. Each of the at least two optical channels can be positioned to transfer IR radiation incident on the optical system towards the optical FPA. The system can include a processing unit containing a processor that can be configured to acquire multispectral optical data representing said target species from the IR radiation received at the optical FPA. One or more of the optical channels may be used in detecting objects on or near the optical window, to avoid false detections of said target species.

According to one embodiment, an optical sensor is disclosed. The sensor includes a bandpass filter which transmits light in a first wavelength band including a first wavelength, and includes a transmittance distribution of the light in the first wavelength band. The transmittance distribution has a maximal value at the first wavelength. The sensor further includes a notch filter which blocks transmission of light in a second wavelength band including a second wavelength shorter than the first wavelength, and includes a transmittance distribution of light in the second wavelength band. The transmittance distribution has a first minimal value at the second wavelength.

An electronic device may have a display with a cover layer. An ambient light sensor may be aligned with an ambient light sensor window formed from an opening in a masking layer on the cover layer in an inactive portion of the display. To help mask the ambient light sensor window from view, the ambient light sensor window may be provided with a black coating that matches the appearance of surrounding masking layer material while allowing light to reach the ambient light sensor. The black coating may be formed from a black physical vapor deposition thin-film inorganic layer with a high index of refraction. An antireflection layer formed from a stack of dielectric layers may be interposed between the black thin-film inorganic layer and the display cover layer.

A mannikin-based optical analyzer for analyzing an exposure of a subject to an environmental lighting condition. The analyzer has a mannikin with an outer surface replicating a facial profile of the subject, an interior inside the outer surface, and at least one pupil for admission of light into the interior of the mannikin. The analyzer has at least one optical detector configured to acquire and wavelength analyze light directed through the at least one pupil.

An optoelectronic module operable to acquire distance data and spectral data includes an array of demodulation pixels and an array of spectral filters. The demodulation pixels can possess an intrinsic wavelength-dependent sensitivity, wherein the intrinsic wavelength-dependent sensitivity can be offset by an intensity balancing micro-lens array in some cases. In some cases, the intrinsic wavelength-dependent sensitivity can be offset by a combined filter array, while in other cases the intrinsic wavelength-dependent sensitivity can be offset by an intensity balancing filter array. Still in other cases, the demodulation pixels can be operable in such as to offset the intrinsic wavelength-dependent sensitivity.

Spectrum sensors can be continuously calibrated in a manufacturing environment employing a continuously moving platform that carries the spectrum sensors in combination with spatially separated light spectra illuminating a region of the platform. A plurality of spectrum sensors, each including multiple sensor pixels, can be placed on the platform. The spatially separated light spectra can be illuminated over an area of the platform. The plurality of spectrum sensors can be moved with the platform through a region of the spatially separated light spectrum. Each sensor pixel for each of the plurality of spectrum sensors can be calibrated based on response of each spectral channel during passage through the spatially separated light spectra. The entire spectra from a light source can be employed simultaneously to calibrate multiple spectrum sensors in the manufacturing environment.

A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.

An apparatus includes a substrate, a first patterned layer, and a second patterned layer. The first patterned layer may be coupled to the substrate and may have a first metasurface pattern. The second patterned layer disposed separately from the substrate and the first patterned layer, and may have a second metasurface pattern. Movement of the first patterned layer relative to the second patterned layer may be controllable via control circuitry such that a gap distance of a gap between the first patterned layer and the second patterned layer is changed to cause a transmittance for radiant energy of a selected wavelength passing through the apparatus to change from a first transmittance value to a second transmittance value.