Patent classifications
G01J3/0216
Optical Element for Light Concentration and Production Method for an Optical Element for Light Concentration
An optical element for light concentration for a predefined wavelength range, includes a holding sleeve which is formed in such a way that a light passage volume is framed by at least one reflective partial surface of the holding sleeve, and a light transmission element, with which the light passage volume is at least partly filled and which is transmissive, at least for the predefined wavelength range. The light transmission element is at least partly formed from at least one medium that is diffuse for the predefined wavelength range, and has at least one first subregion having at least a first diffusivity and a second subregion having at least a second diffusivity differing from the first diffusivity. The disclosure further relates to a method for producing an optical element for light concentration.
Wavelength Shift Correction System and Wavelength Shift Correction Method
A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.
Light measuring probes, light measuring systems, and related methods
A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.
Raman probe and biological component analyzing apparatus using the same
A Raman probe includes: a light source configured to emit light onto an object; a light collector configured to collect Raman-scattered light from the object by reflecting the Raman-scattered light, the light collector including a light incident port, a light emitting port, and a reflective surface including a light incident port portion and a light emitting port portion, a slope of the light incident port portion with respect to an optical axis of the light collector being smaller than a slope of the light emitting port portion with respect to the optical axis; a condenser lens configured to collect the Raman-scattered light collected by the light collector; and a photodetector configured to detect the Raman-scattered light collected by the condenser lens.
SENSING SUBSTRATE, MANUFACTURING METHOD THEREOF, AND SENSOR
A sensing substrate including a substrate, a quantum well structure, a sensing surface and metal nanoparticles is provided. The quantum well structure is disposed on the substrate, and the quantum well structure includes at least one first metal nitride layer and second metal nitride layers. The first metal nitride layers and the second metal nitride layers are stacked on the substrate in alternation manner. The quantum well structure is located between the sensing surface and the substrate. The metal nanoparticles are disposed on the sensing surface, and the sensing surface is a rough surface. A manufacturing method of the sensing substrate and a sensor are also provided.
IMAGE SENSOR SYSTEM
An optical sensor system may include a light source. The optical sensor system may include a concentrator component proximate to the light source and configured to concentrate light from the light source with respect to a measurement target. The optical sensor system may include a collection component that includes an array of at least two components configured to receive light reflected or transmitted from the measurement target. The optical sensor system may include may a sensor. The optical sensor system may include a filter provided between the collection component and the sensor.
OPTICAL CONCENTRATION MEASUREMENT DEVICE
An optical concentration measurement device includes an LED light source, alight receiving unit having a rectangular light receiving surface and outputting a detection signal representing intensity of received light, and light guiding units guiding light emitted by the LED light source to the light receiving unit, wherein a shape on the rectangular light receiving surface of light radiated on the light receiving surface is rectangular, the optical concentration measurement device measures concentration of an object to be measured existing in a light path formed by the light guiding units, based on the detection signal output from the light receiving unit, and the light guiding units guide light at a diffraction limit or greater in such a way that area of the light on the rectangular light receiving surface is or less of area of the rectangular light receiving surface.
Sensing substrate, manufacturing method thereof, and sensor
A sensing substrate including a substrate, a quantum well structure, a sensing surface and metal nanoparticles is provided. The quantum well structure is disposed on the substrate, and the quantum well structure includes at least one first metal nitride layer and second metal nitride layers. The first metal nitride layers and the second metal nitride layers are stacked on the substrate in alternation manner. The quantum well structure is located between the sensing surface and the substrate. The metal nanoparticles are disposed on the sensing surface, and the sensing surface is a rough surface. A manufacturing method of the sensing substrate and a sensor are also provided.
OPTICAL WALL AND PROCESS SENSOR WITH PLASMA FACING SENSOR
Embodiments disclosed herein include an optical sensor system for use in plasma processing tools. In an embodiment, the optical sensor system, comprises an optically clear body with a first surface and a second surface facing away from the first surface. In an embodiment, the optically clear body further comprises a third surface that is recessed from the second surface. In an embodiment, the optical sensor system further comprises a target over the third surface and a first reflector to optically couple the first surface to the target.
Systems and methods for determining surface topology and associated color of an intraoral structure
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.