Described herein are a spectrometer system and a spectrometer device, which are suited for investigation or monitoring purposes, in particular, in the infrared (IR) spectral region, and for a detection of heat, flames, fire, or smoke.

The spectrometer device) allows capturing incident light from object and transferring the incident light to a length variable filter with a particularly high concentration efficiency. Apart from the spectrometer device the spectrometer system further includes an evaluation unit designated for determining information related to a spectrum of an object by evaluating the detector signals provided by the spectrometer device.

An embodiment of electron microscope system is described that comprises an electron column pole piece and a light guide assembly operatively coupled together. The light guide assembly also includes one or more detectors, and a mirror with a pressure limiting aperture through which an electron beam from an electron source passes. The mirror is also configured to reflect light, as well as to collect back scattered electrons and secondary electrons.

A system for detecting the presence of a plant on the ground includes a light module configured to emit a light beam having a shape with a length longer than a width. The system may include one or more lenses each having one or more photodetectors. The photodetectors may be arranged in a side-by-side configuration and are configured to receive reflected portions of the light beam. The lenses may be configured to direct the reflected portions of the light beam onto the photodetectors.

A compact, portable Raman spectrometer makes fast, sensitive standoff measurements at little to no risk of eye injury or igniting the materials being probed. This spectrometer uses differential Raman spectroscopy and ambient light measurements to measure point-and-shoot Raman signatures of dark or highly fluorescent materials at distances of 1 cm to 10 m or more. It scans the Raman pump beam(s) across the sample to reduce the risk of unduly heating or igniting the sample. Beam scanning also transforms the spectrometer into an instrument with a lower effective safety classification, reducing the risk of eye injury. The spectrometer's long standoff range automatic focusing make it easier to identify chemicals through clear and translucent obstacles, such as flow tubes, windows, and containers. And the spectrometer's components are light and small enough to be packaged in a handheld housing or housing suitable for a small robot to carry.

A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.

A semiconductor detector (100) for electromagnetic radiation within a wavelength range is disclosed, comprising a first waveguide portion (110), a funnel element (130) configured to funnel incident electromagnetic radiation into a first end (112) of the first waveguide portion, and a second waveguide portion (120) extending in parallel with the first waveguide portion. The second waveguide portion is coupled to the first waveguide portion and configured to out-couple electromagnetic radiation from the first waveguide portion, within a sub-range of the wavelength range. Further, a photodetector (140) including a photoactive layer (144) is arranged at a second end (114) of the first waveguide portion and at an end (124) of the second waveguide portion, and configured to separately detect electromagnetic radiation transmitted through and exiting the first waveguide portion and the second waveguide portion.

A spectrometer includes a light conduit configured to align scattered light scattered in a target by light output from a light source into a collimated beam, and a beam block configured to restrict an angle of the scattered light and detect the scattered light via the light conduit or the beam block through a filter array and a detector, thereby achieving miniaturization in a pen type or a flat plate shape while maintaining a spectral characteristic.

Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.

An optical measurement system is provided. The optical measurement system includes an optical fiber and a photo detecting component. The optical fiber has a first end, a second end opposite to the first end, and an inner cavity recessed from the first end and is configured to accommodate a micro device. The photo detecting component is connected to the second end of the optical fiber and is configured to receive light propagating from the first end of the optical fiber.

Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.