The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a- priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.

A spectroscopic measurement device includes: a light source unit configured to output pump light and probe light; a terahertz wave generation unit configured to generate a terahertz wave by the input of the pump light; a terahertz wave detection unit to which the terahertz wave and the probe light are input and configured to modulate the probe light based on a refractive index that changes due to an electro-optical effect according to the input of the terahertz wave; and a light detection unit configured to detect the probe light modulated by the terahertz wave detection unit. A main body unit is configured to include the light source unit and the light detection unit. A measurement unit is configured to include the terahertz wave generation unit and the terahertz wave detection unit. The main body unit and the measurement unit are optically connected to each other by a polarization maintaining fiber.

A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the input optical beam into a first optical beam and a second optical beam. The system may also include an optical configuration, which may determine an optical beam path associated with the first optical beam and the second optical beam, transmit the first optical beam in a first direction along the optical beam path and transmit the second optical beam in a second direction along the optical beam path.

A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the optical beam into at least two exit beams. The system may also include an optical configuration comprising at least one optical element. The optical configuration may receive the at least two exit beams from the birefringent element and transform at least one of the two exit beams using the at least one optical element to provide two parallel beams with parallel polarizations. The optical configuration may then output the two parallel beams with parallel polarizations to a downstream optical element, such as a diffraction grating, or other optical element.

An electronic device may include sensors such as a visible-light image sensor for capturing images. The sensors may also include optical sensors that operate at other wavelengths. An infrared light sensor may be used to gather an infrared light spectrum of a target object. The infrared light sensor may have a beam steerer and other adjustable components such as adjustable lenses and adjustable polarizers. During operation, an infrared beam emitted by the infrared light sensor may be steered onto the target object using information from a captured visible-light image and/or other sensor data such as distance sensor data, orientation sensor data, three-dimensional image sensor data, and data from other sensors. Infrared spectra, visible-light camera images, and/or data from other sensors may be used in characterizing target objects so that notifications can be provided to a user and other actions taken.

According to one embodiment, there is provided a measuring apparatus including a measurement section and a control section. The measurement section is configured to acquire a response from a sample. The control section is configured to compare a loading obtained by performing principal component analysis in advance with a first evaluation-use loading obtained by performing principal component analysis onto the response acquired from the sample, and to generate a first reliability index for measurement using principal component analysis, in accordance with a comparison result.

An optical property evaluation apparatus evaluates an optical property of an evaluation object, and includes a light source, a polarization beam splitter, a polarization adjuster, a first detector, a second detector, and an analyzer. The analyzer obtains a reflectance when linearly polarized light in a specific direction is incident on the evaluation object based on the detection result by the first detector when the light with which the evaluation object is irradiated is set to be the linearly polarized light in the specific direction. The analyzer obtains a phase property at the reflection of the evaluation object based on the detection result by the first detector or the second detector when the light with which the evaluation object is irradiated is set to have a polarization state different from the linearly polarized light in the specific direction, and a Jones matrix.

An imaging spectropolarimeter for examining targets with polarized light, the spectropolarimeter including a light source adapted to produce polarized light directed at a target. Embodiments also include a three-camera camera system defining a three-camera camera axis with a first camera unit comprising a first analyzer set at 0°, a lens and a first multi-pixel sensor, a second camera unit comprising a second analyzer set at 45°, a lens and a second multi-pixel sensor, and a third camera unit comprising a third analyzer set at 90°, a lens and a third multi-pixel sensor. At least two beam splitters adapted to direct a portion of polarized light reflected from the target to each of the first, second and third camera units. Preferred systems include a processor adapted to produce polarimetric images of the target utilizing intensity information collected by the multi-pixel sensors.

An optical system (150) is disclosed and includes an optical sensor (154), a plurality of photosensitive pixels (178) disposed on the optical sensor, a wavelength-selective optical filter (158) in optical communication with the photosensitive pixels, the wavelength-selective optical filter being disposed remotely from the optical sensor, and a plurality of spatially-variant areas (220, 224, 228, 232) disposed in the optical filter, at least one area of the plurality of spatially-variant areas including a downconverter (400, 500).

A method for obtaining chemical and/or material specific information of a sample based on scattered light. The method comprises receiving detection data comprising at least two images. Each image is indicative of the intensity of scattered light i) for incident light of a different wavelength, or ii) for incident light of a different polarization state, or iii) of a different polarization state. The scattered light comprises an elastic scattering component that is due to Rayleigh scattering of the incident light in at least a portion of the sample. Alternatively, each image is indicative of the intensity of scattered light i) of a different wavelength, or ii) for incident light of a different polarization state, or iii) of a different polarization state, wherein the scattered light comprises an inelastic scattering component that is due to Raman scattering of the incident light in at least a portion of the sample. The method further comprises determining the chemical and/or material specific information of the sample based on the change in intensity of the elastic scattering component in dependence on the change in wavelength and/or the change in polarization state of the incident and/or scattered light.