G01J3/0229

Totagraphy: Coherent Diffractive/Digital Information Reconstruction by Iterative Phase Recovery Using Special Masks
20220187138 · 2022-06-16 ·

A totagram is produced by an iterative spectral phase recovery process resulting in complete information recovery using special masks, without a reference beam. Using these special masking systems reduce computation time, number of masks, and number of iterations. The special masking system is (1) a unity mask together with one or more bipolar binary masks with elements equal to 1 and −1, or (2) a unity mask together with one or more phase masks, or (3) a unity mask together with one pair of masks or more than one pair of masks having binary amplitudes of 0's and 1's, in which the masks in the pair are complementary to each other with respect to amplitude, or (4) one or more pairs of complementary masks with binary amplitudes of 0's and 1's without a unity mask.

Light modulation device and single-channel spectrum detection system

A light modulation device and a single-channel spectrum detection system are provided. The light modulation device includes: a light guide plate; a dispersing component configured to disperse received light into light of different wavelengths and to diffract the light of different wavelengths into the light guide plate at different angles; and a dynamic filtering component configured to prevent light of a selected wavelength in the light guide plate from entering the dynamic filtering component such that the light of the selected wavelength emits out from the light guide plate, and to make light of non-selected wavelengths in the light guide plate enter the dynamic filtering component such that the light of the non-selected wavelengths is filtered out from the light guide plate.

OPTICAL MODULATION MICRO-NANO STRUCTURE, MICRO-INTEGRATED SPECTROMETER AND SPECTRUM MODULATION METHOD

An optical modulation micro-nano structure, a micro-integrated spectrometer and a spectrum modulation method are provided. The optical modulation micro-nano structure includes an optical modulation layer located on a photoelectric detection layer that can modulate incident light to form differential responses on the photoelectric detection layer, so as to obtain an original spectrum by reconstruction, thereby overcoming the defects that the existing spectrometers rely too much on precise optical components, which makes spectrometers bulky, heavy and expensive. The optical modulation layer includes a base plate and at least one modulation unit; the base plate is provided on the photoelectric detection layer, and each of the modulation units is located on the base plate; each modulation unit is provided with several modulation holes penetrating into the base plate, and respective modulation holes inside a same modulation unit are arranged into a two-dimensional graphic structure with a specific pattern.

SENSOR ARRAY SPECTROMETER

An optical device is disclosed and includes an optical sensor, a plurality of photosensitive pixels disposed on the optical sensor, a wavelength-selective optical filter in optical communication with the photosensitive pixels, and a plurality of spatially-variant written regions disposed in the optical filter, the written regions having a transmission spectrum and each of the written regions being larger than each of the pixels.

METHOD FOR RESTRICTING LASER BEAMS ENTERING AN APERTURE TO A CHOSEN DYAD AND MEASURING THEIR SEPARATION
20220178745 · 2022-06-09 ·

One embodiment of a method for restricting laser beams entering an aperture to a chosen dyad and measuring their separation. The method works with frequency-modulated coherent light, and one embodiment uses a moveable, variable-aperture apparatus (FIG. 1) in conjunction with a converging lens (6) and a detector (7). Key elements of other embodiments are described.

Monolithic spectrometer

In some embodiments, a spectrometer is presented. In accordance with some embodiments, the spectrometer includes an optical sensor array, the optical sensor array including a substrate and an array of pixels formed on the substrate; a spectral filter array formed over the pixels of the optical sensor array, the spectral filter array filtering incident light such that each pixel receives light of a spectral transmission profile associated with the pixel; a transparent spacer formed over the spectral filter array; and an opaque mask having input apertures allowing light through the transparent spacer and onto a portion of the spectral filter array. The spectrometer can be formed from the optical sensor array using a combination of photolithographic techniques and bonding of certain layers.

SENSOR ARRAY SPECTROMETER

An optical system is disclosed and includes an optical sensor, a plurality of photosensitive pixels disposed on the optical sensor, a wavelength-selective optical filter in optical communication with the photosensitive pixels, the wavelength-selective optical filter being disposed remotely from the optical sensor, an area disposed in the wavelength-selective optical filter, the area having a transmission spectrum different from a transmission spectrum of a portion of the wavelength-selective optical filter not in the area and a reflector, the wavelength-selective optical filter and a measurement subject each being disposed between the reflector and the optical sensor along an optical path.

Sensor device and method of use
11340111 · 2022-05-24 · ·

A device may determine a time-of-flight measurement by performing a sample of a sensor based on light received via at least one first spectral filter, wherein the at least one first spectral filter is associated with a spectral range for a time-of-flight measurement; determine that a condition is satisfied with regard to the time-of-flight measurement, wherein the condition relates to an orientation or a position of the sensor or the sensor device relative to a measurement target; trigger a spectrometry measurement to be performed based on determining that the condition is satisfied with regard to the time-of-flight measurement; and perform, based on light received via at least one second spectral filter and by performing a sample of the sensor, the spectrometry measurement for the measurement target based on the condition being satisfied with regard to the time-of-flight measurement.

Differential interference imaging system capable of rapidly changing shear direction and amount

A differential interference imaging system capable of rapidly changing shear direction and amount includes: a light source (101), a filter (102), a polarizer (103), a sample stage (104), an infinite imaging microobjective (105), a tube lens (106), a shear component, an analyzer (113), and an image sensor (114). After the light intensity and a polarization direction is adjusted, the linearly polarized light passes through a transparent sample, to be collected by the infinite imaging microobjective (105) and to implement imaging through the tube lens (106). An imaging beam is divided into two linearly polarized light fields which are perpendicular to each other in the polarization directions and have tiny shear amount, then they are further combined into an interference light filed by the analyzer (103) to form a differential interference image in the image sensor (114). The system may be flexibly assembled, is simple in structure and easy to implement.

Image capturing apparatus, method thereof, and storage medium
11743577 · 2023-08-29 · ·

An image capturing apparatus comprises an image sensor that receives beams of reflected light from a subject incident via an imaging optical system whose wavelength that reaches a light-receiving surface is different in accordance with an angle of incidence of reflected light, and generates an image signal. The apparatus changes a state of the imaging optical system or the image sensor such that a second image signal is generated by beams for which the angle of incidence of the reflected light from the imaging optical system is different from the beams by which a first image signal is generated. The apparatus outputs a spectral image based on a plurality of the image signals generated by receiving the beams in different state of the imaging optical system or the image sensor.