This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.

Systems and methods for hyperspectral and multispectral imaging are disclosed. A system includes a lens and an imaging device having a plurality of pixel sensors. A focus corrector is located within the optical path to refract at least a portion of the incoming light and change the focusing distance of specific wavelengths of light to converge at a focal plane. The focus corrector is selected based upon the imaging system to reduce an overall measure of deviation between a focal length curve for the lens and a focus position curve for pixel sensors to produce focused imaging data for a broad spectrum of light, including beyond the visible range.

In an optical device, an elastic support unit includes a pair of levers which face in a second direction perpendicular to a first direction, a pair of first torsion support portions which are connected between the levers and the base, a pair of second torsion support portions which are connected between the pair of levers and the movable unit, and a first link member that bridges the levers. The levers and the first link member define a light passage opening. Each of connection positions between the levers and the first torsion support portions is located on a side opposite to the movable unit with respect to the center of the light passage opening in a third direction perpendicular to the first direction and the second direction. A maximum width of the light passage opening in the second direction is defined by a gap between the levers in the second direction.

A measurement system of photoluminescence properties of a sample, comprises a radiation source module configured to generate a first radiation, an excitation optical path coupled to the radiation source module, a support structured to support a sample to be optically coupled to excitation optical path and adapted to provide a photoluminescence radiation, and collection path coupled to the sample and configured to propagate the photoluminescence radiation. The system also includes an analysis device configured to receive the photoluminescence radiation and provide data/information on photoluminescence properties of sample. At least one path between the excitation path and the collection path comprises a respective adjustable birefringent common-path interferometer module configured to produce first and second radiations adapted to interfere with each other.

A spectrometer is disclosed. The spectrometer includes a fiber input, a collimator lens, a rotating shaft, a grating, a focal lens and a focal plane which have arranged in order. A broadband incident light of the fiber input becomes a first parallel beam through the collimator lens and separated by the grating into multiple parallel beams of different wavelengths and then focused by the focal lens to emit an output beams to an imaging position on the focal plane. The spectrometer can rotate the collimator lens and fiber input to change the imaging position on the focal plane.

A confocal measuring apparatus (1) includes a light source (10), an optical system (30) configured to receive reflected light from a measurement surface, a light guide part (20) into which a plurality of cores including a first core (26) and a second core (28) is built and configured to propagate the reflected light by the plurality of cores, a displacement amount measurement part (40) including a spectroscope (42) configured to separate the reflected light propagated by the first core into each wavelength components and a detector (44) having a plurality of light receiving elements arranged to correspond to a spectral direction by the spectroscope, and a peripheral image measurement part (60) configured to form an image of the reflected light propagated by the second core on the plurality of image pickup elements and to generate a peripheral image with respect to a measurement position of the measurement surface.

A differential interference imaging system capable of rapidly changing shear direction and amount includes: a light source (101), a filter (102), a polarizer (103), a sample stage (104), an infinite imaging microobjective (105), a tube lens (106), a shear component, an analyzer (113), and an image sensor (114). After the light intensity and a polarization direction is adjusted, the linearly polarized light passes through a transparent sample, to be collected by the infinite imaging microobjective (105) and to implement imaging through the tube lens (106). An imaging beam is divided into two linearly polarized light fields which are perpendicular to each other in the polarization directions and have tiny shear amount, then they are further combined into an interference light filed by the analyzer (103) to form a differential interference image in the image sensor (114). The system may be flexibly assembled, is simple in structure and easy to implement.

The disclosure relates to an apparatus, method and process for detecting rare earth elements. The system includes an LED powered by a first power source and a focusing lens in optical communication with the LED. A shortpass filter is in optical communication with the focusing lens; and a fiber bifurcated cable in optical communication with the shortpass filter. The system includes a probe tip in optical communication with the fiber bifurcated cable and a sample; a first aspheric lens in optical communication with the fiber bifurcated cable. A longpass filter is in optical communication with the first aspheric lens and a second aspheric lens in optical communication with the longpass filter. The system includes a spectrometer connected to a power source, where the spectrometer is in optical communication with the second aspheric lens.

A light source module may include a base with a support feature protruding from a surface of the base and securing a light source to direct radiation away from the surface. A lens cells may be attached proximate to the surface, optionally by being secured within a sleeve that is attached at one end to the surface. A multi-conductor part may include electrical conductors and a base temperature sensor that contacts the base. The base temperature sensor may be electrically connected to at least one of the plurality of conductive elements and further connected to an optical ignition safety protection system configured to interrupt current to the light source if the base temperature sensor indicates that a temperature of the light source is outside of a safe range.

A method is provided for measuring time varying particle fluxes with improved temporal resolution and signal to noise ratio. The particles can be photons, neutrons, electrons or electrically charged particles. The method includes a set of electronic and/or optical components and a set of algorithms that implement N-fold temporal multiplexing of the input flux. The system can be used to measure other types of flux by using a transducer to convert the flux into a compatible form. The system can include a transducer such as a scintillator that operates to convert particle flux incident into a photon flux proportional to the amplitude of particle flux. The invention can be used with multiplexing methods known to those skilled in the art, for example Hadamard and Fourier methods.