A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

A system for determining the surface topology and associated color of at least a portion of a three-dimensional structure includes a hand-held device. A scanning system may be configured to provide depth data of the portion. An imaging system may be configured to provide two-dimensional color image data of the portion associated with the plurality of data points. A processor may be operably coupled to the hand-held device and configured to associate the depth data with the color image data.

A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

Provided are a spectrometer optical system and a semiconductor inspection apparatus, for reducing cost by allowing a wide field of view, high spatial resolution, and high wavelength resolution to be compatible with one another. The spectrometer optical system includes a masking having a slit, a first spherical mirror positioned to reflect light received from the slit, a second spherical mirror positioned to reflect the light reflected from the first spherical mirror, a dispersion element positioned to receive the light reflected from the second spherical mirror, and an image sensor configured to detect the light dispersed by the dispersion element according to wavelengths of the light.

A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

A light source-integrated lens assembly includes a lens including first through hole at its center along optical axis, an internal light shielding member including second through hole at its center and first protrusion that protrudes from front surface of the lens, and a light emitting element configured to emit light to target object. The internal light shielding member is fitted into the first through hole and the light emitting element is fitted into the second through hole to form a single integrated unit. The lens receives light emitted from the light emitting element and diffused and reflected from inside the target object. When the internal light shielding member is brought into contact with surface of the target object, the internal light shielding member prevents light emitted from the light emitting element and directly reflected at the surface of the target object from being incident on the lens.

A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

In accordance with an example embodiment of the invention, a detector assembly for an analyzer device for analysis of elemental composition of a sample using optical emission spectroscopy is provided. The detector assembly comprises an exciter for generating an excitation focused at a target position to invoke an optical emission from a surface of the sample at the target position; and a light collection arrangement for transferring the optical emission to a spectrometer. The light collection arrangement comprises a concave spherical mirror, an optical receiver arranged in an image point in the principal axis of the concave spherical mirror and a folding mirror including at least one aperture. The exciter is arranged with respect to the light collection arrangement such that the excitation is transferred towards the target position through said at least one aperture, and the folding mirror is arranged between the concave spherical mirror and the optical receiver such that the folding mirror folds the principal axis of the concave spherical mirror towards the target position and such that said at least one aperture is aligned with the principal axis of the concave spherical mirror to allow transferring optical emission reflected from the concave spherical mirror therethrough towards the optical receiver.

Provided are a spectrometer optical system and a semiconductor inspection apparatus, for reducing cost by allowing a wide field of view, high spatial resolution, and high wavelength resolution to be compatible with one another. The spectrometer optical system includes a masking having a slit, a first spherical mirror positioned to reflect light received from the slit, a second spherical mirror positioned to reflect the light reflected from the first spherical mirror, a dispersion element positioned to receive the light reflected from the second spherical mirror, and an image sensor configured to detect the light dispersed by the dispersion element according to wavelengths of the light.

A lens assembly with an integrated light source includes a light source configured to emit light to an object to be measured, a lens configured to receive light diffused and reflected from inside the object, a through hole formed at a center of the lens, in which the light source is arranged, and an internal light shielding unit arranged between the light source and an inner wall of the through hole, wherein a front portion of the internal light shielding unit protrudes from a surface of the lens toward the object.