An ICP emission spectrophotometer includes an inductively coupled plasma device, a spectroscope, and a computer. The spectroscope includes an incidence window, an incidence side slit, a diffraction grating, an emission window, an emission side slit, and a detector. Measurement conditions including diffraction condition and a measurement result are displayed on a display device. In a case where there are a plurality of diffraction conditions each including a combination of a diffraction grating and a diffraction order for measuring desired diffracted light, comparison information including at least an intensity and a resolution of emitted light in the diffraction condition is displayed on the display device. A measurer selects diffraction conditions in which resolution is higher from among the diffraction conditions, and selects a diffraction condition in which an intensity is obtained from among the selected diffraction conditions.

A spectrometer for detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest, and a method of detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest. The method uses an entrance aperture; a dispersion and imaging optics containing at least one dispersion element; an exit aperture; a collection optics; and at least one single-pixel detector, each single-pixel detector sensitive to one or more of the wavelength components; and the method comprises the steps of spatially encoding at least one entrance slit of the entrance aperture along a direction substantially transverse to a direction of dispersion of the dispersion and imaging optics; creating, using the dispersion and imaging optics, dispersed images of the entrance aperture on a plane of the exit aperture, such that respective images at the different wavelength components are offset by different amounts of displacements along the direction of dispersion; spatially encoding a plurality of exit slits of the exit aperture along the direction substantially transverse to the direction of dispersion, wherein the exit aperture comprises a plurality of exit slits arranged in the direction of dispersion; gathering, using the collection optics, a total EM wave energy that enters the entrance aperture and exits the exit aperture to one of the at least one single-pixel detectors; changing at least one of an encoding pattern of the at least one entrance slits and an encoding pattern of the plurality of exit slits for a number of times; and measuring the output of the at least one detector for respective ones of the number of times for reconstructing the EM wave spectrum.

The present disclosure relates to the field of optical systems. The envisaged multi-scan optical system is compact and stable. The system comprises an excitation source, a hydra fiber cable, a wavelength selector, an optical element, and a detector. The excitation source is configured to emit composite light. The hydra fiber cable has a head and a plurality of tentacles, and is configured to receive the composite light via a second lens. The plurality of tentacles is configured to emit the composite light towards the wavelength selector which includes a plurality of optical slits (s1-s8) and a plurality of shutters. The wavelength selector is configured to selectively collect and filter the composite light directed by a first lens and the plurality of tentacles by means of the plurality of shutters. The detector is configured to detect the plurality of spectral line scans reflected by the optical element for spectrometric analysis.

A spectral characteristic acquisition device includes a member configured to have a plurality of openings arrayed in a predetermined direction, each of the plurality of openings inclined with respect to the predetermined direction, the plurality of openings being configured to pass light beams from a plurality of positions on an object therethrough, a spectrally dispersing part configured to spectrally disperse the light beams having passed through the plurality of openings in a direction orthogonal to the predetermined direction, and a plurality of one-dimensional image capturing parts provided at a predetermined interval in a plurality of lines and configured to be irradiated with the light beams having been spectrally dispersed by the spectrally dispersing part, a plurality of pixels of the plurality of one-dimensional image capturing parts being arrayed in a direction parallel to the predetermined direction.

A gonio-spectroradiometer and a measuring method thereof. The gonio-spectroradiometer includes a light source rotating on a light source axis, a first integrating sphere revolving around the light source with respect to a revolving axis perpendicular to the light source axis with a fixed radius and including an entrance formed in a direction to see the light source, a light intensity modulator adapted to modulate light intensity of light received through the first integrating sphere according to the rotation amount of the revolving axis, and a detector adapted to measure output light of the light intensity modulator at each wavelength.

A microscope device includes an opening (31) that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass, a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening (31), and an imaging element (32) that receives the plurality of pieces of light wavelength-dispersed by the dispersion element. The imaging element (32) performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.

An Offner spectrometer for use in a multi-slit hyperspectral imaging system for imaging a remote object includes a first surface that is a transmissive surface having a narrow slit receiving light from a multi-spectral light source, a second curved transmissive surface receiving light from the first surface, a third curved reflective surface receiving light from the second surface, a fourth reflective surface that is a curved surface with a grating receiving light from the third surface and diffracting and reflecting light, a fifth surface that is curved reflective surface receiving light from the fourth surface, a sixth curved transmissive surface receiving light from the fifth surface, and a seventh surface that is a focal plane of the Offner spectrometer receiving light from the sixth surface. Each curved surface has X and Y prescriptions that are decoupled.