A spectrograph that includes a first mirror having flat a mirror reflective surface and positioned to reflect light traversing a prism, a second mirror having a concave-shaped reflective mirror surface and positioned to reflect light received from the first mirror, a third mirror having a convex-shaped reflective mirror surface and positioned to receive light reflected by the second mirror, a fourth mirror having a spheroidal reflective mirror surface and positioned to receive light reflected by the third mirror, and a field lens comprising a concave mirror surface in combination with a convex mirror surface, wherein light received by said field lens from said fourth mirror enters said convex mirror surface, traverses said field lens, and exits from said concave mirror surface. The fifth mirror is positioned such that the second mirror, third mirror, fourth mirror, and fifth mirror share a common vertex axis.

Various embodiments disclosed herein describe photonic integrated circuits and associated optical measurement systems. The photonic integrated circuit may be configured to simultaneously output light of different wavelengths from different outputs of a multiplexer. A switch network, which may include a multiplexing photonic switch, may be used to selectively route the different wavelengths to a common set of launch groups, from which the light may be emitted from the photonic integrated circuit.

A multipulse-induced spectroscopy method based on a femtosecond plasma grating includes: pre-exciting a sample on a stage by providing a femtosecond pulse to form the femtosecond plasma grating; providing a post-pulse on the sample at an angle to excite the sample to generate a plasma, wherein the post-pulse comprises one or more femtosecond pulses, there is a time interval between the femtosecond pulse and the post-pulse, and the time interval is less than a lifetime of the femtosecond plasma grating; and receiving and analyzing a fluorescence emitted from the plasma to determine element information of the sample.

The present disclosure concerns a spectrometer (10) and method for generating a two dimensional spectrum (S). The spectrometer (10) comprises a main grating (3) and cross dispersion element (2). An imaging mirror (4) is arranged for reflecting and focussing dispersed radiation (R3) from the main grating (3) towards an image plane (IP) for imaging the two dimensional spectrum (S) onto an image plane (IP) of the spectrometer (10). A correction lens (6) is arranged for correcting optical aberrations in the imaging of the two dimensional spectrum (S) in the image plane (IP). The imaging mirror (4) and correction lens (6) have a coinciding axis of cylindrical symmetry (AS).

A method of processing two dimensional optical spectra, such as echelle spectra, is disclosed. The optical spectra comprise sections having a relatively high intensity separated by borders having a relatively low intensity. The optical spectra have been digitized (61) by a detector. The method comprises denoising (62) an optical spectrum, searching (64) for at least one series of neighboring local extrema of the optical spectrum, fitting (65) a line through each series of neighboring local extrema, each line representing a section, identifying (67) any peaks and their respective locations, and storing (68) the lines and the locations of any peaks.

Various embodiments disclosed herein describe photonic integrated circuits and associated optical measurement systems. The photonic integrated circuit may be configured to simultaneously output light of different wavelengths from different outputs of a multiplexer. A switch network, which may include a multiplexing photonic switch, may be used to selectively route the different wavelengths to a common set of launch groups, from which the light may be emitted from the photonic integrated circuit.

Systems, devices, and methods of analyzing an interfered peak of a sample spectrum is disclosed. The sample spectrum may be generated using a detector of an optical spectrometer. The interfered peak may be produced by a plurality of spectral peaks of different wavelengths. The method may include generating interfered curve parameters representative of the peak shape of each spectral emission in the interfered peak based at least in part on a model of expected curve parameters for the optical spectrometer and a location of the interfered peak on the detector of the optical spectrometer; fitting a plurality of curves to the interfered peak, each curve corresponding to one of the plurality of spectral emissions of different wavelengths forming the interfered peak, wherein each curve is fitted using the interfered curve parameters provided by the model of expected peak parameters; and outputting the plurality of curves for further analysis.

A method of optical spectroscopy for analysing a sample using an optical spectrometer is provided. The method comprises obtaining a sample spectrum of the sample using the optical spectrometer and obtaining a blank spectrum using the optical spectrometer. The blank spectrum comprises structured background radiation which is correlated with the sample spectrum. A cross-correlation of the sample spectrum and the blank spectrum is determined. A mapped blank spectrum is generated by mapping the blank spectrum to the sample spectrum based on the cross-correlation, and the mapped blank spectrum is subtracted from the sample spectrum to generate a background corrected sample spectrum.

Disclosed herein are scientific instrument support systems, related methods, computing devices and computer-readable media. A method of mitigating distortion of an optical emission spectrum obtained from an optical emission spectrometer is provided. The method may comprise a step of obtaining a spectrum recorded with the spectrometer and a respective one or more condition parameters indicative of an operating condition at a time of recording the spectrum. The method may further comprise a step of providing a model configured to output, in response to the one or more condition parameters, one or more transform parameters of a transformation to be applied to the obtained spectrum. A transformation may be applied in accordance with the obtained one or more transform parameters to the obtained spectrum to mitigate distortion of the spectrum due to a discrepancy between the operating condition and a baseline operating condition.