A wavelength checker includes an optical converter composed of a conversion material that converts infrared light into visible light. The optical converter is disposed, on an output side (side from which light is output to an external space) of a plurality of first output waveguides of an optical waveguide chip, to receive emitted light that is guided through the first output waveguides and reflected on and emitted from the light emitting-side end surface. The light emitting-side end surface is a reflection surface that is inclined to face a main substrate.

The present disclosure is directed to a method of forming a polarization grating structure (e.g., polarizer) as part of a grid structure of a back side illuminated image sensor device. For example, the method includes forming a layer stack over a semiconductor layer with radiation-sensing regions. Further, the method includes forming grating elements of one or more polarization grating structures within a grid structure, where forming the grating elements includes (i) etching the layer stack to form the grid structure and (ii) etching the layer stack to form grating elements oriented to a polarization angle.

A light splitting device includes an optical waveguide body and a dispersion grating. The optical waveguide body is configured to transmit incident light to the dispersion grating, the dispersion grating is configured to disperse the incident light transmitted by the optical waveguide body into a plurality of spectral lines, and the optical waveguide body is further configured to change propagation directions of the plurality of spectral lines and to emit the plurality of spectral lines.

[Object] An optimal structure for spectroscopically analyzing a solid-phase or liquid-phase sample in a wavelength range of 1100 to 1200 nm by using supercontinuum light is provided. [Solution] Supercontinuum light generated by producing nonlinear effects in light from a pulse laser source 1 by a nonlinear element 2 and having a wavelength range including 1100 nm or greater and 1200 nm or less is subjected to pulse stretching by a pulse stretching element 3, and a solid-phase or a liquid-phase sample S is irradiated with the supercontinuum light. In the supercontinuum light, elapsed time and wavelength within one pulse are in a one-to-one correspondence, and computation means 5 computes a spectrum based on a change over time in an output from a light receiver 4 that has received light that has passed through the sample S.

Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.

A monitoring system for a power grid includes one or more power transformer monitors. Each power transformer monitor includes a plurality of optical sensors disposed on one or more optical fibers that sense parameters of the power transformer. Each optical sensor is configured to sense a power transformer parameter that is different from a power transformer parameter sensed by at least one other sensor of the plurality of optical sensors. An optical coupler spatially disperses optical signals from the optical sensors according to wavelength. A detector unit converts optical signals of the optical sensors to electrical signals representative of the sensed power transformer parameters.

A monitoring system includes an array of optical sensors disposed within a transformer tank. Each optical sensor is configured to have an optical output that changes in response to a temperature within the transformer tank. An analyzer is coupled to the array of optical sensors. The analyzer is configured to determine a sensed temperature distribution based on the sensed temperature. The sensed temperature distribution is compared to an expected distribution. Exterior contamination of the transformer tank is detected based on the comparison.

The present disclosure is directed to a method of forming a polarization grating structure (e.g., polarizer) as part of a grid structure of a back side illuminated image sensor device. For example, the method includes forming a layer stack over a semiconductor layer with radiation-sensing regions. Further, the method includes forming grating elements of one or more polarization grating structures within a grid structure, where forming the grating elements includes (i) etching the layer stack to form the grid structure and (ii) etching the layer stack to form grating elements oriented to a polarization angle.

Disclosed is a measurement system using a fiber Bragg grating sensor, which includes a sensing unit including a plurality of dynamic sensors and static sensors using fiber Bragg gratings to detect mutually different physical quantities to be measured, an optical meter configured to measure each physical quantity by simultaneously processing data output from the plurality of dynamic sensors and static sensors in real time, and a server configured to store and manage the data measured by the optical meter. Mutually different physical quantities are measured by simultaneously processing the data output from the plurality of dynamic sensors and static sensors in real time by using one optical meter.

A chip-based planar Raman spectroscopic measurement system is disclosed comprising at least a semiconductor laser as excitation light source, an output waveguide coupling and delivering laser light out of chip, a photo-detector monitoring the laser optical power, an input waveguide coupling signal light to chip, a planar spectrometer comprising Planar Waveguide Grating (PWG) and an array photo-detectors, and control electronics. In some embodiments the PWG is a fixed frequency Arrayed Waveguide Grating (AWG), the laser is frequency-tunable. In other embodiments, the laser has fixed frequency, the PWG or the AWG is frequency tunable. In either case, the frequency tunability will ensure the recapture of the spectral information missed due to the spectral characteristics of the planar waveguide grating such as the channel spacing of the AWG, resulting in high channel count and high-resolution Raman measurement of sufficient spectral range.