The invention relates to a method for online quality control of decorative prints on substrate materials, including similarity comparisons of actual and target images and adjusting decorative prints if deviations of color values are detected. The method may include the steps of: a) producing a hyperspectral digital image of a print decoration; b) calibrating the print decoration via a hyperspectral digital image; c) producing and storing a digital target image of the print decoration; d) creating a first print decoration on a first substrate material; e) producing and storing a digital actual image of the printed decoration on the first substrate material; f) determining color deviations between the digital target image and the digital actual image via a computer program; and g) printing on at least one side of substrate materials so as to form a decorative layer. The invention also relates to a device for carrying out the method.

A processing apparatus is connected to one or more terminals including a hyperspectral sensor that generates compressed image data which is hyperspectral information of a target compressed as two-dimensional image information over a network. The processing apparatus includes a storage device that stores data sets of samples and a first reconstruction table for generating hyperspectral data from the compressed image data, the data set of each sample includes hyperspectral data of the sample and data indicative of a property value of the sample; and a processing circuit that generates a statistical model for estimating the property value from the hyperspectral data on the basis of the data sets of the samples and generates a second reconstruction table by editing the first reconstruction table in accordance with the statistical model thus generated.

A spectral filter may include a plurality of filter arrays each including a plurality of unit filters having different center wavelengths from each other. Each of the plurality of unit filters may include a first metal reflection layer and a second metal reflection layer which are disposed to be apart from each other; a cavity including a first pattern and being arranged between the first metal reflection layer and the second metal reflection layer; and a lower pattern film being disposed under the first metal reflection layer and including a second pattern. In unit filters having a same center wavelength in each of the plurality of unit filters corresponding to the plurality of filter arrays, the first pattern of the cavity and the second pattern of the lower pattern film may vary according to a position of the unit filters.

Aspects of the present disclosure provide a method for wavelength calibration of a spectrometer. The method can include receiving a calibration light signal having first spectral components of different first wavelengths; separating and projecting the first spectral components onto pixels of a detector of the spectrometer; establishing a relation between the first wavelengths and pixel numbers of first pixels on which the first spectral components are projected; calculating first residual errors between the first wavelengths and estimated wavelengths that are associated by the relation to the pixel numbers of the first pixels; receiving an optical signal having a second spectral component of a second wavelength; projecting the optical signal onto a second pixel; and calibrating the second wavelength based on a second residual error calculated based on one of the first residual errors that corresponds to a pair of the first pixels between which the second pixel is located.

A spectral camera control device, being installed, along with a spectral camera provided with a liquid crystal tunable filter, in an aircraft capable of stationary flight. The spectral camera control device causes the spectral camera to capture a spectral image in a snapshot mode each time a transmission wavelength of the liquid crystal tunable filter is switched while the aircraft is in stationary flight, and the spectral camera control device causes a plurality of spectral images to be captured in succession at a same transmission wavelength when an SN ratio of the captured spectral image is less than a predetermined threshold.

Improved imaging and spectrographic devices and systems, and in particular hyperspectral systems and devices suitable for use in analysis of soils and other geological substances, as well as other types of samples. The hyperspectral systems comprise diffraction gratings and a linear image sensor, and optionally one or more of light sources, lenses, slits, and digital light processors, and corresponding control processors and memory. Among other advantages, the hyperspectral systems and devices enable detailed spectrographic analysis of specific points, regions, and/or areas in analytical samples such as core samples and other types of soil blocks, using visible, infrared, and/or ultraviolet electromagnetic radiation.

A signal processing method according to one aspect of the present disclosure includes obtaining compressed image data including two-dimensional image information that is obtained by compressing hyperspectral information corresponding to wavelength bands included in a target wavelength range, obtaining setting data including information designating one or more sub-wavelength ranges that are parts of the target wavelength range, and generating, based on the compressed image data, two-dimensional images corresponding to wavelength bands included in the one or more sub-wavelength ranges.

An optical element includes an optical block constructed of a first material having a % transmission of at least 50% throughout a spectral range of 300 nm to 2700 nm through at least a thickness of the optical block. The optical block comprises a surface. A grating layer constructed of a second material is disposed on the surface of the optical block, the grating layer comprising a first surface that is directly in contact with the surface of the optical block and a second surface comprising a plurality of diffraction features forming a diffraction grating.

An optical device and a spectral detection apparatus are provided. The optical device includes an optical waveguide, including: a polychromatic light channel configured to transport a polychromatic light beam, and provided with a light incident surface for receiving the incident polychromatic light beam at an input end of the polychromatic light channel; a chromatic dispersion device arranged downstream from the polychromatic light channel in an optical path and configured to separate the polychromatic light beam from the polychromatic light channel into a plurality of monochromatic light beams; and a plurality of monochromatic light channels arranged downstream from the chromatic dispersion device in the optical path and configured to respectively conduct the plurality of monochromatic light beams with different colors from the chromatic dispersion device. Monochromatic light output surfaces are respectively provided at output ends of the plurality of monochromatic light channels and configured to output the monochromatic light beams.

Disclosed are embodiments of an improved apparatus and system, and associated methods for optically diagnosing a semiconductor manufacturing process. A hyperspectral imaging system is used to acquire spectrally-resolved images of emissions from the plasma, in a plasma processing system. Acquired hyperspectral images may be used to determine the chemical composition of the plasma and the plasma process endpoint. Alternatively, a hyperspectral imaging system is used to acquire spectrally-resolved images of a substrate before, during, or after processing, to determine properties of the substrate or layers and features formed on the substrate, including whether a process endpoint has been reached; or before or after processing, for inspecting the substrate condition.