In one aspect, a hyperspectral image measurement device is provided to include: a main body; an illumination module disposed in the main body and including LEDs having different peak wavelengths to irradiate light to a subject; a camera disposed on the main body and receiving light reflected from the subject to acquire an image of the subject; a barrel having a contact surface contacting the subject, the contact surface located to be spaced apart from the illumination module and the camera module by a predetermined distance; and a reference cover located on the contact surface and including a standard reflection layer for reflecting light irradiated from the illumination module toward the camera module.

Systems and methods for measuring a fundamental mode vibrational spectrum of materials and substances in the Mid-IR spectral range of 2.5 μm to 14 μm wavelength. are disclosed herein. In one embodiment, a Mid-infrared absorption spectrometer (MIRAS) system includes an infrared Micro-Electro-Mechanical System (MEMS) single element emitter light source. The light source is electrically pulsed and emits electromagnetic radiation in the wavelength range from 2.5 μm to 14 μm and has an integral energy concentrating optic to provide energy for a spectral absorption process. The system includes a scanning high-efficiency infrared spectral grating with self-calibrating feature, configured so that incident energy having absorption information for the spectral absorption process of a sample is within a predefined threshold of a grating blaze angle. The system also includes a single-element thermal detector to receive output energy having the absorption information from the infrared spectral grating.

Systems, methods, and computer-readable media are disclosed for a systems and methods for intra-shot dynamic LIDAR detector gain. One example method my include receiving first image data associated with a first image of an object illuminated at a first wavelength and captured by a camera at the first wavelength, the first image data including first pixel data for a first pixel of the first image and second pixel data for a second pixel of the first image. The example method may also include calculating a first reflectance value for the first pixel using the first pixel data. The example method may also include calculating a second reflectance value for the second pixel using the second pixel data. The example method may also include generating, using first reflectance value and the second reflectance value, a first reflectance distribution of the object.

In one aspect, a hyperspectral image measurement device is provided to include: a main body; an illumination module disposed in the main body and including LEDs having different peak wavelengths to irradiate light to a subject; a camera disposed on the main body and receiving light reflected from the subject to acquire an image of the subject; a barrel having a contact surface contacting the subject, the contact surface located to be spaced apart from the illumination module and the camera module by a predetermined distance; and a reference cover located on the contact surface and including a standard reflection layer for reflecting light irradiated from the illumination module toward the camera module.

Disclosed are a multi-mode thermal imaging device and an operation method thereof. According to an embodiment of the present invention, in a first mode, a first sample is scanned with an optical signal from a light source, signals reflected from the first sample by the scanning are detected separately for each wavelength, a reflectance change spectrum according to the wavelength is derived on the basis of the signals detected separately for each wavelength, a wavelength is selected on the basis of the derived reflectance change spectrum, and a thermal image of the first sample is obtained, through a filter, by detecting an optical signal limited to the selected wavelength from among the signals reflected from the first sample. In a second mode, thermal radiation of a second sample is detected to obtain a thermal image of the second sample.

A measuring device a measurement unit configured to measure an image on a sheet, the measurement unit including a light emitting portion configured to illuminate the sheet with light, and a detecting portion configured to detect light reflected by the sheet; a supporting unit supporting the measurement unit; and a driving unit configured to move the measurement unit supported by the supporting unit in a scanning direction. A size, in the scanning direction, of a detectable range of the detecting portion in which the detecting portion is capable of detecting the reflected light from the sheet is larger than a size, in a sub-scanning direction perpendicular to the scanning direction and a normal direction of a surface of the sheet, of the detectable range of the detecting portion.

The present invention relates to a hyperspectral apparatus and method. One aspect of the invention provides an apparatus for analyzing a sample. The apparatus comprises a light source configured to generate a broadband input irradiance field. The apparatus also comprises a structured light generator for converting the input irradiance field into a structured illumination field including an array of beamlets. An optical system projects the structured illumination field onto a region of the sample such as the retina. A spectrometer is configured to spectrally analyze a portion of light that is reflected, backscattered or fluoresced from the region of the sample. A processor is operatively associated with the spectrometer and configured to generate a hyperspectral image comprising two or more en-face images of the region of the eye. The en-face images include spectral response information of the sample from each beamlet of the structured illumination field.

The disclosure relates to an infrared spectrometer comprising first and second opposing reflectors spaced apart by a spacing length, and a plurality of discrete concave reflecting facets, the reflecting facets being facets of at least one of the opposing reflectors. An infrared laser source is arranged to form a laser beam. The opposing reflectors are arranged such that the laser beam is reflected alternately from each of the opposing reflectors, including being reflected at least once by each of the reflecting facets. A detector is arranged to detect spectral properties of the laser beam after reflection from each of the plurality of reflecting facets, and an analyser then determines properties of a sample disposed between the first and second opposing reflectors from the detected spectral properties.

This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.

This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.