A method for obtaining chemical and/or material specific information of a sample based on scattered light. The method comprises receiving detection data comprising at least two images. Each image is indicative of the intensity of scattered light i) for incident light of a different wavelength, or ii) for incident light of a different polarization state, or iii) of a different polarization state. The scattered light comprises an elastic scattering component that is due to Rayleigh scattering of the incident light in at least a portion of the sample. Alternatively, each image is indicative of the intensity of scattered light i) of a different wavelength, or ii) for incident light of a different polarization state, or iii) of a different polarization state, wherein the scattered light comprises an inelastic scattering component that is due to Raman scattering of the incident light in at least a portion of the sample. The method further comprises determining the chemical and/or material specific information of the sample based on the change in intensity of the elastic scattering component in dependence on the change in wavelength and/or the change in polarization state of the incident and/or scattered light.

Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm.sup.2, allowing it to fit on mobile devices.

A semiconductor device measuring device includes: a light generator which generates light; a polarizer which polarizes the light; a wafer stage including a first load port on which an undoped reference wafer is loaded, and a second load port on which a doped sample wafer is loaded, the wafer stage being movable to first and second positions at which the polarized light is incident on the reference wafer and the sample wafer, respectively; a spectroscope which collects first and second Raman spectral information of light reflected from the reference and sample wafers, respectively; a photodetector which detects first and second Raman scattering signals based on the first and second Raman spectral information, respectively; a spectrum corrector which corrects the second Raman scattering signal using the first Raman scattering signal; and a controller which calculates a concentration of the dopant of the sample wafer using the corrected scattering signal.

A method of determining the contributions of multiple incident photons to an output of a sensor, including providing a photonic sensor having a sensor input and capable of generating an electrical signal proportional to a number of photons interacting with the photonic sensor input as a function of time, calibrating the photonic sensor such that a response of the photonic sensor to a single photon detected is in a waveform having an amplitude and a time, wherein the product of the amplitude and the time is statistically bounded, determining a probabilistic boundary between one or more of electrical, optical, and thermal sources of noise of the sensor, acquiring a response wave form from the photonic sensor through analog-to-digital conversion with a resolution in amplitude and time corresponding to accuracy required in quantifying the response wave form, storing each acquired response wave form, individually, in a format selected from the group consisting of real-time and buffered packets in digital form, and determining a total count of likely photon arrivals for a specific time resolved acquisition.

An optical detector device may receive a spectroscopic measurement from a multispectral sensor. The optical detector device may determine, based on the spectroscopic measurement, a particulate size of a particulate. The optical detector device may determine, based on the spectroscopic measurement, an identification of the particulate. The optical detector device may determine, based on the particulate size and the identification of the particulate, that an alert condition is satisfied. The optical detector device may trigger an alert based on determining that the alert condition is satisfied.

A detector device for the remote analysis of materials, in particular hazardous materials, including at least one laser, which is designed to emit pulsed laser light onto a sample located at a detection distance, and a telescope, which is designed to collect and/or focus laser light scattered on the sample and to forward the scattered laser light into an optical spectrometer. The optical spectrometer is designed for a spectral analysis of the laser light scattered on the sample. The laser is followed by a first beam path with a first reference beam and an additional beam path with a second reference beam for the scattered laser light. A unit is provided for determining a time difference between pulses of the first reference beam and pulses of the second reference beam, wherein the detection distance can be determined from the time difference. The unit is designed to determine the detection distance in real-time.

A measuring apparatus includes a flow cell through which a sample containing particles flows, a light source for irradiating light on the sample flowing through the flow cell, a fluorescence detector for detecting the fluorescence generated from the sample irradiated with light from the light source, and a control unit for flowing a positive control sample containing a fluorescent dye through the flow cell, measuring the fluorescence generated from the positive control sample irradiated by the light from the light source via the fluorescence detector, comparing the obtained measurement value and a reference value, and adjusting the detection sensitivity of the fluorescence detector according to the comparison result.

Systems and methods are provided for analyzing a biomechanical property of a medium using stimulated Brillouin scattering microscopy. The method can include a first step of applying a probe beam and pulsed pump beam to a target section of the medium, wherein the pump beam interacts with the probe beam to generate at least one acoustic wave in the medium and at least one Brillouin signal is produced as a result of the generated acoustic wave. The method can also include a second step of receiving the produced Brillouin signal and a third step of determining, using a processor and the

One embodiment provides an optical spectrometer. The optical spectrometer can include a lens-and-filter system configured to collect light scattered from a sample, a spot converter configured to convert a substantially circular beam outputted from the lens-and-filter system into a substantially rectangular beam, and a slit comprising a rectangular aperture to allow a predetermined portion of the substantially rectangular beam to enter the rectangular aperture while blocking noise. The slit can further include at least one microelectromechanical systems (MEMS)-based movable structure configured to adjust a width of the rectangular aperture.

A downhole tool has a tool body with an outer diameter equal to a borehole diameter, at least one cavity formed in and opening to an outer surface defining the outer diameter of the tool body, a light source, a filter, and a light detector mounted in the at least one cavity, and a window disposed at the opening of the at least one cavity, wherein the window encloses the cavity.