A reference material for and a method of calibrating at least one Raman spectrometer are disclosed. The reference material includes quantum dots distributed in a transparent condensed phase material such that light emitted by the reference material in response to receiving excitation light having an excitation wavelength provided by the Raman spectrometer(s) has a predetermined spectral intensity distribution in a spectral measurement range of the Raman spectrometer(s). The method includes designing, manufacturing and providing the reference material, determining an emission spectrum of the reference material, and calibrating each Raman spectrometer by determining a reference spectrum of the reference material and by adjusting a determination of spectral intensity values of intensity spectra performed by the Raman spectrometer based on the reference spectrum and the emission spectrum of the reference material.

Provided are a Raman signal measuring method and apparatus which use a difference in a time scale between Raman scattered light and fluorescence. Thus, after exciting light is incident upon a target object, light scattered from the target object may be detected before the target object generates fluorescence in response to the exciting light. As a result, a Raman signal in which background fluorescence is reduced may be obtained.

A method for fabrication of a chip for surface enhanced Raman spectroscopy (SERS), including: providing a substrate; texturing a surface of the substrate to form a plurality of pillars randomly on the surface until a desired average pillar height, average pillar width and/or pillar density is/are reached; depositing a metal onto the surface of the textured substrate; and thermally annealing the metal such that the metal forms a layer encasing the pillars.

The present invention relates to a method (500) for enhancing a Raman contribution in a spectrum of a sample (102), the method (500) comprising: Recording (504) a first spectrum of light (200) comprising information associated with ambient light and a first measurement response, wherein the first measurement response comprises a first optical response and a first Raman response of the sample (102) in response to being illuminated with light (104), having a first spot size (103b), from a light source (110). Recording (508) a second spectrum of light (300) comprising information associated with ambient light and a second measurement response, wherein the second measurement response comprises a second optical response and a second Raman response of the sample (102) in response to being illuminated with light (104), having a second spot size (103a), from the light source (110). Wherein the first spot size (103b) is larger than the second spot size (103a), whereby a contribution, to the first measurement response, of the first Raman response in relation to a contribution of the first optical response is smaller than a contribution, to the second measurement response, of the second Raman response in relation to the second optical response. Forming (510) a data set (400) based on a dissimilarity between the first spectrum (200) and the second spectrum (300), thereby enhancing a contribution of a Raman response to the formed data set (400). A spectroscopy system (100), a computer program and a non-transitory computer-readable storage medium are also disclosed.

In an embodiment an apparatus includes at least one optoelectronic laser configured to provide excitation radiation to a sample, the excitation radiation being generated by an electric current flowing through the at least one optoelectronic laser, a transistor configured to modulate the electric current flowing through the at least one optoelectronic laser in order to switch on and off generation of the excitation radiation and a spectrometer configured to analyze Raman light scattered from the sample in response to exposing the sample to the excitation radiation, wherein the Raman light includes one or more spectral components, wherein the spectrometer includes a diffraction element configured to split the Raman light into the spectral components, and wherein the diffraction element includes at least a photonic crystal or a plasmonic Fabry Perot filter.

A device (122) is described having an arrangement of optical elements comprising excitation light sources (101, 115) for generating individual light beams (102, 116) having different wavelengths for exciting a sample in such a way that light scattered back from the sample as a result of the excitation is made available to a Raman spectroscopic analysis. The device (122) has deflection devices (103, 117) associated with the individual light beams (102, 116) for deflecting the individual light beams (102, 116) onto a common light path, wherein the common light path has a same optical system (109) for focusing the light beams (102, 116).

The method of rapid identification of natural and synthetic diamonds using a third-order Raman spectra is to make a diamond third order under large-scale comparative studies with synthetic diamond (CVD & HPHT) to distinguish natural and synthetic diamonds with their differences in Raman peaks. This analysis of the differences in characteristic peak phenomenon can form the basis of a rapid identification and analytical technique.

A compact, portable Raman spectrometer makes fast, sensitive standoff measurements at little to no risk of eye injury or igniting the materials being probed. This spectrometer uses differential Raman spectroscopy and ambient light measurements to measure point-and-shoot Raman signatures of dark or highly fluorescent materials at distances of 1 cm to 10 m or more. It scans the Raman pump beam(s) across the sample to reduce the risk of unduly heating or igniting the sample. Beam scanning also transforms the spectrometer into an instrument with a lower effective safety classification, reducing the risk of eye injury. The spectrometer's long standoff range automatic focusing make it easier to identify chemicals through clear and translucent obstacles, such as flow tubes, windows, and containers. And the spectrometer's components are light and small enough to be packaged in a handheld housing or housing suitable for a small robot to carry.

A Raman spectroscopy device includes: an irradiator that irradiates a sample with first excitation light having a first line width and second excitation light having a line width broader than the first line width; a spectroscopy measurer that, when first measurement light emitted from the sample when the sample is irradiated with the first excitation light and second measurement light emitted from the sample when the sample is irradiated with the second excitation light are incident, performs spectroscopy measurement on the first measurement light and the second measurement light; and a first selective optical system that has a first transmission band and a first stop band, and filters the first measurement light and the second measurement light incident on the spectroscopy measurer. The first excitation light and the second excitation light each have a main component in the first stop band, and the second excitation light has substantially no component in the first transmission band.

A reference material for and a method of calibrating at least one Raman spectrometer are disclosed. The reference material includes quantum dots distributed in a transparent condensed phase material such that light emitted by the reference material in response to receiving excitation light having an excitation wavelength provided by the Raman spectrometer(s) has a predetermined spectral intensity distribution in a spectral measurement range of the Raman spectrometer(s). The method includes designing, manufacturing and providing the reference material, determining an emission spectrum of the reference material, and calibrating each Raman spectrometer by determining a reference spectrum of the reference material and by adjusting a determination of spectral intensity values of intensity spectra performed by the Raman spectrometer based on the reference spectrum and the emission spectrum of the reference material.