An infrared light source device includes: a heater portion which emits infrared light by being heated; and a cover member arranged to cover an entire circumference of the heater portion without contacting the heater portion, and having a hole formed therein for emitting the infrared light from the heater portion to outside. A material for the cover member is a pure aluminum (an aluminum alloy with a purity of 99% or more), which has a high heat reflectivity and is less likely to be denatured by heat dissipation from the heater portion.

The process and device for diagnosing the quality of compression of an ultrashort pulse, consist of performing an approximation of the Strehl ratio by: —a first step allowing the measurement of spatio-spectral images of the ultrashort light pulse brief initial (Ii) using one or more parallel imaging spectrometers; —a second step allowing an interaction of said pulse with a nonlinear optical material (DMNL), the aforementioned interaction generating, by a nonlinear optical mechanism of an n order, a secondary pulse (Is) of intensity proportional to the temporal intensity aforementioned ultrashort light pulse (Ii) raised to the power of n; —a third step allowing the measurement of the spatio-spectral image or images of the secondary pulse (Is); —the processing of the images thus obtained will be translated into an expression of the ratio of the maximum intensity obtained by that which could be obtained for the pulse without phase distortion.

The process and device for diagnosing the quality of compression of an ultrashort pulse, consist of performing an approximation of the Strehl ratio by: —a first step allowing the measurement of spatio-spectral images of the ultrashort light pulse brief initial (Ii) using one or more parallel imaging spectrometers; —a second step allowing an interaction of said pulse with a nonlinear optical material (DMNL), the aforementioned interaction generating, by a nonlinear optical mechanism of an n order, a secondary pulse (Is) of intensity proportional to the temporal intensity aforementioned ultrashort light pulse (Ii) raised to the power of n; —a third step allowing the measurement of the spatio-spectral image or images of the secondary pulse (Is); —the processing of the images thus obtained will be translated into an expression of the ratio of the maximum intensity obtained by that which could be obtained for the pulse without phase distortion.

A method of operating a hyperspectral imaging device includes connecting electrodes on a liquid crystal variable retarder to a voltage source, rotating liquid crystal material in the liquid crystal variable retarder between a first orientation with a certain optical phase delay and a second orientation with a different optical phase delay, receiving a beam of light at an image sensor that has passed through the liquid crystal variable retarder, and producing an output signal from the image sensor.

An optical module includes a base which has a main surface and in which a mounting region and a driving region for moving the mounting region along a first direction parallel to the main surface are provided, a movable mirror which has a mirror surface having a positional relationship of intersecting the main surface and is mounted in the mounting region, a first fixed mirror which has a mirror surface having a positional relationship of intersecting the main surface and of which a position with respect to the base is fixed, and a beam splitter unit which constitutes a first interference optical system for measurement light together with the movable mirror and the first fixed mirror. The mirror surface of the movable mirror and the mirror surface of the first fixed mirror are directed to one side in the first direction.

An on-chip interferometer and a spectrometer including the interferometer are provided. An on-chip interferometer includes a waveguide for propagation of an optical signal including an input waveguide; at least two interferometer arms having one or more slot waveguides; and an output waveguide; wherein the input waveguide is split into the at least two interferometer arms which are recombined into the output waveguide; and a control mechanism configured for controlling a relative time delay between optical signals propagating in the two interferometer arms by modifying one or more slot widths of one or more of the slot waveguides; and wherein the relative time delay is at least 1, 2, 5, or at least 10 fs or at least one optical period of the longest optical wavelength of the optical signal.

Apparatus and methods are presented for spectral domain optical imaging, in particular for single shot 3-D spectral domain imaging of the retina of the human eye. In certain embodiments one or more 3-D images across elongated areas of an object are acquired, with scanning perpendicular to the long axis of the elongated areas for imaging extended volumes of the object. In preferred embodiments the captured light is sampled in the Fourier plane, in a dimension substantially perpendicular to the long axis, with a cylindrical lenslet array, while in other embodiments the captured light is sampled in the image plane. Apparatus and methods are also presented for hyperspectral imaging of the retina, with the illuminating beams preferably angled to suppress interference from corneal reflections. Apparatus and methods are also presented for multi-wavelength wavefront sensing, with simultaneous capture of light in two or more paths with different delays.

A dual optical frequency comb generator incudes a semiconductor substrate, a first optical frequency comb laser light source including a first resonator, a second optical frequency comb laser light source including a second resonator and differing in repetition frequency of optical pulses from the first optical frequency comb laser light source, two or more outputters including first and second outputters, a first optical waveguide connecting the first optical frequency comb laser light source with the first outputter, a second optical waveguide connecting the second optical frequency comb laser light source with the second outputter, and a third optical waveguide that branches off from the first optical waveguide and joins the second optical waveguide. The first optical frequency comb laser light source, the second optical frequency comb laser light source, the two or more outputters, and the optical waveguides are integrated on the semiconductor substrate.

A spectrum measurement device of the present invention includes a spectroscope configured to output a first measurement result that is a result of measuring characteristics of light from an object to be measured, an optical monitor configured to output a second measurement result that is a result of measuring intensity of light from the object to be measured, and a control circuit configured to correct the first measurement result, based on the second measurement result and output a third measurement result, based on the corrected first measurement result.

The present invention is directed to an assembly for use in detecting an analyte in a sample based on thin-film spectral interference. The assembly includes a light source to emit light signals; a light detector to detect light signals; a coupler to optically couple the light source and the light detector to a waveguide tip; a monolithic substrate having a coupling side and a sensing side; and a lens between the waveguide tip and the monolithic substrate. The lens relays optical signals between the waveguide tip and the monolithic substrate.