G01J3/502

Emitter Module for an LED Illumination Device

An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

AGRICULTURAL CONDITION DETERMINATION
20220146409 · 2022-05-12 ·

Apparatus for determining an agricultural condition in an agricultural environment, the apparatus including one or more processing devices configured to acquire spectral data by measuring sample radiation at least one of reflected from and transmitted through an agricultural sample obtained from the agricultural environment, use the spectral data and at least one computational model to determine an agricultural condition, the computational model embodying relationships between the spectral data and different agricultural conditions and use the agricultural condition to determine an indicator indicative of at least one of: the agricultural condition and an intervention to improve the agricultural condition.

Optical characteristic measurement device
11326953 · 2022-05-10 · ·

An optical characteristic measurement device has a measurement opening, includes a first optical measurement unit and a second optical measurement unit that measure different optical characteristics with different geometries with respect to a measurement target facing the measurement opening, and further includes a processing unit that corrects a measurement value obtained in the second optical measurement unit based on a measurement value obtained in the first optical measurement unit. The first optical measurement unit includes an illumination optical system that illuminates the measurement target facing the measurement opening, a first light receiving optical system that collects light reflected by the measurement target, and a first light receiving unit that receives light collected by the first light receiving optical system and outputs the light as a measurement signal, and has a diffuse reflection surface that diffuses and reflects incident light to the illumination optical system or the first light receiving optical system. The second optical measurement unit includes a light projecting optical system that projects light from a direction inclined by a predetermined angle with respect to a normal line of a measurement surface of the measurement target facing the measurement opening, a second light receiving optical system that collects light reflected by the measurement target in a regular reflection direction, and a second light receiving unit that receives light collected by the second light receiving optical system and outputs the light as a measurement signal.

COMPACT WIDE FIELD IMAGER FOR LASER DETECTION
20230296432 · 2023-09-21 ·

An apparatus for characterization of one or more light sources over a field of view has an image relay disposed to relay a first image plane to a second image plane. An aperture defines the field of view at the first image plane. A diffraction grating in the path of light through the aperture is configured to form, on the first image plane, for at least one light source, a light pattern having at least two diffraction orders of light from the corresponding light source. An image sensor array is configured to provide image data from the light pattern at the second image plane.

Agricultural condition determination
11815449 · 2023-11-14 · ·

Apparatus for determining an agricultural condition in an agricultural environment, the apparatus including one or more processing devices configured to acquire spectral data by measuring sample radiation at least one of reflected from and transmitted through an agricultural sample obtained from the agricultural environment, use the spectral data and at least one computational model to determine an agricultural condition, the computational model embodying relationships between the spectral data and different agricultural conditions and use the agricultural condition to determine an indicator indicative of at least one of: the agricultural condition and an intervention to improve the agricultural condition.

Colorimeter capable of taking a fixed posture with respect to a measurement object

Colorimeter having first and second illumination units disposed symmetrically to a reference line in a prescribed plane, first and second light-receiving parts disposed symmetrically to the reference line in the prescribed plane, a calculation unit for determining color information about a measurement object, and an opposing wall that opposes the measurement object when it is measured. The opposing wall has an abutting part that abuts the measurement object when it is measured. The abutting part has a pair of first abutting parts disposed on two sides of a measurement opening to flank the measurement opening; and a pair of second abutting parts disposed on an orthogonal line orthogonal to a first-abutting-part connection line that connects the pair of first abutting parts to each other, the pair of second abutting parts being disposed on two sides of the first-abutting-part connection line to flank the first-abutting-part connection line.

Spectral characteristic acquisition device, image forming apparatus, and image forming apparatus management system

A spectral characteristic acquisition device according to one aspect of the disclosed technique includes: a color data acquirer comprising a plurality of spectral sensors receiving light reflected from an object irradiated with light and acquiring color data of the object; circuitry configured to estimate a spectral characteristic of the object on a basis of the color data and calibrate the spectral characteristic calculator on a basis of the color data obtained from a calibration color mark having a color mark of a known spectral characteristic; a first conveyer configured to convey the object in a predetermined conveyance direction and conveying the color data acquirer in a direction intersecting the predetermined conveyance direction; and a second conveyer configured to convey the calibration color mark in the predetermined conveyance direction.

SYSTEM AND METHOD FOR CHARACTERIZATION OF PATTERNS MARKED ON A FABRIC

A system and method for characterization of patterns marked on a fabric. The system includes a light source generating a light beam to impinge on a fabric; an optical arrangement including a parabolic mirror with a hole and an optical device, directing said light beam towards the fabric; a wavelength division unit; a light detection unit; and a computing device. The optical device changes and orients the direction of the light beam towards the fabric providing a scan of an area of the fabric, line-by-line, and redirects scattered light towards the light detection unit. The wavelength division unit separates the scattered light into spectral bands or colors and the computing device characterizes a pattern marked on the fabric by executing an algorithm that analyzes electrical voltage signals and that computes a quality measure of said marked pattern.

OPTICAL CHARACTERISTIC MEASUREMENT DEVICE
20210239532 · 2021-08-05 ·

An optical characteristic measurement device has a measurement opening, includes a first optical measurement unit and a second optical measurement unit that measure different optical characteristics with different geometries with respect to a measurement target facing the measurement opening, and further includes a processing unit that corrects a measurement value obtained in the second optical measurement unit based on a measurement value obtained in the first optical measurement unit. The first optical measurement unit includes an illumination optical system that illuminates the measurement target facing the measurement opening, a first light receiving optical system that collects light reflected by the measurement target, and a first light receiving unit that receives light collected by the first light receiving optical system and outputs the light as a measurement signal, and has a diffuse reflection surface that diffuses and reflects incident light to the illumination optical system or the first light receiving optical system. The second optical measurement unit includes a light projecting optical system that projects light from a direction inclined by a predetermined angle with respect to a normal line of a measurement surface of the measurement target facing the measurement opening, a second light receiving optical system that collects light reflected by the measurement target in a regular reflection direction, and a second light receiving unit that receives light collected by the second light receiving optical system and outputs the light as a measurement signal.

Optical wavelength device
11086057 · 2021-08-10 ·

An optical wavelength dispersion device is disclosed, which includes a waveguide unit and an adjustable reflecting unit, wherein the waveguide unit has a first substrate, an input unit, a grating, a reflector and a second substrate. The input unit is formed on the first substrate and having a slit for receiving an optical signal, a grating is formed on the first substrate for producing an output beam once the optical signal is dispersed, the reflector is formed on the first substrate for reflecting the output beam, the second substrate is located on the input unit, the grating and the reflector, and forms a waveguide space with the first substrate; the adjustable reflecting unit is located outside of the waveguide unit, and is used for changing emitting angle and adjusting focus of the output beam.