An apparatus for measuring surface temperature of a substrate being illuminated by a pulsed light beam configured to heat the substrate and by a beam of probing light, wherein the heated substrate emits a radiated beam of thermal radiation, wherein the apparatus includes an optical system configured to collect the radiated beam and a reflected beam of probing light propagating in substantially close directions, wherein the collected radiated beam and the collected reflected beam are separately routed to a respective detector via a respective routing element, the respective detectors being configured to measure the intensity of the collected radiated beam and collected reflected beam simultaneously and at the same wavelength, wherein the surface temperature is calculated based on the collected radiated beam and on the collected reflected beam.

A cold stage actuation system employs an optical assembly having an adapter ring mounted to a flange connected to a cold finger which extends into a dewar. The flange supports a detector array. A resilient cold shield extends from the adapter ring to a lens holder, the lens holder connected to the resilient cold shield distal from the adapter ring. The lens holder supports a lenslet array. An optical light shield extends from the lens holder oppositely from the resilient cold shield to proximate a window in the dewar. A motor is supported within the dewar. An insulating translation arm connects the motor to the optical light shield, whereby operation of the motor induces the insulating translation arm to extend or retract the optical assembly concentric with an optical axis.

Methods and apparatus for monitoring a temperature of an object over time using a thermal imaging camera. The methods and apparatus may gather infrared temperature data from a selected source of temperature data within a scene at a selected time interval and display a graphical plot of the gathered temperature data on a digital display.

An apparatus includes a top surface configured to couple to a variable aperture mechanism (VAM), where the top surface has an opening configured to align with an aperture of the VAM. The apparatus also includes a bottom portion configured to couple to a cooled object and a contact portion configured to couple to a strut, where the top surface, bottom portion, and contact portion form a continuous body. The apparatus further includes a plurality of baffles within the continuous body, where each of the baffles has an opening configured to align with the aperture of the VAM. In addition, the apparatus includes a reinforcement ring comprised in or within the continuous body and disposed to be aligned with the strut when the strut is coupled to the continuous body.

The present invention relates to a method and a system for determining a temperature value of a molten metal bath. The method according to the invention has been proven to be especially suitable for repeated determinations of temperature values; i.e. the method allows for multiple measurements with repeatedly newly generated leading tips of the optical cored wire.

The present invention relates to a method and a system for determining a series of at least two temperature values of a molten metal bath with a device comprising an optical cored wire and a detector. The method according to the invention has been proven to be especially suitable for multiple repeated measurements, wherein the temperature of the molten metal bath changes between the measurements.

The present disclosure relates to an apparatus for simulating a black body spectrum. The apparatus makes use of a broadband light source and a light guide configured to receive light generated by the light source and to generate first and second optical signals. A first signal processing subsystem may be used to enable adjustment of both a signal spectrum and an intensity of the first optical signal. A second signal processing subsystem may be used to enable adjustment of both a signal spectrum and an intensity of the second optical signal. A beam cube may be used to combine the first and second optical signals to produce a final light output signal having a desired signal spectrum and a desired intensity.

An infrared imaging device includes an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged, a diaphragm, and a FPN calculation unit which acquires a first captured image data obtained by capturing an image using the imaging element in a state in which an F-number of the diaphragm is set to a first value and a second captured image data obtained by capturing an image using the imaging element in a state in which the F-number is set to a second value while a motion picture is being captured, and calculates fixed pattern noise included in captured image data obtained by capturing an image using the imaging element based on the acquired first captured image data, the acquired second captured image data, the first value, and the second value.

An electromagnetic wave detection apparatus (10) includes a switch (16), a first detector (19), and a second detector (20). The switch (16) includes an action surface (as) with a plurality of pixels (px) disposed thereon. The switch (16) is configured to switch each pixel (px) between the first state and the second state. In the first state, the pixels (px) cause electromagnetic waves incident on the action surface (as) to travel in a first direction (dl). In the second state, the pixels (px) cause the electromagnetic waves incident on the action surface (as) to travel in a second direction (d2). The first detector (19) detects the electromagnetic waves that travel in the first direction (dl). The second detector (20) detects the electromagnetic waves that travel in the second direction (d2).

A noise data update processing unit calculates the amount of a fixed pattern noise component on the basis of a detection signal of infrared rays detected by an infrared detector in a state where an optical system is controlled to be in a non-focused state, and updates an FPN data storage unit with the calculated amount of the FPN component. The noise data update processing unit calculates an average value of detection signals of each detector element and a plurality of peripheral detector elements, and calculates a signal component dependent on incident infrared rays included in the detection signal of each detector element by subtracting an average value of fixed pattern noise data before update from the calculated average value. The amount of the fixed pattern noise component is calculated by subtracting the calculated signal component from the detection signal of each detector element.