An infrared imaging device includes an imaging element including a plurality of infrared detection pixels, a diaphragm, a temperature detection unit that detects the temperature of the diaphragm, a main memory that stores a first signal value corresponding to infrared rays, which are radiated from the diaphragm and are incident on each of the infrared detection pixels of the imaging element, so as to be associated with the F-number and temperature of the diaphragm, and a system control unit that controls the F-number of the diaphragm, based on the first signal value, captured image data obtained by capturing an image of the object using the imaging element in a state in which the F-number of the diaphragm is set to an arbitrary value, the temperature of the diaphragm detected by the temperature detection unit and the arbitrary value.

An infrared imaging device includes an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged, a diaphragm, and a FPN calculation unit which acquires a first captured image data obtained by capturing an image using the imaging element in a state in which an F-number of the diaphragm is set to a first value and a second captured image data obtained by capturing an image using the imaging element in a state in which the F-number is set to a second value while a motion picture is being captured, and calculates fixed pattern noise included in captured image data obtained by capturing an image using the imaging element based on the acquired first captured image data, the acquired second captured image data, the first value, and the second value.

An imaging apparatus includes an imaging optical system that has a light transmission characteristic of transmitting near-infrared light in a near-infrared light wavelength range including 1550 nm, and an imaging sensor that outputs an imaging signal by imaging the near-infrared light transmitted through the imaging optical system, the imaging sensor has sensitivity to heat radiation from a subject, and the imaging signal includes information regarding a heat radiation image by the heat radiation.

A microbolometer detector with adjustable spectral reactivity includes a reflective element between a suspended pixel body and a base section, a bimetallic arm, one end of which is connected to one end of the reflective element and the other end to the base section via the electrode connection, the temperature of which is increased by passing current, and changes the height of the reflective element by expanding with the increase in temperature.

A reactor system designed to provide accurate monitoring of wafer temperatures during deposition steps. The reactor system includes a pyrometer mounting assembly supporting and positioning three or more pyrometers (e.g., infrared (IR) pyrometers) relative to the reaction chamber to measure a center wafer temperature and an edge wafer temperature as well as reaction chamber temperature. The pyrometer mounting assembly provides a small spot size or temperature sensing area with the edge pyrometer to accurately measure edge wafer temperatures. A jig assembly, and installation method for each tool setup, is provided for use in achieving accurate alignment of the IR pyrometer sensing spot (and the edge pyrometer) relative to the wafer, when the pyrometer mounting assembly is mounted upon a lamp bank in the reactor system or in tool setup. The wafer edge temperature sensing with the reactor system assembled with proper alignment ensures accurate and repeatable measurement of wafer temperatures.

An optical device includes a substrate, a first electrode, a second electrode, and a first lens. The first electrode and the second electrode are over the substrate and configured to generate a first electric field. The first lens is between the first electrode and the second electrode and has a focal length that varies in response to the first electric field applied to the first lens.

An apparatus for correcting a temperature of an object using a shutter may comprise a temperature measurement module for measuring the temperature of the object and a temperature of the shutter, a noise temperature calculation module for calculating the temperature due to noise using the measured temperature of the shutter, and a temperature correction module for correcting the temperature of the object by subtracting the calculated temperature due to noise from the measured temperature of the object.

The present invention relates to a method and a system for determining a temperature value of a molten metal bath. The method according to the invention has been proven to be especially suitable for repeated determinations of temperature values; i.e. the method allows for multiple measurements with repeatedly newly generated leading tips of the optical cored wire.

An optical accessory for training a flame detector is disclosed. The optical accessory comprises a body defining a first opening and a second opening, the first opening and the second opening being positioned at opposite ends of body. Further, a plurality of reflector plates positioned within and moveably coupled to the body, each reflector plate being configured to move from a first orientation to a second orientation relative to the body. When each reflector plate is positioned in the first orientation, the plurality of reflector plates are configured to receive infrared waves from the first opening of the body and reflect the infrared waves towards the second opening of the body. And when each reflector plate is positioned in the second orientation, the plurality of reflector plates are configured to allow infrared waves to travel along a linear path from the first opening to the second opening of the body.

An optical device includes a substrate, a first electrode, a second electrode, and a first lens. The first electrode and the second electrode are over the substrate and configured to generate a first electric field. The first lens is between the first electrode and the second electrode and has a focal length that varies in response to the first electric field applied to the first lens.