A bidirectional reflectance distribution function (BRDF) measurement system and method, an electronic device, and a storage medium. The BRDF measurement system includes: a blackbody, a spectroradiometer and a controller; where in case that the blackbody is heated to a target temperature, it undergoes a solid-liquid phase change; the spectroradiometer is used to measure the blackbody and transmit a first measurement signal to the controller, and in case that the blackbody irradiates a to-be-measured point on a sample surface, the spectroradiometer is further used to measure radiation from the to-be-measured point, and transmit a second measurement signal to the controller; and the controller is used to obtain a BRDF of the to-be-measured point based on the first measurement signal, the second measurement signal, the target geometric relationship, a target mapping relationship and a dimension parameter of the blackbody.

The present application discloses a measurement device and a measurement method for measuring a temperature and an emissivity of a measured surface. The measurement device comprises a reflection converter, an optical receiver and a data processor, wherein the reflection converter comprises a reflector and an absorber tube, the reflector has a through hole, and the absorber tube may be shifted between a first measurement position and a second measurement position relative to the reflector. In the first measurement position, the light incident end of the absorber tube approaches or contacts the measured surface, such that the optical receiver receives inherent radiation light emitted from the measured surface and forms a first electrical signal. In the second measurement position, the light incident end of the absorber tube is located at the through hole or outside the through hole of the reflector, such that the optical receiver receives the inherent radiation light emitted from the measured surface and reflective radiation light between a reflection surface of the reflector and the measured surface and forms a second electrical signal. The data processor is configured to determine a temperature and an emissivity of the measured surface according to the first electrical signal and the second electrical signal.

The present disclosure is directed to a fiber optic bolometer device. In an implementation, a fiber optic bolometer device includes an optical fiber and a silicon layer that comprises a Fabry-Prot interferometer. The silicon layer includes a first surface and a second surface. The fiber optic bolometer device includes a reflective dielectric film disposed over the first surface of the silicon layer where the reflective dielectric film is adjacent to an end face of the optical fiber. The fiber optic bolometer device also includes an absorptive coating disposed over the second surface of the silicon layer (e.g., the surface distal to the end face of the optical fiber).

A cavity blackbody radiation source is provide. A cavity blackbody radiation source comprises a blackbody radiation cavity and a carbon nanotube layer. The blackbody radiation cavity comprises an inner surface. The carbon nanotube layer is located on the inner surface. The carbon nanotube carbon nanotube layer comprises a plurality of carbon nanotubes and a plurality of microporous. A method of making the cavity blackbody radiation source is also provide.

A cavity black body radiation source is provided. The cavity black body radiation source comprises a blackbody radiation cavity, a black lacquer, and a carbon nanotube layer. The blackbody radiation cavity comprises an inner surface. The black lacquer is located on the inner surface. The carbon nanotube layer is located on a surface of the black lacquer away from the blackbody radiation cavity. The carbon nanotube layer comprises a plurality of carbon nanotubes and a plurality of microporous. A method of making the cavity blackbody radiation source is also provided.

A method for determining the temperature of a strand comprises disposing the strand along a background radiator of known temperature. Receiving the strand using a spatially resolving thermal imaging sensor in front of the background radiator while the strand is being disposed along its longitudinal axis. Forming an integral across a measuring value area, the integral configured to detect a complete strand portion located in front of the background radiator of the thermal imaging sensor. deducing the temperature of the strand by comparing the formed integral with a reference value.

A near-field probe (and associated method) compatible with near-infrared electromagnetic radiation and high temperature applications above 300? C. (or 500? C. in some applications) includes an optical waveguide and a photonic thermal emitting structure comprising a near-field thermally emissive material coupled to or part of the optical waveguide. The photonic thermal emitting structure is structured and configured to emit near-field energy responsive to at least one environmental parameter of interest, and the near-field probe is structured and configured to enable extraction of the near-field energy to a far-field by coupling the near-field energy into one or more guided modes of the optical waveguide.

A method of thermographic inspection includes absorbing, at an applique applied to a test area of an article, light from a testing light source. The method further includes emitting, by the applique, thermal radiation directed to a capture device, the thermal radiation corresponding to at least a portion of the light absorbed by the applique.

A method and apparatus for non-contact infrared measurement of surface temperature. A method includes providing an infrared temperature measurement system, and increasing an emissivity of an interface between a metal and an infrared transparent window across which shear stresses are transmitted.

A sensor comprises a substrate having a first surface; a cap structure connected to the substrate, the cap structure configured to define a cavity between an inner surface of the cap structure and the first surface of the substrate, the cap structure configured to block infrared radiation from entering the cavity from outside the cap structure; a plurality of absorbers, each absorber in the plurality of absorbers being connected to the first surface of the substrate and arranged at a respective position within the cavity and configured to absorb infrared radiation at the respective position within the cavity; and a plurality of readout circuits, each readout circuit in the plurality of readout circuits being connected to a respective absorber in the plurality of absorbers and configured to provide a measurement signal that indicates an amount of infrared radiation absorbed by the respective absorber.