A leak detection system includes a testing interface, which includes a rotation holder configured to retain and rotate a package. The testing interface includes a plunger apparatus configured to actuate a plunger to apply a pressure to the package before and/or during the package being inspected using a high voltage leak detection (HVLD) apparatus. The testing interface also includes a controller configured to operate and coordinate the operation of the testing interface with operation of the HVLD apparatus.

A system for inspecting flexible pipelines comprises a data analyzer, a data collector and an ultrasonic transducer. Further, the ultrasonic transducer is adapted to propagate shear wave into the annulus of the flexible pipeline. The data collector further comprises a data store and a communicator. Further, the system is capable of differentiating flooding and non-flooding condition of the annulus of the flexible pipeline which is subjected to high pressure. Using the system, an indicator of a flooded or non-flooded condition within the flexible pipeline may be calculated using transmitted and detected reflective waves or the lack of detected reflective waves.

A system for inspecting flexible pipelines comprises a data analyzer, a data collector and an ultrasonic transducer. Further, the ultrasonic transducer is adapted to propagate shear wave into the annulus of the flexible pipeline. The data collector further comprises a data store and a communicator. Further, the system is capable of differentiating flooding and non-flooding condition of the annulus of the flexible pipeline which is subjected to high pressure. Using the system, an indicator of a flooded or non-flooded condition within the flexible pipeline may be calculated using transmitted and detected reflective waves or the lack of detected reflective waves.

A gas concentration measurement device comprises: a transmission circuit and a transmission oscillator for transmitting first ultrasonic waves in a concentration measurement space and transmitting second ultrasonic waves, which continue temporally from the first ultrasonic waves in the concentration measurement space; a reception oscillator and a reception circuit for receiving the ultrasonic waves that have propagated through the concentration measurement space; and a propagation time measurement unit for determining, on the basis of the times at which the first ultrasonic waves and the second ultrasonic waves were transmitted and the times at which the first ultrasonic waves and the second ultrasonic waves were received, the time in which ultrasonic waves propagate through the concentration measurement space. The second ultrasonic waves have an opposite phase with respect to that of the first ultrasonic waves, and the amplitude of the second ultrasonic waves is greater than that of the first ultrasonic waves.

A gas concentration measurement device comprises: a transmission circuit and a transmission oscillator for transmitting first ultrasonic waves in a concentration measurement space and transmitting second ultrasonic waves, which continue temporally from the first ultrasonic waves in the concentration measurement space; a reception oscillator and a reception circuit for receiving the ultrasonic waves that have propagated through the concentration measurement space; and a propagation time measurement unit for determining, on the basis of the times at which the first ultrasonic waves and the second ultrasonic waves were transmitted and the times at which the first ultrasonic waves and the second ultrasonic waves were received, the time in which ultrasonic waves propagate through the concentration measurement space. The second ultrasonic waves have an opposite phase with respect to that of the first ultrasonic waves, and the amplitude of the second ultrasonic waves is greater than that of the first ultrasonic waves.

A test method for a semiconductor device having a package with airtight space, which is formed between a substrate wafer on which an element is formed and a cap wafer which is provided being opposite to the substrate wafer, comprises an applying water process in which the semiconductor device is exposed to high moisture atmosphere and cooled and a leak discrimination process in which power is supplied to the element which is formed on the substrate wafer and leak of the package is discriminated by detecting a sound wave which is generated by the semiconductor device.

A test method for a semiconductor device having a package with airtight space, which is formed between a substrate wafer on which an element is formed and a cap wafer which is provided being opposite to the substrate wafer, comprises an applying water process in which the semiconductor device is exposed to high moisture atmosphere and cooled and a leak discrimination process in which power is supplied to the element which is formed on the substrate wafer and leak of the package is discriminated by detecting a sound wave which is generated by the semiconductor device.

Systems and methods for predicting, detecting, and/or mitigating a pipe freeze are provided. A system for analyzing water in a plumbing system includes a sensor that is configured to measure pressure within a pipe in the plumbing system as a function of time, and a processor that is configured to determine a state of water within the pipe by analyzing the pressure within the pipe as a function of time. The state of the water includes a prediction that the water within the pipe will freeze and/or a determination that the water within the pipe has frozen. The sensor is arranged at a first location within the plumbing system that is remote from a second location within the plumbing system that corresponds to the state of the water.

Disclosed herein are components, systems, and methods to monitor acoustic emissions of a high pressure system to predict failure of the high pressure system. Further disclosed herein are components, systems, and methods to monitor acoustic emissions of a high pressure system to identify characteristics of one or more defects as they form and grow within components of the high pressure system. Characteristics of the defects include type, size, growth, and location.

Disclosed herein are components, systems, and methods to monitor acoustic emissions of a high pressure system to predict failure of the high pressure system. Further disclosed herein are components, systems, and methods to monitor acoustic emissions of a high pressure system to identify characteristics of one or more defects as they form and grow within components of the high pressure system. Characteristics of the defects include type, size, growth, and location.