This application provides a method for box leak detection and a leak detection system, and relates to the field of leak detection technologies. The method for box leak detection may include: filling a box under test with a tracer gas, where the box under test has a plurality of positions under test; and measuring a leak rate at each position under test. Leak detection may be performed on each position under test of the box under test. In this way, not only a specific leak position can be determined, so that leak-proof treatment may be subsequently performed on the leak position in a targeted manner, but also the leak rate at each position under test can be measured, providing a basis for a level of to-be-taken leak-proof measures and whether to take leak-proof measures, thereby improving accuracy of box leak detection.

This application provides a method for box leak detection and a leak detection system, and relates to the field of leak detection technologies. The method for box leak detection may include: filling a box under test with a tracer gas, where the box under test has a plurality of positions under test; and measuring a leak rate at each position under test. Leak detection may be performed on each position under test of the box under test. In this way, not only a specific leak position can be determined, so that leak-proof treatment may be subsequently performed on the leak position in a targeted manner, but also the leak rate at each position under test can be measured, providing a basis for a level of to-be-taken leak-proof measures and whether to take leak-proof measures, thereby improving accuracy of box leak detection.

A boss structure sealing experiment device for an IV type hydrogen storage cylinder. The device includes a high-pressure chamber, a sealing leakage structure, a cylinder mouth valve, and a low-pressure chamber, where the high-pressure chamber, the sealing leakage structure, and the low-pressure chamber are tightly connected to one another through flange bolts, and the cylinder mouth valve is tightly connected to the high-pressure chamber through threads. Further disclosed is a sealing experiment system. The system includes a boss structure sealing experiment device, a high-pressure gas supply device, and a leaked gas detection device. The high-pressure gas supply device consists of a hydrogen source, a compressor, a buffer tank, a valve, and a pressure gauge; and the leaked gas detection device consists of a gas mixing chamber, a carrier gas, and a gas leakage detector. Further disclosed is a test method for a boss structure sealing experiment.

Methods, apparatus, systems and articles of manufacture are disclosed for leak detection from a thief hatch. An example thief hatch includes a vent control stem coupled to first and second sealing plates, the first and second sealing plates to control fluid flow through the thief hatch based on translation of the vent control stem, and an indicator extending from the vent control stem to provide a visual indication of a condition of the fluid flow.

A method for in-line leak testing of blow moulded containers wherein a conveyor line is fed with a continuous stream of blow moulded containers from a blow moulding machine, at least one measuring head is temporarily connected to a first blow moulded container. The measuring head is moved in order to follow the movement of said first blow moulded container which is pressurized by a source of pressurized gas, the source of pressurized gas is disconnected, said at least one measuring head is used to measure the pressure decay therein. The pressure decay is compared with stored data for the pressure decay of acceptable containers and an accept or non-accept signal is generated which implies proceeding or disposal of said first blow moulded container. The measuring head is moved against the moving direction of the conveyor line to a subsequent blow moulded container, and the process is repeated.

A leak detection device operable to measure fluid leaks in an element to be tested that is positioned in a first enclosure. In one example, a measuring module is positioned in a second enclosure and connected to the first enclosure and the element to be tested by an aeraulic connection. At least one of the first enclosure and the measuring module are thermally insulated using an insulating material.

A battery case leak testing device includes a housing having a testing port. A pump is in fluid communication with the testing port and is configured to generate a prescribed pressure at the testing port. A pressure sensor is in fluid communication with the testing port to measure fluid pressure at the testing port. A controller is in operative communication with the pump and the pressure sensor, and is configured to facilitate operation of the pump in a first mode and a second mode. In the first mode, the pump operates to generate a first prescribed pressure at the testing port. In the second mode, the pump operates to generate a second prescribed pressure at the testing port. The controller transitions the pump from the first mode to the second mode when the pressure sensor measures a prescribed pressure characteristic when the pump is operating in the first mode.

Techniques for measuring vacuum pressure using a memristor element are described. A vacuum sensor can include a memristor element having a semiconductor substrate, a memristive material layer, and a conductive electrode. The off-state resistance of the memristor element can be sensitive to changes in ambient pressure at the element. The off-state resistance of the memristor element may also exhibit a well-defined increase at pressures below a threshold pressure. Measurement of the off-state resistance may be obtained with low power consumption and without changing the resistance or switching the state of the memristor element. The measurements may be used to both determine a leak rate of the ambient pressure within the volume of interest and determine if the sensor is exposed to vacuum pressure below the threshold pressure.

According to one aspect of the technique, there is provided a method of manufacturing a semiconductor device, including checking a leak from a process furnace before a substrate is processed. The checking includes: (a) measuring, by a partial pressure sensor provided at an exhaust pipe, an oxygen partial pressure value of a residual oxygen after the process furnace is vacuum-exhausted; (b) comparing the oxygen partial pressure value measured by the partial pressure sensor with a threshold value; and (c) when the oxygen partial pressure value is higher than the threshold value in (b), performing at least one among: purging the process furnace and evacuating the process furnace.

According to one aspect of the technique, there is provided a method of manufacturing a semiconductor device, including checking a leak from a process furnace before a substrate is processed. The checking includes: (a) measuring, by a partial pressure sensor provided at an exhaust pipe, an oxygen partial pressure value of a residual oxygen after the process furnace is vacuum-exhausted; (b) comparing the oxygen partial pressure value measured by the partial pressure sensor with a threshold value; and (c) when the oxygen partial pressure value is higher than the threshold value in (b), performing at least one among: purging the process furnace and evacuating the process furnace.