Patent classifications
G01M11/025
DEVICE AND METHOD FOR MEASURING A SEMIFINISHED PRISM
A method for measuring a semifinished prism in which a first test beam path is produced, by which a first test image is imaged to infinity, and in which the first test beam path is guided as an incident beam path onto a first non-polished surface of the prism. A beam path reflected from the first non-polished surface is captured by a telescope, wherein the first test image is imaged onto a detector in the telescope. The incident beam path forms an obtuse angle with the reflected beam path. A second test beam path reflected from a second surface of the prism is captured by a telescope, wherein a second test image, which is imaged to infinity by the second test beam path, is imaged onto a detector by the telescope. The angle between the first surface and the second surface is determined on the basis of the difference between an orientation of the first surface, derived from the first test image, and an orientation of the second surface, derived from the second test image. The invention also relates to an associated measuring device.
Method and device for calibrating a diffractive measuring structure
The disclosed method involves: recording, under illumination of a diffractive measurement structure via an illumination device, a plurality of diffraction images which differ from one another in terms of the region of the measurement structure that contributes to the respective diffraction image, and ascertaining transmission properties and/or reflection properties of the diffractive measurement structure based on the plurality of diffraction images, wherein the steps of recording a plurality of diffraction images and of ascertaining transmission properties and/or reflection properties of the diffractive measurement structure in a plurality of recording sequences are carried out repeatedly in a plurality of recording sequences, wherein these recording sequences differ from one another with respect to the illumination angles that are respectively set during the illumination of the diffractive measurement structure and at which the diffractive measurement structure is illuminated.
SYSTEMS AND METHODS FOR NON-DESTRUCTIVE EVALUATION OF OPTICAL MATERIAL PROPERTIES AND SURFACES
System and methods are provided for characterizing an internal surface of a lens using interferometry measurements. Sphere-fitting a distorted radius determines distorted pathlengths. Ray-tracing simulates refraction at all upstream surfaces to determine a cumulative path length. A residual pathlength is scaled by the group-index and rays are propagated based on the phase-index. After aspheric surface fitting, a corrected radius is determined. To estimate a glass type for the lens, a thickness between focal planes of the lens surfaces is determined using RCM measurements. Then, for both surfaces, the surface is positioned into focus, interferometer path length matching is performed, a reference arm is translated to stationary phase point positions for three wavelengths to determine three per-color optical thicknesses, and ray-tracing is performed. A glass type is identified by minimizing an error function based on optical parameters of the lens and parameters determined from known glass types from a database.
Analysis Device and Analysis Method
An analysis apparatus includes a setting device configured to set information on a structure of an optical connection structure, a solution device configured to solve a partial differential equation having, as an unknown, an electromagnetic field distributed in the optical connection structure based on the information on the structure of the optical connection structure to determine a distribution of the electromagnetic field, a data extraction device configured to extract, from the distribution of the electromagnetic field determined by the solution device, a mode distribution in a plane at a predetermined position of the optical connection structure and a time response of an electromagnetic field at a predetermined position of the optical connection structure, and a characteristics analysis device configured to analyze optical characteristics of the optical connection structure based on the mode distribution and the time response of the electromagnetic field extracted by the data extraction device.
BLOCKER HAVING LIGHT TRANSMISSION AND REFLECTION DEVICE
The blocker described comprises: a lens illumination light source; a light transmission and reflection device to reflect/transmit the light; an image sensor to detect light reflected by the light transmission and reflection device and thereby obtain an lens image; a lens meter to detect the light that has passed through the light transmission and reflection device to thereby measure lens characteristics; and a blocking member to attach a leap block to the lens. The light transmission and reflection device comprises: a first reflection plate having a central hole; a first rotating cylinder to be coupled to and to rotate the first reflection plate; a second rotating cylinder located inside and to rotate the first rotating cylinder; a second reflection plate, adjusted by the second rotating cylinder and configured to open or block the central hole in the first reflection plate; and driving means configured to drive the second rotating cylinder.
APPARATUS, MEASUREMENT SYSTEM AND METHOD FOR CAPTURING AN AT LEAST PARTIALLY REFLECTIVE SURFACE USING TWO REFLECTION PATTERNS
An apparatus for capturing at least partially reflective surfaces includes a detection surface assembly, an illumination device configured to emit an illumination pattern toward the at least partially reflective surface so as so project, by reflection via the at least partially reflective surface, a first reflection pattern and a second reflection pattern onto the detection surface assembly. The apparatus includes a capturing unit configured to capture the first reflection pattern and the second reflection pattern from the detection surface assembly.
STITCHING-MEASUREMENT DEVICE AND STITCHING-MEASUREMENT METHOD
Disclosed is a stitching-measurement device adapted for performing stitching-measurement on a surface of a concave spherical lens, including: an interferometer, a reference lens, a first plane mirror, a second plane mirror, a first adjustment mechanism, a second adjustment mechanism, a concave spherical object to be measured, a motion table and a control mechanism, the first plane mirror being mounted on the first adjustment mechanism configured to change a position of the first plane mirror; the second plane mirror being mounted on the second adjustment mechanism configured to change a position of the second plane mirror; the concave spherical object to be measured being placed on the motion table configured to change a position of the concave spherical object to be measured; the control mechanism communicating with the interferometer, the first adjustment mechanism, the second adjustment mechanism, and the motion table for issuing control signals, wherein by the first adjustment mechanism and the second adjustment mechanism, an included angle between the first plane mirror and the second plane mirror is adjusted in such a way that light beam incident on the concave spherical object to be measured is inclined by a first angle relative to light beam emitted from the reference lens, thereby avoiding an operation of inclining the concave spherical object to be measured during the stitching-measurement.
Apparatus and method for measuring at least one optically effective object
A device and method are described having/using at least a first radiation source and a second source of radiation, at least one measurement or detection device as well as at least one evaluation system with the first radiation source and second radiation source either oriented towards a top or bottom side of the optically effective object, or together oriented towards the top or bottom of the optically effective object, whereby at least the first radiation source emits reflective radiation towards the optically effective object and/or excitation radiation emitted for the stimulation of luminescence radiation in the material of the optically effective object and/or in the coating material of the optically effective object, and whereby the second radiation source at least emits radiation that penetrates through the optically effective object.
METHODS AND APPARATUS TO DETERMINE A TWIST PARAMETER AND/OR A BEND ANGLE ASSOCIATED WITH A MULTI-CORE FIBER
A multi-core fiber includes multiple optical cores, and for each different core of a set of different cores of the multiple optical cores, a total change in optical length is detected. The total change in optical length represents an accumulation of all changes in optical length for multiple segments of that different core up to a point on the multi-core fiber. A difference is determined between the total changes in optical length for cores of the set of different cores. A twist parameter and/or a bend angle associated with the multi-core fiber at the point on the multi-core fiber is/are determined based on the difference.
DEVICE AND METHOD FOR MEASURING A SURFACE TOPOGRAPHY, AND CALIBRATION METHOD
A method and a device for measuring the topography and/or the gradients and/or the curvature of an optically active surface of an object are disclosed. The device allows the object to be arranged in a receiving region with a contact surface for contact with the object. Inside the device, there is a plurality of point light sources that provide light that is reflected at the surface to be measured of an object arranged in the receiving region. The device includes at least one camera with an objective assembly and an image sensor for detecting a brightness distribution which is produced on a light sensor by the light of the point light sources reflected at the surface to be measured.