A method for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit is disclosed. The method comprises the following steps: At least a predefined portion of the optical projection unit is illuminated so that an image is generated by at least two channels of the predefined portion of the multi-channel optical projection unit. At least one characteristic quantity is determined based on the analysis of the image, wherein a value of the characteristic quantity is associated with a characteristic feature of the projection unit, a defect of the projection unit and/or a defect class of the projection unit. The quality of the projection unit is assessed based on the at least one characteristic quantity. Moreover, a test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit and a computer program are disclosed.

A method for quality control of sealed contact lens packages may comprise disposing a package of a sealed contact lens in a light box, causing the package to be illuminated in the light box by a light source, capturing image data of the illuminated package in the light box, analyzing, based on one or more quality control models, the image data of the illuminated package in the light box, and causing, based on the analyzing, output of a quality control metric indicative of at least an accept or reject condition of the package.

Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.

A method (6) for inspecting an ophthalmic lens (2), in particular a contact lens such as a soft contact lens (2), in an automated lens manufacturing process is disclosed. The method comprises the steps of acquiring (60) a plurality of images containing the ophthalmic lens (2) to be inspected as an imaged ophthalmic lens (2), wherein each image (4) of the plurality of images is of a different image type, registering (63) the plurality of images by applying a registration function to each image (4) of the plurality of images to obtain registered images, determining (64), based on the registered images, whether the ophthalmic lens (2) complies with predetermined specifications, and updating (62) the registration function to compensate for possible changes in the acquisition of the plurality of images. Updating (62) the registration function is performed during the automated lens manufacturing process.

An extreme ultraviolet (EUV) collector inspection apparatus and method capable of precisely inspecting a contamination state of an EUV collector and EUV reflectance in accordance with the contamination state are provided. The EUV collector inspection apparatus includes a light source arranged in front of an EUV collector to be inspected and configured to output light in a visible light (VIS) band from UV rays, an optical device configured to output narrowband light from the light, and a camera configured to perform imaging from an UV band to a VIS band. An image by wavelength of the EUV collector is obtained by using the optical device and the camera and a contamination state of the EUV collector is inspected.

A quantitative, high-sensitivity examination of defects in a transparent product is realized, using a low-cost and space-saving optical dimension measuring apparatus to carry out measurement in a non-contact manner to avoid damaging the object of inspection and to avoid sensory examination. A transparent body to be examined is disposed between a light emitting unit and a light-receiving unit arranged opposite each other. A change in an optical path caused by a defect in the transparent body is detected based on a change in a light ray emitted from the light emitting unit and being incident on the light-receiving unit after passing through the transparent body and a light-blocking object disposed between the transparent body and the light-receiving unit.

A defects evaluation system and method are provided in the present invention. Based on the principle of the microscopic scattering dark-field imaging, the present invention implements a sub-aperture scanning for the surface of spherical optical components and then obtains surface defects information with image processing. Firstly, the present invention takes full advantage of the characteristic that the surface defects of spherical optical components can generate scattering light when an annular illumination beam irradiates on the surface, to implement the sub-aperture scanning and imaging that covers the entire spherical surface. Then, a series of procedures such as the global correction of sub-apertures, the 3D stitching, the 2D projection and the digital feature extraction are taken to inspect spherical surface defects. Finally, actual size and position information of defects are evaluated quantitatively with the defects calibration data. The present invention achieves the automatic quantitative evaluation for surface defects of spherical optical components, which considerably enhance the efficiency and precision of the inspection, avoiding the influence of subjectivity on the results. Eventually, reliable numerical basis for the use and process of spherical optical components is provided.

A method for detecting lens cleanliness of a lens in a flat-field optical path, the flat-field optical path includes a light source, the lens, a camera, the light source is a narrow-band multispectral uniform surface light source, the camera's light-sensitive surface is disposed perpendicular to an optical axis of the lens and in the light position of the lens, the method including disposing the camera such that the camera's light-sensitive surface is located a distance from the focal plane of the lens and measuring the bright-field image data and the dark-field image data; for each pixel, performing an out-of-focus differential flat field correction to yield a plurality of DiDj out-of-focus differentials; repeating the disposing and performing steps by altering the distance at least two more times; and displaying the out-of-focus differentials in the form of a plurality of images to show uniformity of each of the plurality of images.

An optical encoder of the present invention includes a light-receiving element unit 5, moving slit 2 and fixed slit 3. The light-receiving element unit 5 includes a pattern 5B for detecting infiltration of liquid.

A blocked lens assembly suitable for on-block processing and cleaning includes a blocked lens and a sealing member disposed on at least a portion of an edge and/or surface defined by the blocked lens. The blocked lens further includes a lens blank having a front surface and a back surface, a lens blocking piece to hold the lens blank while processing the back surface of the lens blank, and an adhesive layer, disposed between the front surface of the lens blank and the lens blocking piece, to affix the lens blank to the lens blocking piece. The sealing member protects the blocked lens so as to facilitate cleaning of the blocked lens while the lens blocking piece is affixed to the front surface of the lens blank