A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.

The disclosed technology includes, among others, methods and devices for measuring distributed fiber bend or stress related characteristics along an optical path of fiber under test (FUT) uses both a light input unit and a light output unit connected to the FUT at one single end.

An optical sensor includes an optical fiber inscribed with a repeated refraction pattern such that light scattered from a location on the optical fiber is scattered at multiple frequencies in a range of frequencies. The inscribed patterns overlap at every measurement point along at least a portion of the length of the sensor. An optical sensing system including control circuitry coupled to the optical fiber detects measurement scatter data from the optical fiber over the range of frequencies, determines a change in the detected measurement scatter data over the range of frequencies, and extracts a parameter describing a state of the optical fiber from the determined change in the detected measurement scatter data. The sensor may be made by inscribing a first light refracting pattern on the optical fiber at every measurement point along at least a portion of the length of the sensor and inscribing a second light refracting pattern on the optical fiber that overlaps the first inscribed light refracting pattern at every measurement point along at least that portion of the length of the sensor.

A system and method are used for an optical fiber having a core multiple, closely spaced optical gratings written along the core that create a repeated pattern in the core. A memory stores predetermined reference reflection data and measurement reflection data determined for a length of the core detected from interferometric patterns corresponding to scatter reflections received from the core. Data processing circuitry reduces or removes from the measurement reflection data information that corresponds to reflections due to the repeated pattern in the core to produce filtered measurement data. One or more portions of the filtered measurement data is/are correlated with one or more portions of the reference reflection data to produce multiple correlation values. The greatest of the multiple correlation values is determined, and a location along the fiber corresponding to the greatest correlation value is identified.

Systems and methods for alignment and testing of a photonic device include a light source, an interferometer, a detector, and a processing circuit. The processing circuit may generate control signal(s) for the light source to project a beam through the interferometer to a device under testing (DUT). The interferometer may receive an interference beam from an optical fiber of the DUT. The processing circuit may align optical fiber(s) for the DUT, determine one or more characteristics for the DUT, and so forth based on the interference beam and a reference beam generated by the interferometer.

Interferometric measurement signals are detected by a single optical interferometric interrogator for a length of a sensing light guide and an interferometric measurement data set corresponding to the interferometric measurement signals is generated. The interferometric measurement data set is transformed into a spectral domain to produce a transformed interferometric measurement data set. The transformed interferometric measurement data set is compared to a baseline interferometric data set to identify a time-varying signal corresponding to a time-varying disturbance. The baseline interferometric data set is representative of the sensing light guide not being subjected to the time-varying disturbance. A compensating signal is determined from the time-varying signal and used to compensate at least a portion of the interferometric measurement data set for the time-varying disturbance as part of producing a measurement of the parameter.

Local birefringence is determined from a scatter signature of a birefringent waveguide. Four copies of a Rayleigh scatter time delay domain signature of the fiber are collected from two orthogonal polarization received states and from two orthogonal polarization launched states to form a Jones transfer matrix. Obtaining the Jones transfer matrix for the waveguide eliminates the need to align the instrument polarization launch state to the birefringence axes. Birefringence is determined from an autocorrelation of a polarization state averaged function calculated from the transfer matrix terms. Alternatively, the transfer matrix is rotated until fast and slow eigenvectors are separated, fast and slow amplitude functions are generated, and a cross-correlation is performed on the fast and slow amplitude functions in order to determine the birefringence. Because the shift is determined at a high signal-to-noise level with improved sensitivity to the spectral shift, the local birefringence is determined more accurately.

A system and method for performing an in-service optical time domain reflectometry test, an in-service insertion loss test, and an in-service optical frequency domain reflectometry test using a same wavelength as the network communications for point-to-point or point-to-multipoint optical fiber networks while maintaining continuity of network communications are disclosed.

The purpose of the present invention is to provide a device for optical frequency domain reflectometry and a method thereof that can measure a reflectance distribution with less spatial resolution degradation due to a phase noise, without using a wideband receiving system even when a long-distance measurement is performed. The device for optical frequency domain reflectometry according to the present invention is provided with a delay optical fiber for delaying a local light by a prescribed time, and obtains information on a relative delay of a backscattered light from an optical fiber under measurement with respect to the local light and information on the positivity and the negativity of a beat frequency by measuring an in-phase component and a quadrature component of a beat signal obtained by multiplexing the backscattered light from the optical fiber under measurement and the local light delayed by the delay optical fiber, so as to obtain a reflectance distribution in a longitudinal direction of the optical fiber under measurement based on these pieces of information.

An optical fiber characteristics measuring apparatus includes: a light source that outputs frequency-modulated continuous wave of light; a first optical branching unit that branches the continuous light into pump light and reference light; a second optical branching unit that outputs backscattered light generated by making the pump light incident from one end of an optical fiber to be measured, wherein the backscattered light is Brillouin scattering in the optical fiber; a detector that detects interference light of the backscattered light and the reference light; a measuring unit that measures characteristics of the optical fiber by using a detection signal output from the detector; and a controller that controls the light source to change modulation frequency of the continuous light in units of one period or half a period of a modulation period corresponding to the modulation frequency.