G01N15/1425

SAMPLE IMAGE ANALYZER, SAMPLE IMAGE ANALYZING METHOD, AND CONTROL METHOD FOR OBJECT STAGE OF SAMPLE IMAGE ANALYZER
20220408025 · 2022-12-22 ·

Provided are a sample image analyzer and a corresponding method. The sample image analyzer includes: an object stage for supporting a sample carrier; an imaging device for capturing an image of an object in a sample on the sample carrier; a driving device for driving the object stage and the imaging device to move relative to each other; and a control device configured to control the driving device to deliver the sample carrier to a position below the imaging device, control the driving device to drive the object stage and the imaging device to move horizontally relative to each other, and to move vertically relative to each other, control the imaging device to capture, at least during the relative vertical movement, images of the object at different horizontal positions and at different vertical positions, and fuse the images of the object to obtain a target image of the object.

Particle sorting module with alignment window, systems and methods of use thereof

Aspects of the present disclosure include a particle sorting module having an opening that is configured for visualizing droplets of a deflected flow stream. Particle sorting modules according to certain embodiments include a housing having a proximal end, a distal end and a wall therebetween having an opening positioned in the wall that is configured for aligning the flow stream with one or more sample containers at the distal end. Systems and methods for aligning a flow stream with one or more sample containers and sorting particles of a sample (e.g., a biological sample) are also provided. Kits having one or more of the particle sorting modules suitable for coupling with a particle sorting system and for practicing the subject methods are also described.

SYSTEM AND METHOD FOR CHARACTERIZING LIQUID METAL DROPS JETTED FROM A 3D PRINTER USING A STROBE LIGHT

A method includes illuminating a drop with a pulse of light from a light source. A duration of the pulse of light is from about 0.0001 seconds to about 0.1 seconds. The method also includes capturing an image, video, or both of the drop. The method also includes detecting the drop in the image, the video, or both. The method also includes characterizing the drop after the drop is detected. Characterizing the drop includes determining a size of the drop, a location of the drop, or both in the image, the video, or both.

System and method for characterizing particulates in a fluid sample

A system for characterizing at least one particle from a fluid sample is disclosed. The system includes a filter disposed upstream of an outlet, and a luminaire configured to illuminate the at least one particle at an oblique angle. An imaging device is configured to capture and process images of the illuminated at least one particle as it rests on the filter for characterizing the at least one particle. A system for characterizing at least one particle using bright field illumination is also disclosed. A method for characterizing particulates in a fluid sample using at least one of oblique angle and bright field illumination is also disclosed.

Parallel single cell lens free optical dielectrophoresis cytometer

A dual light source lens-free dielectrophoresis (DEP) flow cytometer for massively parallel single cell analysis. Each cells dielectric is inferred from measuring their altitude and subsequently velocity change due to DEP actuation in a microfluidic channel. Dual LED sources facilitate velocity measurement by producing two shadows for each cell passing through the channel. These shadows are detected using a linear optical array detector. Massively parallel analysis is possible as each pixel of the detector can independently analyze the passing cells. The DEP cytometer is composed of simple modular components and has the potential to be scaled to achieve a significantly high throughput label-free single-cell analyzer.

Methods for modulating an intensity profile of a laser beam and systems for same

Aspects of the present disclosure include methods for modulating an intensity profile of a laser beam. Methods according to certain embodiments include irradiating an acousto-optic device with a laser to generate an output laser beam having a plurality of angularly deflected laser beams, capturing an image of the output laser beam, determining an intensity profile of the output laser beam along a horizontal axis from the captured image and adjusting one or more parameters of a waveform inputted into the acousto-optic device in response to the determined intensity profile to generate an output laser beam having a modulated intensity profile. Systems having a laser, an acousto-optic device, an imaging sensor and a waveform generator as well as non-transitory computer readable storage medium with instructions for practicing the subject methods are also described.

CHIP FIXING DEVICE AND PARTICLE INSPECTION DEVICE
20220373450 · 2022-11-24 ·

A chip fixing device includes a mounting portion on which a channel chip is mounted and a fixing unit for fixing the channel chip mounted on the mounting portion. The channel chip includes a channel through which a liquid containing a particle flows and a pressure changing unit for introducing the particle of interest from the channel. The mounting portion includes a substrate on which the channel chip is set. The fixing unit includes a fixing member for pressing the channel chip against the substrate, a piezoelectric element for actuating the pressure changing unit, and a holding member configured to hold the piezoelectric element and movable in a direction in which the holding member approaches and separates from the pressure changing unit. The fixing member includes an elastically deformable portion for fixing the holding member to the fixing member by deforming elastically when pressing the channel chip against the substrate.

Light detection systems having a secondary light scatter detector and methods for using same
11592386 · 2023-02-28 · ·

Systems having an unfiltered light scatter detector configured to detect scattered light from a sample in a flow stream are provided. Systems according to certain embodiments include a light source having two or more lasers, a light detection system having an unfiltered light scatter detector and a processor having memory operably coupled to the processor where the memory includes instructions which when executed by the processor, cause the processor to generate one or more data signals in response to scattered light from each of the two or more lasers detected by the unfiltered light scatter detector; and determine one or more parameters of data acquisition based on the generated data signals from the unfiltered light scatter detector. Methods for determining one or more parameters for data acquisition with the subject systems are also described.

Compensation editor

Disclosed herein include systems, devices, methods, and spillover editor for displaying and editing spillover values. A view of a spillover editor can comprise a triangular grid of rows and columns, representing flourophores, each comprising at least one display area and two spillover values. After receiving an adjusted spillover value, an adjusted view of the spillover editor can comprise adjusted plots determined using the adjusted spillover value.

Particle detection device
11585754 · 2023-02-21 · ·

A particle detection device includes a detection tube, a light emitter, a light receiver, and a processing unit. The detection tube is for a detection solution to pass through. The light emitter generates a detection light and emits the detection light to the detection solution. The light receiver receives the detection light scattered from the detection solution. The processing unit generates a received light intensity value according to the detection signal generated by the light receiver, and determines whether the received light intensity value is greater than a first threshold value: if greater, generating a detection result of particles; otherwise, generating a detection result of no particles. Then it provides a basis for semiconductor manufacturing companies to evaluate whether the detection solution can be used in a high-precision manufacturing processes, thereby optimizing the manufacturing process and improving the yield rate of the high-precision manufacturing process.