A single-wavelength light source is configured to generate an excitation light source. A sample holder that defines an inner cavity is capable of holding a sample and includes a surface transparent to the excitation light source. One or more mounts are attached to at least one of the light source or the sample holder. The mounts are configured to change an incident angle of the excitation light source on the surface. One or more optical components are positioned in a path of a fluorescence emission emitted from the surface and guide the fluorescence emission to a detector. A detector detects an intensity of the fluorescence emission.

A sample holder comprises one or more elongated sample tubes. The one or more elongated sample tubes are adapted for accommodating a plurality of samples to be imaged at an imaging position. The imaging position is defined by at least one illumination objective lens and at least one detection objective lens of a microscope. A microscope is disclosed, comprising at least one illumination objective lens and at least one detection objective lens, which define an imaging position. The microscope further comprises a sample holder for holding a plurality of samples. The sample holder is moveable with respect to the imaging position. A method for imaging a plurality of samples by means of the microscope is disclosed.

A single-wavelength light source is configured to generate an excitation light source. A sample holder that defines an inner cavity is capable of holding a sample and includes a surface transparent to the excitation light source. One or more mounts are attached to at least one of the light source or the sample holder. The mounts are configured to change an incident angle of the excitation light source on the surface. One or more optical components are positioned in a path of a fluorescence emission emitted from the surface and guide the fluorescence emission to a detector. A detector detects an intensity of the fluorescence emission.

A single-wavelength light source is configured to generate an excitation light source. A sample holder that defines an inner cavity is capable of holding a sample and includes a surface transparent to the excitation light source. One or more mounts are attached to at least one of the light source or the sample holder. The mounts are configured to change an incident angle of the excitation light source on the surface. One or more optical components are positioned in a path of a fluorescence emission emitted from the surface and guide the fluorescence emission to a detector. A detector detects an intensity of the fluorescence emission.

A light irradiation angle is set with respect to a first surface so as to detect only either first reflected light or second reflected light. Then, light is emitted from a light irradiation part at the set irradiation angle while a detection chip is kept in motion, either the first reflected light or the second reflected light is detected by a reflected light detection part, and positional information of the detection chip is acquired on the basis of the result of the detection of the first or second reflected light. The detection chip is moved, on the basis of the acquired positional information, to a detection position where detection of a substance to be detected is performed. While the detection chip is kept at the detection position, detection of the substance to be detected is performed through detection of sample light.

The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.

A luminometer (400) includes a light detector (630) configured to sense photons (135). The luminometer (400) includes an analog circuit (915a) configured to provide an analog signal (965) based on the photons (135) emitted from assay reactions over a time period and a counter circuit (915b) configured to provide a photon count (970) based on the photons (135) emitted from the assay reactions over the time period. The luminometer (400) includes a luminometer controller (905) configured to, in response to an analog signal value of the analog signal (965) being greater than a predetermined value, determine and report a measurement value of the photons (135) emitted from the assay reactions over the time period based on the analog signal value of the analog signal (965) and a linear function (1010). Optionally, the linear function (1010) is derived from a relationship between the analog signal (965) and the photon count (970).

According to one embodiment, an inspection apparatus includes a socket, a first arm, and a recognition device. The socket has at least one container holding part for holding a container containing an object. The first arm includes at least two links of which ends are connected. The first arm is able to install the container into the container holding part when the links are in a first posture and to reinstall the container into the container holding part when the links are in a second posture different from the first posture. The recognition device obtains at least recognition results indicating respective positions of the object when the container is installed into the container holding part in the first posture and the second posture.

Assays (100) may be performed with a luminometer (400) having a chassis (405) that may include a reaction vessel chamber (610). The luminometer (400) may also include a light passage (640) that intersects the reaction vessel chamber (610). The luminometer (400) may also include a cap (415) that, when in a closed configuration, prevents light emitted by external sources from entering the reaction vessel chamber (610) and from entering the light passage (640). The cap (415) may provide access to the reaction vessel chamber (610) when in an open configuration. The luminometer (400) may also include a calibration light source (460) optically coupled to one end of the light passage (640) and a light detector (630) optically coupled to another end of the light passage (640). The light detector (630) may include a sensing element for receiving light from the light passage (640).

Devices and methods are disclosed that allow for analysis with simplified sample preparation. Of particular relevance is the analysis of wire samples (e.g., weld wires) using laser induced breakdown spectroscopy (LIBS) or optical emission spectrometry (OES). Representative devices can isolate a sample, such as in a sealed, inert environment in an analytical instrument. These devices may include first and second sample end attachments connected to a body, which has a connecting portion that may be configured for alignment with the face of the instrument. The body may also include a rotatable cap, and the sample end attachments may be joined to this cap (e.g., at opposite ends thereof) to allow adjustment of the angular position of the sample, relative to the connecting portion, which in use may be affixed to the instrument.