Patent classifications
G01N2021/1785
Apparatus, Optical system, and Method for digital holographic and polarization microscopy
A microscope, a method, and a system are provided. A system includes a first optical system, a second optical system, and one or more processors. The first optical system is configured to generate an optical phase signal associated with a first image of a sample in a first field of view. The second optical system is configured to generate a polarized signal associated with a second image of the sample in a second field of view. The one or more processors is configured to generate a co-registered phase and polarization information map based on the optical phase signal and the polarized signal. The first field of view is the same as the second field of view. The first image and the second image are captured sequentially.
Information processing apparatus, information processing method, and storage medium
An information processing apparatus uses signals obtained by a plurality of reception units that receive an acoustic wave propagating from a point of interest to acquire object information at the point of interest. The apparatus includes a speed-of-sound acquisition unit that acquires information representing speed of sound on a propagation path of the acoustic wave, a correction unit that acquires a correction amount for the information representing speed of sound and corrects the information representing speed of sound using the correction amount, and an information acquisition unit that determines a propagation time of the acoustic wave by linearly approximating propagation paths from the point of interest to the reception units based on the corrected information and acquires the object information at the point of interest based on the signals and the propagation time.
Systems and methods for oblique laser scanning
A method for constructing a three-dimensional image of a sample includes producing electromagnetic radiation and directing the produced electromagnetic radiation such that it is incident on the sample at an oblique angle. The incident electromagnetic radiation is scanned in discrete increments to a plurality of discrete locations along a first direction, and at each discrete location, scanned along a second direction orthogonal to the first direction. The sample reflects a first portion of the incident electromagnetic radiation and absorbs a second portion of the incident electromagnetic radiation, and emits electromagnetic radiation responsive to the absorption. A plurality of cross-sectional images is produced from the reflected electromagnetic radiation and the emitted electromagnetic radiation, and each cross-sectional image is modified to compensate for the oblique angle. The modified cross-sectional images are then combined to create a three-dimensional image of the sample.
OPTIMAL PARAMETER SELECTION FOR STRUCTURED LIGHT METROLOGY
A method is disclosed for selecting an optimal value for an adjustable parameter of a structured light metrology (SLM) system, for scanning an object. The SLM system performs test scans of the object to acquire a plurality of sets of measurements of the object, wherein a different value is used for the parameter for each test scan. For each test scan, a value of a quality metric is calculated, based on the set of measurements of the object associated with the test scan and simulation data representing a simulated scan of the object by the SLM system. A test scan is then identified that has a quality metric value that satisfies a specified optimization criterion; and a value of the adjustable parameter that was used for the identified test scan is selected as the optimal value of the adjustable parameter, for scanning the object.
Three-Dimensional Object Scan Using Data from Infrared Sensor
Described herein is a system and method for scanning a three-dimensional object using data from an infrared sensor. The data can be used during preprocessing, reconstructing and/or post processing of generation of a three-dimensional model. Data from an infrared sensor and data from a sensor (e.g., RGB sensor, a depth sensor, a camera, a scanner, a digital camera, a digital video camera, a web camera, depth sensor, etc.) can be utilized to generate a three-dimensional model of the three-dimensional object. For example, the data from the infrared sensor can be utilized to identify an item and to exclude the identified item from the generated three-dimensional model.
SYSTEMS AND METHODS FOR OBLIQUE LASER SCANNING
A method for constructing a three-dimensional image of a sample includes producing electromagnetic radiation and directing the produced electromagnetic radiation such that it is incident on the sample at an oblique angle. The incident electromagnetic radiation is scanned in discrete increments to a plurality of discrete locations along a first direction, and at each discrete location, scanned along a second direction orthogonal to the first direction. The sample reflects a first portion of the incident electromagnetic radiation and absorbs a second portion of the incident electromagnetic radiation, and emits electromagnetic radiation responsive to the absorption. A plurality of cross-sectional images is produced from the reflected electromagnetic radiation and the emitted electromagnetic radiation, and each cross-sectional image is modified to compensate for the oblique angle. The modified cross-sectional images are then combined to create a three-dimensional image of the sample.
Method and device to achieve spatially confined photointeraction at the focal volume of a microscope
The invention relates to a method and a system to achieve spatially (e.g. three-dimensionally) confined photomodulation at the focal volume (50) in a ample (55) mounted in a microscope system, comprising two or more laser light sources (41, 42) emitting light (32, 34) of different wavelengths adapted to excite a material in an identical number of independent excitation steps to a higher vibrational state from which the material relaxes, either emitting a conversion light to be detected (photoexcitation) or modulating the spectral properties of the material (photomodulation).
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM
An information processing apparatus uses signals obtained by a plurality of reception units that receive an acoustic wave propagating from a point of interest to acquire object information at the point of interest. The apparatus includes a speed-of-sound acquisition unit that acquires information representing speed of sound on a propagation path of the acoustic wave, a correction unit that acquires a correction amount for the information representing speed of sound and corrects the information representing speed of sound using the correction amount, and an information acquisition unit that determines a propagation time of the acoustic wave by linearly approximating propagation paths from the point of interest to the reception units based on the corrected information and acquires the object information at the point of interest based on the signals and the propagation time.
METHOD FOR PHASE RETRIEVAL TO REDUCE A SAMPLING REQUIREMENT WHEN IMAGING A DYNAMIC PROCESS
A method for retrieving phase information in a coherent diffraction imaging process includes acquiring a plurality of 3D data sets, each 3D data set corresponding to one of a plurality of time states, and reconstructing a 3D image of the object at a given time state using the 3D data set from all of the time states. Each 3D data set is acquired by: illuminating an object positioned in a first position with a coherent beam; measuring a first 2D diffraction pattern using an area detector; rotating the object around a tilt axis thereof to a second position that is different from the first position; re-illuminating the object positioned in the second position with the coherent beam; re-measuring a second 2D diffraction pattern using the area detector; and repeating the rotating, re-illuminating and re-measuring steps such that each 3D data set includes a predetermined number of diffraction patterns.
Reflectivity map estimate from dot based structured light systems
Systems and methods are provided for determining a depth map and a reflectivity map from a structured light image. The depth map can be determined by capturing the structured light image and then using a triangulation method to determine a depth map based on the dots in the captured structured light image. The reflectivity map can be determined based on the depth map and based on performing additional analysis of the dots in the captured structured light image.