A sensor device and a method of analyzing a component in a fluid are described. The sensor device comprises a planar substrate defining a substrate plane, an electromagnetic waveguide forming a waveguide resonator and extending in a length direction in a waveguide resonator plane parallel to the substrate plane, wherein the electromagnetic waveguide is supported on the substrate by a support structure, wherein the electromagnetic waveguide has a width in the waveguide resonator plane in a direction perpendicular to the length direction, and a height out of the waveguide plane in a direction perpendicular to the length direction.

A method for determining an index-of-refraction profile of an optical object, which has a cylindrical surface and a cylinder longitudinal axis, said method comprising the following method steps: (a) scanning the cylindrical surface of the object at a plurality of scanning locations by means of optical beams; (b) capturing, by means of an optical detector, a location-dependent intensity distribution of the optical beams deflected in the optical object; (c) determining the angles of deflection of the zero-order beams for each scanning location from the captured intensity distribution, comprising eliminating beam intensities, and (d) calculating the index-of-refraction profile of the object on the basis of the angle-of-deflection distribution, wherein method steps (a) and (b) are carried out with light beams having at least two different wavelengths.

A method for optical inspection includes illuminating a patterned polymer layer on a semiconductor wafer with optical radiation over a range of infrared wavelengths, measuring spectral properties of the optical radiation reflected from multiple points on the patterned polymer layer over the range of infrared wavelengths, and based on the measured spectral properties, computing a complex refractive index of the patterned polymer layer.

A method of analyzing a material (12) comprising at least one analyte, said method comprising a material status analyzing procedure (76), in which a present status of the material is analyzed, wherein based on a result of said material status analyzing procedure (76), at least one of a selection of analyte-characteristic-wavelengths used during an analyte measurement procedure (78), an absolute time or a relative time proportion of use of analyte-characteristic-wavelengths during said analyte measurement procedure (78), an individual excitation radiation intensity, or a relative weight given to the wavelengths in the analysis, a selection of analyte-characteristic-wavelengths to be used simultaneously during said analyte measurement procedure (78), and a selection of one or more main frequencies of the modulation of said excitation radiation (18) intensity to be used during said analyte measurement procedure (78) is determined.

A new multiparameter device for measuring by optical means, the level of filling of tanks and reservoirs for liquids and liquefied products, index of refraction and image analysis, without moving parts, which is more specifically intended, but without restrictions of application, for the measuring the level of a liquid in a reservoir, besides being able to make possible the distinction and detection of the type of liquid included in this reservoir, by measuring the index of refraction and image analysis of these liquids, performing this task in a simple, practical and efficient manner through a specific configuration utilizing optical and electronic means, without use of moving parts, what allows that the same may be used for numerous applications between them, for the fuel quality control, the fuel identification, the measuring of the index of refraction, flow measurement, color measurement, temperature measurement and pressure measurement, inter alia, and more specifically for application in the automotive and associated industries.

With a sensor device for recording moisture on a window pane with a transmitter and a receiver and an optical unit arranged between the transmitter and the receiver, wherein the optical unit includes an optical input unit facing the transmitter, an optical output unit facing the receiver and a coupling-in and coupling-out region on the side of the window pane, the coupling-in and coupling-out region is optically separated from the optical input unit and the optical output unit such that the electromagnetic waves emitted by the transmitter are refracted. A particularly compact constructional design is achieved thereby.

An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.

A sealing arrangement and method of a measuring device are disclosed, the measuring device having one or more measuring elements that have a surface in contact with a fluid being measured, a fluid chamber for the fluid being measured, and a seal to seal the joint between the fluid chamber and the measuring element. Flow channels have been formed in the measuring device to lead the rinsing fluid in contact with the seal.

The present disclosure describes a differential refractometer for gradient chromatography. In an exemplary embodiment, the differential refractometer includes a solvent delay volume, an eluent flow meter coupled to an eluent inlet of a sample cell, a solvent flow regulator coupled to an outlet of the solvent delay volume and coupled to a solvent inlet of a reference cell, an instrument controller configured to receive the eluent flow rate from the eluent flow meter, configured to receive the solvent flow rate from the solvent flow regulator, configured to receive a flow rate ratio from a flow rate ratio data source, wherein the flow rate ratio indicates a ratio of the eluent flow rate to the solvent flow rate, and an optical bench configured to measure a difference between a refractive index of the eluent present in the sample cell and a refractive index of the solvent present in the reference cell.

A method of analyzing a material (12) comprising at least one analyte, wherein analyte-wavelength-specific measurements are interspersed with reference measurements (80), and wherein response signals obtained for the reference measurements (80) are used for one or more of calibrating an excitation radiation source (26) for generating said excitation radiation, calibrating said detection device, recognizing a variation in the measurement conditions by comparing results of individual reference measurements (80), adapting the analyte measurement procedure (78) with respect to one or more of the entire duration thereof, the absolute or relative duration of analyte-wavelength-specific measurements for a given analyte-characteristic-wavelength, or terminating and/or restarting the analyte measurement procedure, and adapting the analysis carried out in the analyzing step.