Patent classifications
G01N21/4788
Plasma dispersion effect based super-resolved imaging
Disclosed herein is a super resolution imaging method and system for obtaining an image in a crystal material and/or device.
Laser speckle imaging for live cell quantification
A method and system for studying cell viability and protein aggregation. In one aspect, the method relies on speckle information to analyze cells or other structures present in a fluid. A probe for measuring in situ structures includes a tip section having a sample detection region and a camera provided with image sensors.
Speckle detection systems, image capturing devices and methods
The present disclosure relates to a speckles detection system for detecting one or more speckles on a surface of an optical element of an image capturing device. The system comprises: one or more light sources configured to emit a light beam towards the optical element, the optical element being configured to reflect light from the light sources when speckles are located on the surface of the optical element. The system further comprises one or more light receivers configured to receive the light beam reflected by the optical elements such that speckles on the surface of the optical elements are detected. Methods for detecting one or more speckles on a surface of an optical element of an image capturing device are also provided.
Infrared-optical hybrid imaging technology for all-digital histopathology
Methods and apparatus are provided for imaging a response of a sample to radiative heating. A method in accordance with one embodiment has steps of: illuminating a first area of the sample with a radiative heating beam; illuminating a portion of the first area with a probe beam; collecting light exiting the sample due to interaction of the probe beam with the sample; superimposing the light exiting the sample with a reference beam derived from the probe beam, wherein the reference is characterized by an optical phase relative to the probe beam; detecting a spatial portion of the light exiting the sample and the reference beam with at least one detector to generate an interference signal; and processing the interference signal to obtain an image of the sample associated with absorption of the radiative heating beam.
SPECKLE DETECTION SYSTEMS, IMAGE CAPTURING DEVICES AND METHODS
The present disclosure relates to a speckles detection system for detecting one or more speckles on a surface of an optical element of an image capturing device. The system comprises: one or more light sources configured to emit a light beam towards the optical element, the optical element being configured to reflect light from the light sources when speckles are located on the surface of the optical element. The system further comprises one or more light receivers configured to receive the light beam reflected by the optical elements such that speckles on the surface of the optical elements are detected. Methods for detecting one or more speckles on a surface of an optical element of an image capturing device are also provided.
DIFFRACTIVE DEVICE FOR CHEMICAL AND BIOLOGICAL ANALYSIS
The invention relates to a diffractive device (18) for chemical and biological analysis based on structured receptors on waveguides, which comprises: a waveguide (1) and a recognition element (3) consisting of a grating with receptors (11) arranged on the waveguide (1) and are intended to interact with target compounds (12) present in a sample; and a radiation source (4) that emits an incident beam (5) propagated through the waveguide (1), interacting with the recognition element (3) and being diffracted according to Bragg's law, thereby generating a reflected beam (6) and a transmitted beam (7), which are collected by optical analysers (8, 17) that record parameters of the reflected beam (6) and of the transmitted beam (7), enabling multiple analyses to be conducted in a simple, fast, sensitive and quantitative manner, label-free and in real time.
PORTABLE SPECKLE IMAGING SYSTEM AND METHOD FOR AUTOMATED SPECKLE ACTIVITY MAP BASED DYNAMIC SPECKLE ANALYSIS
This disclosure relates to portable speckle imaging system and method for automated speckle activity map based dynamic speckle analysis. The embodiments of present disclosure herein address unresolved problem of capturing variations in speckle patterns where noise is completely removed and dependency on intensity of variations in speckle patterns is eliminated. The method of the present disclosure provides a correlation methodology for analyzing laser speckle images for applications such as seed viability, fungus detection, surface roughness analysis, and/or the like by capturing temporal variation from frame to frame and ignoring the intensity of speckle data after denoising, thereby providing an effective mechanism to study speckle time series data. The system and method of the present disclosure performs well in terms of time efficiency and visual cues and requires minimal human intervention.
Optical detection method
A process for detecting the sensitivity of one or more polymers and/or of one or more mixtures of polymers to a compound, including the steps of exposing a plurality of individualized micro-deposits including the polymer(s) and/or the mixture(s) of polymers to the compound, and detecting, by interferometry, a variation in appearance of an assembly of micro-deposits exposed to the compound and/or a variation in the dimensions and/or refractive index of at least one of the micro-deposits exposed to the compound, linked to an interaction between the polymer(s) and/or the mixture(s) of polymers and the compound.
PLASMA DISPERSION EFFECT BASED SUPER-RESOLVED IMAGING
Disclosed herein is a super resolution imaging method and system for obtaining an image in a crystal material and/or device.
Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate
Described is a metrology system for determining a characteristic of interest relating to at least one structure on a substrate, and associated method. The metrology system comprises a processor being configured to computationally determine phase and amplitude information from a detected characteristic of scattered radiation having been reflected or scattered by the at least one structure as a result of illumination of said at least one structure with illumination radiation in a measurement acquisition, and use the determined phase and amplitude to determine the characteristic of interest.