Interferometric speckle visibility spectroscopy methods, systems, and non-transitory computer readable media for recovering sample speckle field data or a speckle field pattern from an off-axis interferogram recorded by one or more sensors over an exposure time and determining sample dynamics of a sample being analyzed from speckle statistics of the speckle field data or the speckle field pattern.

A method and system are presented for use in measuring on patterned samples, aimed at determining asymmetry in the pattern. A set of at least first and second measurements on a patterned region of a sample is performed, where each of the measurements comprises: directing illuminating light onto the patterned region along an illumination channel and collecting light reflected from the illuminated region propagating along a collection channel to be detected, such that detected light from the same patterned region has different polarization states which are different from polarization of the illuminating light, and generating a measured data piece indicative of the light detected in the measurement. Thus, at least first and second measured data pieces are generated for the at least first and second measurements on the same patterned region. The at least first and second measured data pieces are analyzed and output data is generated being indicative of a condition of asymmetry in the patterned region.

On-line detection of mesophase particles employs a laser diode light source to illuminate a target area with a pulsed laser linearly or circularly polarized probe beam. Analysis of images determines extent of presence the birefringent mesophase particles, which are precursors to coking in catalytic hydrocracking processes. The inherently polarized low-coherence, unfocused but sufficiently collimated, pulsed laser beam yield sharp imaging with high depth of field of very small mesophase particles that are present in a moving, dark reactor liquid environment.

An apparatus for spectroscopic tissue analysis is disclosed. The apparatus comprises: a light delivery system configured to direct an excitation signal on to a tissue sample; a light collection system configured to collect a backscattered signal comprising diffuse reflectance photons backscattered by the tissue sample; an imaging device; a spectrometer; an optical adaptor configured to direct a first portion of the backscattered signal to the imaging device and a second portion of the backscattered signal to the spectrometer; and an analysis system configured to apply polar decomposition to spectral image data of the tissue captured by the imaging device and the spectrometer and thereby derive polarization metrics for the tissue sample.

A system for detection and monitoring includes one or more light sources configured to emit light into a monitored space. At least one of the light sources is configured to emit a respective emission cone having a respective emission cone axis. One or more light sensing devices are configured to receive scattered light. At least one of the one or more light sensing devices defines a respective acceptance cone having a respective acceptance cone axis. The emission cone axis of the emission cone, and/or the acceptance cone axis of the light sensing device is angled toward the other. A processor is operatively connected to the at least one light sensing devices to evaluate the scattered light for the presence of particulates in the monitored space.

A cuvette carrier comprising: a plurality of walls defining a holding volume for a cuvette; a first and second transmissive region included in the plurality of walls; and a first optical polariser arranged to polarise light passing through the first transmissive region.

A system for particulate detection and monitoring includes one or more light sources configured to emit light into a monitored space. The system includes at least two light sensing devices configured to receive scattered light. Respective sensing portions of the three two sensing devices share a common centerline axis. A processor is operatively connected to the two light sensing devices and is configured to evaluate the scattered light for presence of particulates in the monitored space.

In an aspect, a plurality of parameters characteristic of the patterned wafer are determined based on measurements of the intensity of electromagnetic radiation after the diffraction thereof at the patterned wafer. The intensity measurements are carried out for at least one used structure and at least one auxiliary structure. The parameters are determined based on intensity values measured during the intensity measurements for respectively different combinations of wavelength, polarization and/or order of diffraction, and also on the basis of correspondingly calculated intensity values, with a mathematical optimization method being applied.

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.