On-line detection of mesophase particles employs a laser diode light source to illuminate a target area with a pulsed laser linearly or circularly polarized probe beam. Analysis of images determines extent of presence the birefringent mesophase particles, which are precursors to coking in catalytic hydrocracking processes. The inherently polarized low-coherence, unfocused but sufficiently collimated, pulsed laser beam yield sharp imaging with high depth of field of very small mesophase particles that are present in a moving, dark reactor liquid environment.

The invention relates to a method and a device for optical in vitro detection of a movement in a biological sample with a spatial extent in the form of a three-dimensional cell and/or tissue culture or a cell cluster or a sample made of freely swimming microorganisms. The method comprises the following steps: (a) providing a receptacle for the sample (1), a light beam source (6), an optical unit (7, 8) and a detector (2), (a1) wherein the optical unit (7, 8) is embodied to illuminate the whole sample (1) in the receptacle with radiation emanating from the light beam source and to guide at least some of the radiation (11) of the light beam source (6), which is changed at any point within the sample (1) by an interaction with the sample (1) in terms of the beam direction thereof, the polarization state thereof and/or the diffraction pattern thereof, to a detection surface (2a) of the detector (2), and (a2) wherein the detector (2) is embodied to generate a measurement signal (9) in a manner dependent on the detected radiation, the time profile of which measurement signal specifies a time profile of an intensity of the detected radiation (11) and/or from which the time profile of the intensity of the detected radiation (11) is derivable; (b) illuminating the sample (1) with radiation from the light beam source; and (c) detecting a movement in the biological sample (1) in a manner dependent on a temporal change in the measurement signal (9).

On-line detection of mesophase particles employs a laser diode light source to illuminate a target area with a pulsed laser linearly or circularly polarized probe beam. Analysis of images determines extent of presence the birefringent mesophase particles, which are precursors to coking in catalytic hydrocracking processes. The inherently polarized low-coherence, unfocused but sufficiently collimated, pulsed laser beam yield sharp imaging with high depth of field of very small mesophase particles that are present in a moving, dark reactor liquid environment.

Metrology scatterometry targets, optical systems and corresponding metrology tools and measurement methods are provided. Targets and/or optical systems are designed to enhance first order diffraction signals with respect to a zeroth order diffraction signal from the scatterometry target by creating a phase shift of 180 between zeroth order diffraction signals upon illumination of the scatterometry targets. For example, the targets may be designed to respond to polarized illumination by producing a first phase shift between zeroth order diffraction signals upon illumination thereof and optical systems may be designed to illuminate the target by polarized illumination and to analyze a resulting diffraction signal to yield a second phase shift between zeroth order diffraction signals upon illumination thereof. The phase shifts add up to 180 to cancel out the zeroth order diffraction signals, with either phase shift being between 0 and 180.

Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam.

A particle analyzer is intended to accurately obtain an aspect ratio and a major axis length or a minor axis length of particles being dispersed in a dispersion medium. The particle analyzer includes a polarization relationship value calculation section to calculate a polarization relationship value whose parameter is light intensity of two kinds of polarization components, an aspect ratio calculation section to calculate an aspect ratio from a polarization relationship value already obtained by the polarization relationship value calculation section by using a relationship between the polarization relationship value and the aspect ratio, a diffusion coefficient acquisition section to acquire a diffusion coefficient indicating the behavior of the particles in a sample, and an axis length calculation section to calculate a major axis length from the aspect ratio already calculated by the aspect ratio calculation section and the diffusion coefficient already acquired by the diffusion coefficient acquisition section, by using a relationship between the diffusion coefficient, the major axis length, and the aspect ratio.

An inspection apparatus includes an optical system, which has a radiation beam delivery system for delivering radiation to a target, and a radiation beam collection system for collecting radiation after scattering from the target. Both the delivery system and the collection system comprise optical components that control the characteristics of the radiation and the collected radiation. By controlling the characteristics of one or both of the radiation and collected radiation, the depth of focus of the optical system may be increased.

A polarization inspector for inspecting an inspection target, the polarization inspector having a polarization divider for spatially dividing at least a reflected beam of light from the inspection target by irradiating an illumination beam into divided beams of lights mutually different in polarization direction; one or more optical receivers for receiving the divided beams of lights and generating an image signal based on the divided beams of lights; and a processor for calculating at least one of an elliptical azimuth angle, a polarization degree and a polarization component intensity from the image signal.

In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.

An apparatus for carrying out polarization resolved Raman spectroscopy on a sample (11), in particular a crystalline or polycrystalline sample, the apparatus comprises: at least one light source (13, 87, 93, 95, 97), in particular at least one laser, for providing excitation radiation to a surface of the sample (11), an optical system which is configured to simultaneously collect at least one on-axis Raman beam (21, 109) and at least one off-axis Raman beam (23, 111) from Raman light scattered by the sample (11) in response to exposing the surface to the excitation radiation, the at least one on-axis Raman beam (21, 109) being scattered from the sample (11) in a direction that is aligned with an optical axis of an objective (41) of the optical system for collecting the at least one on-axis Raman beam (21, 109), the at least one off-axis Raman beam being scattered from the sample in a direction that is inclined with regard to an optical axis of an objective (41) of the optical system for collecting the at least one off-axis Raman beam (23, 111), the optical system comprises at least one polarizer device (25, 113) for generating at least one polarized on-axis Raman beam (31, 33) from the at least one on-axis Raman beam (21, 109) and at least one polarized off-axis Raman beam (35) from the at least one off-axis Raman beam (23, 111), and the optical system comprises at least one spectrometer (37, 47 81, 83, 85) for generating, in particular simultaneously, an optical spectrum from each of the at least one polarized on-axis Raman beam (31, 33) and the at least one polarized off-axis Raman beam (35).