Disclosed is an interferometric scattering microscope. The interferometric scattering microscope includes a remote refocusing system adapted to reproduce light collected by a high numerical aperture objective lens using another objective lens and thus can acquire an image of an object in a sample without vertical movement of the objective lens or the sample.

Various embodiments include a scattered light smoke detector comprising: a two-color LED for emitting light of a first wavelength and a second wavelength; a photosensor spectrally matched with said two-color LED; and a control unit connected to the two-color LED and to the photosensor. The control unit is configured to control the two-color LED to emit light of the first wavelength or the second wavelength and to detect a photosensor signal of the photosensor. The control unit is further configured to analyze the photosensor signal for a first scattered radiation intensity and a second scattered radiation intensity allocated respectively to the first wavelength and the second wavelength. There is a polarizer optically connected upstream of the photosensor or downstream of the two-color LED. The polarizer polarizes light passing through at different intensities in dependence upon the respective wavelength of said light.

The invention relates to a system and method that enables the capture of high contrast images of sea lice contaminated fish. The system comprises a light emitting device, a 2D array detector, and a first polarisation filter, and utilizes polarised narrow bands of light in order to obtain a strong contrast between sea lice and the skin of the fish. A number of narrow bands of light are irradiated onto a fish, and the resulting reflection(s) is/are polarisation filtered before being detected. The detected light is subsequently used in order to generate a high contrast image of the fish.

Interferometric speckle visibility spectroscopy methods, systems, and non-transitory computer readable media for recovering sample speckle field data or a speckle field pattern from an off-axis interferogram recorded by one or more sensors over an exposure time and determining sample dynamics of a sample being analyzed from speckle statistics of the speckle field data or the speckle field pattern.

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

A life safety detector comprising a housing defining a dark photo detection chamber for receiving ambient material, at least one light source configured to emit light into the detection chamber, at least one light sensing device operable to receive light reflected from the ambient materials in the detection chamber; and a processing device coupled to the at least one light sensing device. In a first mode of operation, the light received by the at least one light sensing device within the dark photo detection chamber is indicative of smoke, and in a second mode of operation, the light received by the at least one light sensing device within the dark photo detection chamber is indicative of an indoor air quality.

A single-shot Mueller matrix polarimeter (1700), MMP, comprising: a polarization state generator (1706), PSG, arranged to receive a source optical field (1704) and provide a probe field (1708) having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (1718), PSA, arranged to receive a modified probe field (1716) resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector (1720) arranged to detect an output (1722) of the PSA.

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

Disclosed is an ellipsometer or scatterometer including a light source, a polarizer, an optical illumination system suitable for directing an incident polarized light beam towards a sample, a wavefront-division optical beam splitter arranged to receive a secondary light beam produced by reflection, transmission or diffraction, the wavefront-division optical beam splitter being oriented to form three collimated split beams, an optical polarization modification device and an optical polarization splitting device to form six angularly split beams, a detection system suitable for detecting the six split beams, and a processing system suitable for deducing therefrom an ellipsometric or scatterometric measurement.

A surface defect measuring apparatus and method by microscopic scattering polarization imaging is provided. The apparatus mainly comprises a laser, a first converging lens, a rotary diffuser, a second converging lens, a diaphragm, a third converging lens, a pinhole, a fourth converging lens, a polarizer, a half-wave plate, a polarizing beam splitter, an X-Y translation stage, a sample, a microscope lens, a quarter-wave plate, a micro-polarizer array, a camera and a computer. The micro-polarizer array is adopted to realize real-time microscopic scattering polarization imaging of the surface defects; a polarization-degree image is calculated to improve the sensitivity for detecting the surface defects of the ultra-smooth element, and the effective detection of the surface defects of a high-reflective coating element is also realized, and the requirement for rapid detection of the surface defects of a meter-scale large-aperture ultra-smooth element can be met.