The present disclosure relates to a field programmable gate array (FPGA)-based multi-channel dynamic light scattering (DLS) autocorrelation system and method. The system includes a DLS generation apparatus, a photon correlator, and a host computer, where the photon correlator includes an FPGA and a universal serial bus (USB) communication module; the DLS generation apparatus is connected to the FPGA; the FPGA is configured to count and perform correlation calculation on photon pulses generated by the DLS generation apparatus; the USB communication module is connected to the host computer; the FPGA includes a dual counter module and a correlation calculation module; the dual counter module is connected to the DLS generation apparatus and the correlation calculation module; the correlation calculation module is connected to the USB communication module; the dual counter module includes a plurality of dual counters; and the correlation calculation module includes a plurality of correlators.

The present disclosure relates to a field programmable gate array (FPGA)-based multi-channel dynamic light scattering (DLS) autocorrelation system and method. The system includes a DLS generation apparatus, a photon correlator, and a host computer, where the photon correlator includes an FPGA and a universal serial bus (USB) communication module; the DLS generation apparatus is connected to the FPGA; the FPGA is configured to count and perform correlation calculation on photon pulses generated by the DLS generation apparatus; the USB communication module is connected to the host computer; the FPGA includes a dual counter module and a correlation calculation module; the dual counter module is connected to the DLS generation apparatus and the correlation calculation module; the correlation calculation module is connected to the USB communication module; the dual counter module includes a plurality of dual counters; and the correlation calculation module includes a plurality of correlators.

As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.

As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.

Provided is a measuring apparatus, comprising a measuring unit that irradiates a film with light and measures the light transmitted through the film or the light reflected by the film, a moving mechanism that allows the measuring unit to move in a first direction intersecting the direction in which the film is conveyed, the measuring unit includes a light projecting unit that irradiates the film with light, an integrating sphere that collects light from the film, and a light receiving portion that receives the light collected by the integrating sphere.

Provided is a measuring apparatus, comprising a measuring unit that irradiates a film with light and measures the light transmitted through the film or the light reflected by the film, a moving mechanism that allows the measuring unit to move in a first direction intersecting the direction in which the film is conveyed, the measuring unit includes a light projecting unit that irradiates the film with light, an integrating sphere that collects light from the film, and a light receiving portion that receives the light collected by the integrating sphere.

An information processing system includes an irradiation unit configured to irradiate a deposited material with electromagnetic waves, a detection unit configured to detect scattered waves or transmitted waves of the electromagnetic waves with which the deposited material has been irradiated by the irradiation unit, and a determination unit configured to determine a state of the deposited material from an image based on the scattered waves or the transmitted waves detected by the detection unit.

Deterioration of optical characteristics is suppressed. An optical measurement device according to an embodiment includes: an excitation light source (101 to 103) that emits excitation light having a wavelength of at least 450 nanometers or less; a lens structure (116) that condenses the excitation light at a predetermined position; a fluorescence detection system (140) that detects fluorescence emitted from a particle by excitation of the particle present at the predetermined position by the excitation light; and a scattered light detection system (130) that detects scattered light generated by the excitation light being scattered by the particle present at the predetermined position, and the lens structure includes a plurality of lenses (21, 22, 23, 25, 26, 28) arranged along an optical axis of the excitation light and a lens frame (10) that holds the plurality of lenses, and a position of at least one of the plurality of lenses in the lens frame is determined by abutting on a lens adjacent to the lens.

A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.

A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.