Apparatus for measuring spectral reflectance of a surface, the apparatus comprising: a chamber comprising a wall formed having an aperture defined by an aperture boundary; a light source mounted to the chamber and having a field of illumination (FOI) configured to intersect the aperture at an illumination intersection; and an optical fiber mounted to the chamber and having a field of view (FOV) configured to intersect the aperture at an imaging intersection; wherein the chamber is configured so that when the aperture is positioned on a surface the chamber substantially prevents light from entering a volume of the chamber.

Embodiments of the invention generally relate to color and appearance metric measurements and, in particular, developing instrumentation to enable self-consistent image appearance measurements within instruments of unitary construction.

An optical device includes an emitting apparatus and an optical guide. The emitting apparatus includes a first aperture for emitting an excitation radiation therethrough, the excitation radiation includes at least one light radiation having a wavelength included in a predefined spectral range. The optical guide extends longitudinally between first and second ends thereof and is internally provided with a core which is suitable for propagating radiation with a wavelength included in the predefined spectral range and defining an inlet aperture at the first end and an outlet aperture at the second end, the inlet aperture facing the first aperture so as to be passed through by at least a portion of the excitation radiation when it is emitted by the emitting apparatus and the outlet aperture is directed towards an unknown sample when the optical device is in a first operating condition.

Apparatus for measuring light scattering of a sample comprising a light beam source, means for collimating the beam and making it impinge on the sample in a perpendicular direction, at least one light sensor, and at least one spatial filter between the sample and the optical sensor, provided with two apertures, means for measuring the total power reaching the sensor and means for measuring the power of beams with a low k vector after the beam traverses the filter. The invention provides thus a simplified, portable and compact device for measuring different parameters like haze, turbidity, etc. can be built, for any sample and without the need of changing detectors.

To provide a technique of obtaining the reflection characteristics of an object, which can reproduce the appearance of the object more correctly, an information processing apparatus obtains a plurality of measurement values by receiving, from each of a plurality of directions, reflected light from an object illuminated by light from a given direction, and derives, based on the plurality of measurement values, a characteristic of specular reflection light as a reflected light component in a specular reflection direction corresponding to the given direction with respect to a surface of the object, a characteristic of internal diffuse reflection light as a reflected light component after scattering and absorption in the object, and a characteristic of surface diffuse reflection light as a reflected light component which has been diffused on the surface of the object.

A cleaning robot has an optical measuring device for determining the type of surface to be cleaned. The optical measuring device has a light source and at least two light sensors. Light emitted by the light source hits a reflection point of the surface at an angle of incidence (), and is reflected to the first light sensor at a corresponding angle of reflection (). The light source, reflection point and first light sensor span a plane of incidence. A secondary plane that intersects the reflection point and has a second light sensor spans perpendicular to the surface, and exhibits an angle () of between 80 and 100 relative to the plane of incidence. A straight line running through the reflection point and second light sensor has an angle () relative to the surface that is essentially as large as the angle of incidence () or angle of reflection ().

A defect inspection device includes a stage on which a substrate is provided, an objective lens disposed above the stage to project light onto the substrate, a light source configured to emit light onto a main surface of the substrate via the objective lens, a light quantity measurement sensor disposed above the stage and configured to measure an amount of the light that is reflected from a first region of the main surface of the substrate, a light quantity regulator located between the light source and the objective lens and configured to regulate an amount of the light that is emitted from the light source onto the main surface of the substrate.

According to an embodiment, an optical inspection method includes: causing a wavelength selection portion to selectively pass light components including at least two different wavelength spectra from an object point and causing an imaging portion including at least two color channels configured to receive the light components of the wavelength spectra to capture the object point; defining the light components of the at least two different wavelength spectra as signal vectors having different directions based on light reception data in the at least two color channels for the object point; and estimating spread of a direction distribution of light at the object point based on the directions of the signal vectors.

A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.

Embodiments of the invention generally relate to color and appearance metric measurements and, in particular, developing instrumentation to enable self-consistent image appearance measurements within instruments of unitary construction.