Patent classifications
G01N2021/558
Method and apparatus for determining a reflectivity value indicating a reflectivity of an object
A method for determining a reflectivity value indicating a reflectivity of an object is provided. The method includes performing a Time-of-Flight (ToF) measurement using a ToF sensor. A correlation function of the ToF measurement increases over distance within a measurement range of the ToF sensor such that an output value of the ToF sensor for the ToF measurement is independent of the distance between the ToF sensor and the object. The method further includes determining the reflectivity value based on the output value of the ToF sensor for the ToF measurement.
OPTICAL SENSOR
An optical sensor for measuring fluid properties is provided. The optical sensor includes a channel configured to have a fluid flow therethrough; a light source provided on a first side of the channel; a first light detector provided on the first side of the channel; and a second light detector provided on a second side of the channel.
Measurement light source and measuring arrangement for detecting a reflection spectrum
The present invention relates to a measurement light source for generating measurement light with a uniform spatial illumination intensity distribution. The measurement light source comprises a solid block, in which an illumination space, a light-forming space and a light exit space are each formed as a hollow space in the block and have a diffusely reflecting inner surface. The illumination space opens into the light-forming space. The light-forming space opens into the light exit space. At least one light source is at least partially arranged in the illumination space in order to generate light. The light exit space has a light exit. According to the invention, an axis of the illumination space and an axis of the light exit space are arranged at a distance from one another. The light-forming space is designed for a reversal of a light propagation direction. The invention also relates to a measuring arrangement for detecting at least an absolute reflection spectrum of a sample. The measuring arrangement is used in particular for the spectroscopic examination of surfaces in production processes in order to determine the color or gloss of surfaces, for example.
SPECULAR VARIABLE ANGLE ABSOLUTE REFLECTANCE METHOD AND REFLECTOMETER
A specular variable angle absolute reflectometer. The device includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes a roof mirror disposed in the light path after the sample. The roof mirror is configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the roof mirror. The mechanism is configured to rotate the roof mirror about an axis of the sample. The device also includes a detector in the light path after the roof mirror such that the detector receives light that has been reflected from the roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.
Measuring a size distribution of nucleic acid molecules in a sample
A process for measuring a size distribution of a plurality of nucleic acid molecules, the process comprising: labeling the nucleic acid molecules with a fluorescent dye comprising a plurality of fluorescent dye molecules to form labeled nucleic acid molecules, such that a number of fluorescent dyes molecules attached to each nucleic acid molecule is reliably proportional to the number of base pairs in the nucleic acid molecule, the fluorescent dye molecules having a first florescence spectrum; producing, by the labeled nucleic acid molecules, the first florescence spectrum in response to irradiating the labeled nucleic acid molecules at the first wavelength; and detecting the first florescence spectrum to measure the size distribution of the plurality of nucleic acid molecules.
Surface condition monitoring apparatus
Provided is a surface condition monitoring apparatus including: a transparent member; a transmission unit including a transmitter that transmits electromagnetic waves from one side of the transparent member toward the other side; and a reception unit including a receiver that detects the electromagnetic waves that enter the one side of the transparent member from the other side, the transmission unit and the reception unit being arranged such that the receiver detects scattered waves of the electromagnetic waves transmitted from the transmitter, that enter the one side from the other side, the transmission unit being configured to be capable of transmitting a plurality of electromagnetic waves having different wavelengths, and the reception unit being configured to detect intensities of the scattered waves of the electromagnetic waves at different positions.
SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD
This spectrum analysis system has a measurer, a display, and a controller that displays plurality of first anomaly items that indicate the type of anomaly in appearance of the measurement spectrum waveform. The controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each of the plurality of first anomaly items in the display.
OPTICAL MONITORING OF TARGET CHARACTERISTICS
Techniques for optical monitoring of corrosion are described herein. In an example embodiment, an optical monitor includes a target disposed within the optical monitor and exposed to ambient air, where exposure to the ambient air produces a change in an optical property of the target. The optical monitor also includes a light emitter to illuminate the target and an optical detector to generate a signal based on light reflected from the target. A processing device disposed within the optical monitor is configured to activate the light emitter and to receive and process the signal from the optical detector.
SURFACE CONDITION MONITORING APPARATUS
Provided is a surface condition monitoring apparatus including: a transparent member; a transmission unit including a transmitter that transmits electromagnetic waves from one side of the transparent member toward the other side; and a reception unit including a receiver that detects the electromagnetic waves that enter the one side of the transparent member from the other side, the transmission unit and the reception unit being arranged such that the receiver detects scattered waves of the electromagnetic waves transmitted from the transmitter, that enter the one side from the other side, the transmission unit being configured to be capable of transmitting a plurality of electromagnetic waves having different wavelengths, and the reception unit being configured to detect intensities of the scattered waves of the electromagnetic waves at different positions.
Transmission corrected plasma emission using in-situ optical reflectometry
Implementations disclosed describe a system including a light source, an optical sensor, and a processing device. The light source directs, during a first time, a probe light into a processing chamber through a window. The light source ceases, during a second time, directing the probe light into the processing chamber through the window. The optical sensor detects, during the first time, a first intensity of a first light. The first light includes a portion of the probe light reflected from the window and a light transmitted from an environment of the processing chamber through the window. The optical sensor detects, during the second time, a second intensity of a second light. The second light includes the light transmitted from the environment of the processing chamber through the window. The processing device determines, using the first intensity and the second intensity, a transmission coefficient of the window.